Terrestrial radiation effects in ULSI devices and electronic systems
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore
IEEE Wiley
2015
|
Schlagworte: | |
Online-Zugang: | Buchcover |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV044072807 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 170217s2015 |||| o||u| ||||||eng d | ||
020 | |a 9781118479292 |c Print |9 978-1-118-47929-2 | ||
020 | |a 9781118479315 |c ebook |9 978-1-118-47931-5 | ||
035 | |a (ZDB-30-PAD)EBC1911831 | ||
035 | |a (ZDB-89-EBL)EBL1911831 | ||
035 | |a (ZDB-38-EBR)ebr11004204 | ||
035 | |a (OCoLC)899942102 | ||
035 | |a (DE-599)BVBBV044072807 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
082 | 0 | |a 621.3815 |2 23 | |
100 | 1 | |a Ibe, Eishi H. |4 aut | |
245 | 1 | 0 | |a Terrestrial radiation effects in ULSI devices and electronic systems |c Eishi H. Ibe |
264 | 1 | |a Singapore |b IEEE |b Wiley |c 2015 | |
264 | 4 | |c © 2015 | |
300 | |a 1 online resource (295 pages) |b illustrations | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
500 | |a Description based on print version record | ||
650 | 4 | |a Electronic circuits |x Effect of radiation on | |
650 | 4 | |a Integrated circuits |x Ultra large scale integration |x Reliability | |
650 | 4 | |a Integrated circuits |x Effect of radiation on | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Ibe, Eishi H |t . Terrestrial radiation effects in ULSI devices and electronic systems |
856 | 4 | 2 | |m SWB Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Buchcover |
912 | |a ZDB-30-PAD | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-029479652 |
Datensatz im Suchindex
_version_ | 1804177108612677632 |
---|---|
any_adam_object | 1 |
author | Ibe, Eishi H. |
author_facet | Ibe, Eishi H. |
author_role | aut |
author_sort | Ibe, Eishi H. |
author_variant | e h i eh ehi |
building | Verbundindex |
bvnumber | BV044072807 |
collection | ZDB-30-PAD |
ctrlnum | (ZDB-30-PAD)EBC1911831 (ZDB-89-EBL)EBL1911831 (ZDB-38-EBR)ebr11004204 (OCoLC)899942102 (DE-599)BVBBV044072807 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01627nmm a2200397zc 4500</leader><controlfield tag="001">BV044072807</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2015 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118479292</subfield><subfield code="c">Print</subfield><subfield code="9">978-1-118-47929-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118479315</subfield><subfield code="c">ebook</subfield><subfield code="9">978-1-118-47931-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC1911831</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL1911831</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-EBR)ebr11004204</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)899942102</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044072807</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ibe, Eishi H.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Terrestrial radiation effects in ULSI devices and electronic systems</subfield><subfield code="c">Eishi H. Ibe</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">IEEE</subfield><subfield code="b">Wiley</subfield><subfield code="c">2015</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (295 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on print version record</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield><subfield code="x">Effect of radiation on</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Ultra large scale integration</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Effect of radiation on</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Ibe, Eishi H</subfield><subfield code="t">. Terrestrial radiation effects in ULSI devices and electronic systems</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">SWB Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Buchcover</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029479652</subfield></datafield></record></collection> |
id | DE-604.BV044072807 |
illustrated | Illustrated |
indexdate | 2024-07-10T07:42:50Z |
institution | BVB |
isbn | 9781118479292 9781118479315 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029479652 |
oclc_num | 899942102 |
open_access_boolean | |
physical | 1 online resource (295 pages) illustrations |
psigel | ZDB-30-PAD |
publishDate | 2015 |
publishDateSearch | 2015 |
publishDateSort | 2015 |
publisher | IEEE Wiley |
record_format | marc |
spelling | Ibe, Eishi H. aut Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe Singapore IEEE Wiley 2015 © 2015 1 online resource (295 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Description based on print version record Electronic circuits Effect of radiation on Integrated circuits Ultra large scale integration Reliability Integrated circuits Effect of radiation on Erscheint auch als Druck-Ausgabe Ibe, Eishi H . Terrestrial radiation effects in ULSI devices and electronic systems SWB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Buchcover |
spellingShingle | Ibe, Eishi H. Terrestrial radiation effects in ULSI devices and electronic systems Electronic circuits Effect of radiation on Integrated circuits Ultra large scale integration Reliability Integrated circuits Effect of radiation on |
title | Terrestrial radiation effects in ULSI devices and electronic systems |
title_auth | Terrestrial radiation effects in ULSI devices and electronic systems |
title_exact_search | Terrestrial radiation effects in ULSI devices and electronic systems |
title_full | Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe |
title_fullStr | Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe |
title_full_unstemmed | Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe |
title_short | Terrestrial radiation effects in ULSI devices and electronic systems |
title_sort | terrestrial radiation effects in ulsi devices and electronic systems |
topic | Electronic circuits Effect of radiation on Integrated circuits Ultra large scale integration Reliability Integrated circuits Effect of radiation on |
topic_facet | Electronic circuits Effect of radiation on Integrated circuits Ultra large scale integration Reliability Integrated circuits Effect of radiation on |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT ibeeishih terrestrialradiationeffectsinulsidevicesandelectronicsystems |