Terrestrial radiation effects in ULSI devices and electronic systems

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1. Verfasser: Ibe, Eishi H. (VerfasserIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Singapore IEEE Wiley 2015
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MARC

LEADER 00000nmm a2200000zc 4500
001 BV044072807
003 DE-604
005 00000000000000.0
007 cr|uuu---uuuuu
008 170217s2015 |||| o||u| ||||||eng d
020 |a 9781118479292  |c Print  |9 978-1-118-47929-2 
020 |a 9781118479315  |c ebook  |9 978-1-118-47931-5 
035 |a (ZDB-30-PAD)EBC1911831 
035 |a (ZDB-89-EBL)EBL1911831 
035 |a (ZDB-38-EBR)ebr11004204 
035 |a (OCoLC)899942102 
035 |a (DE-599)BVBBV044072807 
040 |a DE-604  |b ger  |e rda 
041 0 |a eng 
082 0 |a 621.3815  |2 23 
100 1 |a Ibe, Eishi H.  |4 aut 
245 1 0 |a Terrestrial radiation effects in ULSI devices and electronic systems  |c Eishi H. Ibe 
264 1 |a Singapore  |b IEEE  |b Wiley  |c 2015 
264 4 |c © 2015 
300 |a 1 online resource (295 pages)  |b illustrations 
336 |b txt  |2 rdacontent 
337 |b c  |2 rdamedia 
338 |b cr  |2 rdacarrier 
500 |a Description based on print version record 
650 4 |a Electronic circuits  |x Effect of radiation on 
650 4 |a Integrated circuits  |x Ultra large scale integration  |x Reliability 
650 4 |a Integrated circuits  |x Effect of radiation on 
776 0 8 |i Erscheint auch als  |n Druck-Ausgabe  |a Ibe, Eishi H  |t . Terrestrial radiation effects in ULSI devices and electronic systems 
856 4 2 |m SWB Datenaustausch  |q application/pdf  |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA  |3 Buchcover 
912 |a ZDB-30-PAD 
999 |a oai:aleph.bib-bvb.de:BVB01-029479652 

Datensatz im Suchindex

_version_ 1804177108612677632
any_adam_object 1
author Ibe, Eishi H.
author_facet Ibe, Eishi H.
author_role aut
author_sort Ibe, Eishi H.
author_variant e h i eh ehi
building Verbundindex
bvnumber BV044072807
collection ZDB-30-PAD
ctrlnum (ZDB-30-PAD)EBC1911831
(ZDB-89-EBL)EBL1911831
(ZDB-38-EBR)ebr11004204
(OCoLC)899942102
(DE-599)BVBBV044072807
dewey-full 621.3815
dewey-hundreds 600 - Technology (Applied sciences)
dewey-ones 621 - Applied physics
dewey-raw 621.3815
dewey-search 621.3815
dewey-sort 3621.3815
dewey-tens 620 - Engineering and allied operations
discipline Elektrotechnik / Elektronik / Nachrichtentechnik
format Electronic
eBook
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01627nmm a2200397zc 4500</leader><controlfield tag="001">BV044072807</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2015 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118479292</subfield><subfield code="c">Print</subfield><subfield code="9">978-1-118-47929-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118479315</subfield><subfield code="c">ebook</subfield><subfield code="9">978-1-118-47931-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC1911831</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL1911831</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-EBR)ebr11004204</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)899942102</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044072807</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ibe, Eishi H.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Terrestrial radiation effects in ULSI devices and electronic systems</subfield><subfield code="c">Eishi H. Ibe</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">IEEE</subfield><subfield code="b">Wiley</subfield><subfield code="c">2015</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (295 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on print version record</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield><subfield code="x">Effect of radiation on</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Ultra large scale integration</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Effect of radiation on</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Ibe, Eishi H</subfield><subfield code="t">. Terrestrial radiation effects in ULSI devices and electronic systems</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">SWB Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&amp;doc_library=BVB01&amp;local_base=BVB01&amp;doc_number=029479652&amp;sequence=000001&amp;line_number=0001&amp;func_code=DB_RECORDS&amp;service_type=MEDIA</subfield><subfield code="3">Buchcover</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029479652</subfield></datafield></record></collection>
id DE-604.BV044072807
illustrated Illustrated
indexdate 2024-07-10T07:42:50Z
institution BVB
isbn 9781118479292
9781118479315
language English
oai_aleph_id oai:aleph.bib-bvb.de:BVB01-029479652
oclc_num 899942102
open_access_boolean
physical 1 online resource (295 pages) illustrations
psigel ZDB-30-PAD
publishDate 2015
publishDateSearch 2015
publishDateSort 2015
publisher IEEE Wiley
record_format marc
spelling Ibe, Eishi H. aut
Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe
Singapore IEEE Wiley 2015
© 2015
1 online resource (295 pages) illustrations
txt rdacontent
c rdamedia
cr rdacarrier
Description based on print version record
Electronic circuits Effect of radiation on
Integrated circuits Ultra large scale integration Reliability
Integrated circuits Effect of radiation on
Erscheint auch als Druck-Ausgabe Ibe, Eishi H . Terrestrial radiation effects in ULSI devices and electronic systems
SWB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Buchcover
spellingShingle Ibe, Eishi H.
Terrestrial radiation effects in ULSI devices and electronic systems
Electronic circuits Effect of radiation on
Integrated circuits Ultra large scale integration Reliability
Integrated circuits Effect of radiation on
title Terrestrial radiation effects in ULSI devices and electronic systems
title_auth Terrestrial radiation effects in ULSI devices and electronic systems
title_exact_search Terrestrial radiation effects in ULSI devices and electronic systems
title_full Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe
title_fullStr Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe
title_full_unstemmed Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe
title_short Terrestrial radiation effects in ULSI devices and electronic systems
title_sort terrestrial radiation effects in ulsi devices and electronic systems
topic Electronic circuits Effect of radiation on
Integrated circuits Ultra large scale integration Reliability
Integrated circuits Effect of radiation on
topic_facet Electronic circuits Effect of radiation on
Integrated circuits Ultra large scale integration Reliability
Integrated circuits Effect of radiation on
url http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
work_keys_str_mv AT ibeeishih terrestrialradiationeffectsinulsidevicesandelectronicsystems