ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch Tagungsbericht E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2015
|
| Schlagworte: | |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044001599 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170117s2015 xx o|||| 00||| eng d | ||
| 020 | |a 9781523102068 |c Online |9 978-1-5231-0206-8 | ||
| 020 | |a 9781627081023 |c print |9 978-1-62708-102-3 | ||
| 035 | |a (OCoLC)969670599 | ||
| 035 | |a (DE-599)BVBBV044001599 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.381 |2 23 | |
| 111 | 2 | |a ISTFA |n 41. |d 2015 |c Portland, Or. |j Verfasser |0 (DE-588)1123593396 |4 aut | |
| 245 | 1 | 0 | |a ISTFA 2015 |b conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA |c organized by EDFAS, ISTFA/2015, ASM International |
| 246 | 1 | 3 | |a International Symposium for Testing and Failure Analysis 2015 |
| 246 | 1 | 3 | |a Conference proceedings of the 41th International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a 41st International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a Forty-first International Symposium for Testing and Failure Analysis |
| 264 | 1 | |a Materials Park, OH |b ASM International |c 2015 | |
| 300 | |a 1 Online-Ressource (xix, 456 Seiten) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 340 | |a Online-Ressource | ||
| 500 | |a Some online versions lack accompanying media packaged with the printed version | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Digital |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Microelectronics |2 bisacsh | |
| 650 | 7 | |a Electronic apparatus and appliances / Testing |2 fast | |
| 650 | 7 | |a Electronics / Materials / Testing |2 fast | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |0 (DE-588)6015594-2 |4 oth | |
| 710 | 2 | |a ASM International |e Sonstige |0 (DE-588)5013969-1 |4 oth | |
| 912 | |a ZDB-10-MMN | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-029409511 | |
Datensatz im Suchindex
| _version_ | 1819299004724281345 |
|---|---|
| any_adam_object | |
| author_corporate | ISTFA Portland, Or |
| author_corporate_role | aut |
| author_facet | ISTFA Portland, Or |
| author_sort | ISTFA Portland, Or |
| building | Verbundindex |
| bvnumber | BV044001599 |
| collection | ZDB-10-MMN |
| contents | Includes bibliographical references and index |
| ctrlnum | (OCoLC)969670599 (DE-599)BVBBV044001599 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic Conference Proceeding eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02235nam a2200469zc 4500</leader><controlfield tag="001">BV044001599</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170117s2015 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781523102068</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-5231-0206-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781627081023</subfield><subfield code="c">print</subfield><subfield code="9">978-1-62708-102-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)969670599</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044001599</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="2">23</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">ISTFA</subfield><subfield code="n">41.</subfield><subfield code="d">2015</subfield><subfield code="c">Portland, Or.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1123593396</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISTFA 2015</subfield><subfield code="b">conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA</subfield><subfield code="c">organized by EDFAS, ISTFA/2015, ASM International</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">International Symposium for Testing and Failure Analysis 2015</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Conference proceedings of the 41th International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">41st International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Forty-first International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, OH</subfield><subfield code="b">ASM International</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xix, 456 Seiten)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="340" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Some online versions lack accompanying media packaged with the printed version</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Digital</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Microelectronics</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronic apparatus and appliances / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronics / Materials / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electronic Device Failure Analysis Society</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)6015594-2</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ASM International</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)5013969-1</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-10-MMN</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029409511</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV044001599 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-24T05:38:43Z |
| institution | BVB |
| institution_GND | (DE-588)1123593396 (DE-588)6015594-2 (DE-588)5013969-1 |
| isbn | 9781523102068 9781627081023 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029409511 |
| oclc_num | 969670599 |
| open_access_boolean | |
| physical | 1 Online-Ressource (xix, 456 Seiten) |
| psigel | ZDB-10-MMN |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | ASM International |
| record_format | marc |
| spelling | ISTFA 41. 2015 Portland, Or. Verfasser (DE-588)1123593396 aut ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA organized by EDFAS, ISTFA/2015, ASM International International Symposium for Testing and Failure Analysis 2015 Conference proceedings of the 41th International Symposium for Testing and Failure Analysis 41st International Symposium for Testing and Failure Analysis Forty-first International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2015 1 Online-Ressource (xix, 456 Seiten) txt rdacontent c rdamedia cr rdacarrier Online-Ressource Some online versions lack accompanying media packaged with the printed version Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content Electronic Device Failure Analysis Society Sonstige (DE-588)6015594-2 oth ASM International Sonstige (DE-588)5013969-1 oth |
| spellingShingle | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA |
| title_alt | International Symposium for Testing and Failure Analysis 2015 Conference proceedings of the 41th International Symposium for Testing and Failure Analysis 41st International Symposium for Testing and Failure Analysis Forty-first International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA |
| title_exact_search | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA |
| title_full | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA organized by EDFAS, ISTFA/2015, ASM International |
| title_fullStr | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA organized by EDFAS, ISTFA/2015, ASM International |
| title_full_unstemmed | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA organized by EDFAS, ISTFA/2015, ASM International |
| title_short | ISTFA 2015 |
| title_sort | istfa 2015 conference proceedings from the 41st international symposium for testing and failure analysis november 1 5 2015 oregon convention center portland oregon usa |
| title_sub | conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
| work_keys_str_mv | AT istfaportlandor istfa2015conferenceproceedingsfromthe41stinternationalsymposiumfortestingandfailureanalysisnovember152015oregonconventioncenterportlandoregonusa AT electronicdevicefailureanalysissociety istfa2015conferenceproceedingsfromthe41stinternationalsymposiumfortestingandfailureanalysisnovember152015oregonconventioncenterportlandoregonusa AT asminternational istfa2015conferenceproceedingsfromthe41stinternationalsymposiumfortestingandfailureanalysisnovember152015oregonconventioncenterportlandoregonusa AT istfaportlandor internationalsymposiumfortestingandfailureanalysis2015 AT electronicdevicefailureanalysissociety internationalsymposiumfortestingandfailureanalysis2015 AT asminternational internationalsymposiumfortestingandfailureanalysis2015 AT istfaportlandor conferenceproceedingsofthe41thinternationalsymposiumfortestingandfailureanalysis AT electronicdevicefailureanalysissociety conferenceproceedingsofthe41thinternationalsymposiumfortestingandfailureanalysis AT asminternational conferenceproceedingsofthe41thinternationalsymposiumfortestingandfailureanalysis AT istfaportlandor 41stinternationalsymposiumfortestingandfailureanalysis AT electronicdevicefailureanalysissociety 41stinternationalsymposiumfortestingandfailureanalysis AT asminternational 41stinternationalsymposiumfortestingandfailureanalysis AT istfaportlandor fortyfirstinternationalsymposiumfortestingandfailureanalysis AT electronicdevicefailureanalysissociety fortyfirstinternationalsymposiumfortestingandfailureanalysis AT asminternational fortyfirstinternationalsymposiumfortestingandfailureanalysis |