Stochastic reliability modeling, optimization and applications

Gespeichert in:
Bibliographische Detailangaben
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Singapore World Scientific c2010
Schlagworte:
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!

MARC

LEADER 00000nam a2200000zc 4500
001 BV044179656
003 DE-604
005 00000000000000.0
007 cr|uuu---uuuuu
008 170217s2010 xx o|||| 00||| eng d
020 |a 9789814277433  |9 978-981-4277-43-3 
020 |a 9814277436  |9 981-4277-43-6 
035 |a (ZDB-30-PAD)EBC1681730 
035 |a (ZDB-89-EBL)EBL1681730 
035 |a (OCoLC)630166345 
035 |a (DE-599)BVBBV044179656 
040 |a DE-604  |b ger  |e aacr 
041 0 |a eng 
082 0 |a 620/.00452  |2 22 
245 1 0 |a Stochastic reliability modeling, optimization and applications  |c editors, Syouji Nakamura, Toshio Nakagawa 
264 1 |a Singapore  |b World Scientific  |c c2010 
300 |a xvi, 300 p. 
336 |b txt  |2 rdacontent 
337 |b c  |2 rdamedia 
338 |b cr  |2 rdacarrier 
500 |a Includes bibliographical references 
650 4 |a Mathematisches Modell 
650 4 |a Reliability (Engineering)  |x Mathematical models 
650 4 |a Stochastic systems 
700 1 |a Nakamura, Syouji  |e Sonstige  |4 oth 
700 1 |a Nakagawa, Toshio  |d 1942-  |e Sonstige  |4 oth 
912 |a ZDB-30-PAD 
943 1 |a oai:aleph.bib-bvb.de:BVB01-029586501 

Datensatz im Suchindex

_version_ 1819299813612584961
any_adam_object
building Verbundindex
bvnumber BV044179656
collection ZDB-30-PAD
ctrlnum (ZDB-30-PAD)EBC1681730
(ZDB-89-EBL)EBL1681730
(OCoLC)630166345
(DE-599)BVBBV044179656
dewey-full 620/.00452
dewey-hundreds 600 - Technology (Applied sciences)
dewey-ones 620 - Engineering and allied operations
dewey-raw 620/.00452
dewey-search 620/.00452
dewey-sort 3620 3452
dewey-tens 620 - Engineering and allied operations
format Electronic
eBook
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01167nam a2200361zc 4500</leader><controlfield tag="001">BV044179656</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2010 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814277433</subfield><subfield code="9">978-981-4277-43-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9814277436</subfield><subfield code="9">981-4277-43-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC1681730</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL1681730</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)630166345</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044179656</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620/.00452</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Stochastic reliability modeling, optimization and applications</subfield><subfield code="c">editors, Syouji Nakamura, Toshio Nakagawa</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">World Scientific</subfield><subfield code="c">c2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xvi, 300 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mathematisches Modell</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability (Engineering)</subfield><subfield code="x">Mathematical models</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Stochastic systems</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nakamura, Syouji</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nakagawa, Toshio</subfield><subfield code="d">1942-</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029586501</subfield></datafield></record></collection>
id DE-604.BV044179656
illustrated Not Illustrated
indexdate 2024-12-24T05:51:44Z
institution BVB
isbn 9789814277433
9814277436
language English
oai_aleph_id oai:aleph.bib-bvb.de:BVB01-029586501
oclc_num 630166345
open_access_boolean
physical xvi, 300 p.
psigel ZDB-30-PAD
publishDate 2010
publishDateSearch 2010
publishDateSort 2010
publisher World Scientific
record_format marc
spelling Stochastic reliability modeling, optimization and applications editors, Syouji Nakamura, Toshio Nakagawa
Singapore World Scientific c2010
xvi, 300 p.
txt rdacontent
c rdamedia
cr rdacarrier
Includes bibliographical references
Mathematisches Modell
Reliability (Engineering) Mathematical models
Stochastic systems
Nakamura, Syouji Sonstige oth
Nakagawa, Toshio 1942- Sonstige oth
spellingShingle Stochastic reliability modeling, optimization and applications
Mathematisches Modell
Reliability (Engineering) Mathematical models
Stochastic systems
title Stochastic reliability modeling, optimization and applications
title_auth Stochastic reliability modeling, optimization and applications
title_exact_search Stochastic reliability modeling, optimization and applications
title_full Stochastic reliability modeling, optimization and applications editors, Syouji Nakamura, Toshio Nakagawa
title_fullStr Stochastic reliability modeling, optimization and applications editors, Syouji Nakamura, Toshio Nakagawa
title_full_unstemmed Stochastic reliability modeling, optimization and applications editors, Syouji Nakamura, Toshio Nakagawa
title_short Stochastic reliability modeling, optimization and applications
title_sort stochastic reliability modeling optimization and applications
topic Mathematisches Modell
Reliability (Engineering) Mathematical models
Stochastic systems
topic_facet Mathematisches Modell
Reliability (Engineering) Mathematical models
Stochastic systems
work_keys_str_mv AT nakamurasyouji stochasticreliabilitymodelingoptimizationandapplications
AT nakagawatoshio stochasticreliabilitymodelingoptimizationandapplications