Nanometrology using the transmission electron microscope
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
San Rafael, CA
Morgan & Claypool Publishers
[2015]
Bristol IOP Publishing [2015] |
| Ausgabe: | Version: 20150901 |
| Schriftenreihe: | IOP concise physics
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| Schlagworte: | |
| Online-Zugang: | Volltext |
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Datensatz im Suchindex
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| id | DE-604.BV043187073 |
| illustrated | Illustrated |
| indexdate | 2025-02-03T17:41:49Z |
| institution | BVB |
| isbn | 9781681741208 9781681740560 9781681742489 |
| issn | 2053-2571 2054-7307 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028610854 |
| oclc_num | 932730721 |
| open_access_boolean | |
| owner | DE-19 DE-BY-UBM DE-703 DE-20 |
| owner_facet | DE-19 DE-BY-UBM DE-703 DE-20 |
| physical | 1 Online-Ressource (69 Seiten in getrennter Zählung) Illustrationen, Diagramme |
| psigel | ZDB-135-ICP ZDB-135-IAL ZDB-135-ICP_Release2 |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Morgan & Claypool Publishers IOP Publishing |
| record_format | marc |
| series2 | IOP concise physics |
| spellingShingle | Stolojan, Vlad Nanometrology using the transmission electron microscope Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4215608-7 |
| title | Nanometrology using the transmission electron microscope |
| title_auth | Nanometrology using the transmission electron microscope |
| title_exact_search | Nanometrology using the transmission electron microscope |
| title_full | Nanometrology using the transmission electron microscope Vlad Stolojan (Advanced Technology Institute, Department of Electrical and Electronic Engineering, University of Surrey, Guildford, UK) |
| title_fullStr | Nanometrology using the transmission electron microscope Vlad Stolojan (Advanced Technology Institute, Department of Electrical and Electronic Engineering, University of Surrey, Guildford, UK) |
| title_full_unstemmed | Nanometrology using the transmission electron microscope Vlad Stolojan (Advanced Technology Institute, Department of Electrical and Electronic Engineering, University of Surrey, Guildford, UK) |
| title_short | Nanometrology using the transmission electron microscope |
| title_sort | nanometrology using the transmission electron microscope |
| topic | Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | Durchstrahlungselektronenmikroskopie |
| url | https://doi.org/10.1088/978-1-6817-4120-8 |
| work_keys_str_mv | AT stolojanvlad nanometrologyusingthetransmissionelectronmicroscope |