Scanning force microscopy with applications to electric, magnetic, and atomic forces
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| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Oxford University Press
1994
|
| Ausgabe: | Rev. ed |
| Schriftenreihe: | Oxford series in optical and imaging sciences
5 |
| Schlagworte: | |
| Online-Zugang: | DE-1046 DE-1047 Volltext |
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Datensatz im Suchindex
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| author | Sarid, Dror |
| author_facet | Sarid, Dror |
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| building | Verbundindex |
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| dewey-hundreds | 500 - Natural sciences and mathematics |
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| dewey-search | 502/.8/2 |
| dewey-sort | 3502 18 12 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| edition | Rev. ed |
| format | Electronic eBook |
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| id | DE-604.BV043143770 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-24T04:43:09Z |
| institution | BVB |
| isbn | 019509204X 0198022816 9780195092042 9780198022817 |
| language | English |
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| physical | 1 Online-Ressource (xiii, 263 p.) |
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| publishDate | 1994 |
| publishDateSearch | 1994 |
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| publisher | Oxford University Press |
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| series2 | Oxford series in optical and imaging sciences |
| spelling | Sarid, Dror Verfasser aut Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid Rev. ed New York Oxford University Press 1994 1 Online-Ressource (xiii, 263 p.) txt rdacontent c rdamedia cr rdacarrier Oxford series in optical and imaging sciences 5 Includes bibliographical references (p. 233-259) and index SCIENCE / Microscopes & Microscopy bisacsh Microscopia larpcal Scanning force microscopy fast Surfaces (Physics) fast Scanning force microscopy Surfaces (Physics) Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Abtastsystem (DE-588)4129844-5 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 s Festkörperoberfläche (DE-588)4127823-9 s 1\p DE-604 Rasterkraftmikroskopie (DE-588)4274473-8 s 2\p DE-604 Tunneleffekt (DE-588)4136216-0 s 3\p DE-604 Elektronenmikroskop (DE-588)4014326-0 s 4\p DE-604 Abtastsystem (DE-588)4129844-5 s 5\p DE-604 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=143577 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Sarid, Dror Scanning force microscopy with applications to electric, magnetic, and atomic forces SCIENCE / Microscopes & Microscopy bisacsh Microscopia larpcal Scanning force microscopy fast Surfaces (Physics) fast Scanning force microscopy Surfaces (Physics) Rasterkraftmikroskopie (DE-588)4274473-8 gnd Abtastsystem (DE-588)4129844-5 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Tunneleffekt (DE-588)4136216-0 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)4129844-5 (DE-588)4014326-0 (DE-588)4127823-9 (DE-588)4252995-5 (DE-588)4136216-0 |
| title | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_auth | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_exact_search | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_full | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_fullStr | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_full_unstemmed | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_short | Scanning force microscopy |
| title_sort | scanning force microscopy with applications to electric magnetic and atomic forces |
| title_sub | with applications to electric, magnetic, and atomic forces |
| topic | SCIENCE / Microscopes & Microscopy bisacsh Microscopia larpcal Scanning force microscopy fast Surfaces (Physics) fast Scanning force microscopy Surfaces (Physics) Rasterkraftmikroskopie (DE-588)4274473-8 gnd Abtastsystem (DE-588)4129844-5 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Tunneleffekt (DE-588)4136216-0 gnd |
| topic_facet | SCIENCE / Microscopes & Microscopy Microscopia Scanning force microscopy Surfaces (Physics) Rasterkraftmikroskopie Abtastsystem Elektronenmikroskop Festkörperoberfläche Rastertunnelmikroskopie Tunneleffekt |
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| work_keys_str_mv | AT sariddror scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces |