Power-constrained testing of VLSI circuits
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| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Kluwer Academic Publishers
c2003
|
| Schriftenreihe: | Frontiers in electronic testing
22 |
| Schlagworte: | |
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MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044832352 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2003 xx o|||| 00||| eng d | ||
| 020 | |a 140207235X |c alk. paper |9 1-4020-7235-X | ||
| 035 | |a (ZDB-38-ESG)ebr10066763 | ||
| 035 | |a (OCoLC)70734587 | ||
| 035 | |a (DE-599)BVBBV044832352 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.39/5/0287 |2 21 | |
| 100 | 1 | |a Nicolici, Nicola |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Power-constrained testing of VLSI circuits |c by Nicola Nicolici and Bashir M. Al-Hashimi |
| 264 | 1 | |a Boston |b Kluwer Academic Publishers |c c2003 | |
| 300 | |a xi, 178 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing |v 22 | |
| 505 | 8 | |a Includes bibliographical references (p. 163-173) and index | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Protection | |
| 650 | 4 | |a Semiconductors |x Thermal properties | |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Al-Hashimi, Bashir |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-030227215 | |
Datensatz im Suchindex
| _version_ | 1819301695412240384 |
|---|---|
| any_adam_object | |
| author | Nicolici, Nicola |
| author_facet | Nicolici, Nicola |
| author_role | aut |
| author_sort | Nicolici, Nicola |
| author_variant | n n nn |
| building | Verbundindex |
| bvnumber | BV044832352 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references (p. 163-173) and index |
| ctrlnum | (ZDB-38-ESG)ebr10066763 (OCoLC)70734587 (DE-599)BVBBV044832352 |
| dewey-full | 621.39/5/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5/0287 |
| dewey-search | 621.39/5/0287 |
| dewey-sort | 3621.39 15 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01547nam a2200421zcb4500</leader><controlfield tag="001">BV044832352</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s2003 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">140207235X</subfield><subfield code="c">alk. paper</subfield><subfield code="9">1-4020-7235-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10066763</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)70734587</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044832352</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/5/0287</subfield><subfield code="2">21</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Nicolici, Nicola</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Power-constrained testing of VLSI circuits</subfield><subfield code="c">by Nicola Nicolici and Bashir M. Al-Hashimi</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston</subfield><subfield code="b">Kluwer Academic Publishers</subfield><subfield code="c">c2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xi, 178 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">22</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references (p. 163-173) and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Protection</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Thermal properties</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Al-Hashimi, Bashir</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030227215</subfield></datafield></record></collection> |
| id | DE-604.BV044832352 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-24T06:21:39Z |
| institution | BVB |
| isbn | 140207235X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030227215 |
| oclc_num | 70734587 |
| open_access_boolean | |
| physical | xi, 178 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Kluwer Academic Publishers |
| record_format | marc |
| series2 | Frontiers in electronic testing |
| spelling | Nicolici, Nicola Verfasser aut Power-constrained testing of VLSI circuits by Nicola Nicolici and Bashir M. Al-Hashimi Boston Kluwer Academic Publishers c2003 xi, 178 p. txt rdacontent c rdamedia cr rdacarrier Frontiers in electronic testing 22 Includes bibliographical references (p. 163-173) and index Integrated circuits Very large scale integration Testing Integrated circuits Very large scale integration Protection Semiconductors Thermal properties VLSI (DE-588)4117388-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Al-Hashimi, Bashir Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Nicolici, Nicola Power-constrained testing of VLSI circuits Includes bibliographical references (p. 163-173) and index Integrated circuits Very large scale integration Testing Integrated circuits Very large scale integration Protection Semiconductors Thermal properties VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4047610-8 |
| title | Power-constrained testing of VLSI circuits |
| title_auth | Power-constrained testing of VLSI circuits |
| title_exact_search | Power-constrained testing of VLSI circuits |
| title_full | Power-constrained testing of VLSI circuits by Nicola Nicolici and Bashir M. Al-Hashimi |
| title_fullStr | Power-constrained testing of VLSI circuits by Nicola Nicolici and Bashir M. Al-Hashimi |
| title_full_unstemmed | Power-constrained testing of VLSI circuits by Nicola Nicolici and Bashir M. Al-Hashimi |
| title_short | Power-constrained testing of VLSI circuits |
| title_sort | power constrained testing of vlsi circuits |
| topic | Integrated circuits Very large scale integration Testing Integrated circuits Very large scale integration Protection Semiconductors Thermal properties VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Integrated circuits Very large scale integration Testing Integrated circuits Very large scale integration Protection Semiconductors Thermal properties VLSI Prüftechnik |
| work_keys_str_mv | AT nicolicinicola powerconstrainedtestingofvlsicircuits AT alhashimibashir powerconstrainedtestingofvlsicircuits |