In-situ electron microscopy at high resolution
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| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Hackensack, NJ
World Scientific
c2008
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| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044175677 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170217s2008 xx o|||| 00||| eng d | ||
| 020 | |a 9789812797339 |9 978-981-279-733-9 | ||
| 020 | |a 9812797335 |9 981-279-733-5 | ||
| 020 | |a 9789812797346 |9 978-981-279-734-6 | ||
| 035 | |a (ZDB-30-PAD)EBC1193637 | ||
| 035 | |a (ZDB-89-EBL)EBL1193637 | ||
| 035 | |a (OCoLC)747539683 | ||
| 035 | |a (DE-599)BVBBV044175677 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 502.825 |2 22 | |
| 245 | 1 | 0 | |a In-situ electron microscopy at high resolution |c editor, Florian Banhart |
| 264 | 1 | |a Hackensack, NJ |b World Scientific |c c2008 | |
| 300 | |a vi, 311 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Electron microscopy |x Technique | |
| 650 | 4 | |a High resolution electron microscopy | |
| 650 | 0 | 7 | |a In situ |0 (DE-588)4293230-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Hochauflösendes Verfahren |0 (DE-588)4287503-1 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 1 | |a In situ |0 (DE-588)4293230-0 |D s |
| 689 | 0 | 2 | |a Hochauflösendes Verfahren |0 (DE-588)4287503-1 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Banhart, Florian |e Sonstige |4 oth | |
| 912 | |a ZDB-30-PAD | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-029582522 | |
Datensatz im Suchindex
| _version_ | 1819299806447665154 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044175677 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC1193637 (ZDB-89-EBL)EBL1193637 (OCoLC)747539683 (DE-599)BVBBV044175677 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01593nam a2200445zc 4500</leader><controlfield tag="001">BV044175677</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2008 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812797339</subfield><subfield code="9">978-981-279-733-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9812797335</subfield><subfield code="9">981-279-733-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812797346</subfield><subfield code="9">978-981-279-734-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC1193637</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL1193637</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)747539683</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044175677</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502.825</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">In-situ electron microscopy at high resolution</subfield><subfield code="c">editor, Florian Banhart</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hackensack, NJ</subfield><subfield code="b">World Scientific</subfield><subfield code="c">c2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">vi, 311 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">Technique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">High resolution electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">In situ</subfield><subfield code="0">(DE-588)4293230-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hochauflösendes Verfahren</subfield><subfield code="0">(DE-588)4287503-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">In situ</subfield><subfield code="0">(DE-588)4293230-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Hochauflösendes Verfahren</subfield><subfield code="0">(DE-588)4287503-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Banhart, Florian</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029582522</subfield></datafield></record></collection> |
| id | DE-604.BV044175677 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-24T05:51:01Z |
| institution | BVB |
| isbn | 9789812797339 9812797335 9789812797346 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029582522 |
| oclc_num | 747539683 |
| open_access_boolean | |
| physical | vi, 311 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | World Scientific |
| record_format | marc |
| spelling | In-situ electron microscopy at high resolution editor, Florian Banhart Hackensack, NJ World Scientific c2008 vi, 311 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electron microscopy Technique High resolution electron microscopy In situ (DE-588)4293230-0 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s In situ (DE-588)4293230-0 s Hochauflösendes Verfahren (DE-588)4287503-1 s 1\p DE-604 Banhart, Florian Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | In-situ electron microscopy at high resolution Electron microscopy Technique High resolution electron microscopy In situ (DE-588)4293230-0 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| subject_GND | (DE-588)4293230-0 (DE-588)4014327-2 (DE-588)4287503-1 |
| title | In-situ electron microscopy at high resolution |
| title_auth | In-situ electron microscopy at high resolution |
| title_exact_search | In-situ electron microscopy at high resolution |
| title_full | In-situ electron microscopy at high resolution editor, Florian Banhart |
| title_fullStr | In-situ electron microscopy at high resolution editor, Florian Banhart |
| title_full_unstemmed | In-situ electron microscopy at high resolution editor, Florian Banhart |
| title_short | In-situ electron microscopy at high resolution |
| title_sort | in situ electron microscopy at high resolution |
| topic | Electron microscopy Technique High resolution electron microscopy In situ (DE-588)4293230-0 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| topic_facet | Electron microscopy Technique High resolution electron microscopy In situ Elektronenmikroskopie Hochauflösendes Verfahren |
| work_keys_str_mv | AT banhartflorian insituelectronmicroscopyathighresolution |