Semiconductor strain metrology principles and applications

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1. Verfasser: Wong, Terence K. S. (VerfasserIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: [Saif Zone, Sharjah, U.A.E] Bentham Science [2012]
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LEADER 00000nmm a2200000zc 4500
001 BV043109156
003 DE-604
005 00000000000000.0
007 cr|uuu---uuuuu
008 151126s2012 |||| o||u| ||||||eng d
020 |a 1608053598  |c electronic bk.  |9 1-60805-359-8 
020 |a 9781608053599  |c electronic bk.  |9 978-1-60805-359-9 
035 |a (OCoLC)811371628 
035 |a (DE-599)BVBBV043109156 
040 |a DE-604  |b ger  |e aacr 
041 0 |a eng 
049 |a DE-1046  |a DE-1047 
082 0 |a 621.3815 
100 1 |a Wong, Terence K. S.  |e Verfasser  |4 aut 
245 1 0 |a Semiconductor strain metrology  |b principles and applications  |c Terence K.S. Wong 
264 1 |a [Saif Zone, Sharjah, U.A.E]  |b Bentham Science  |c [2012] 
300 |a 1 Online-Ressource (136 p. :) 
336 |b txt  |2 rdacontent 
337 |b c  |2 rdamedia 
338 |b cr  |2 rdacarrier 
500 |a Includes bibliographical references and index 
650 7 |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / General  |2 bisacsh 
650 7 |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated  |2 bisacsh 
650 4 |a Semiconductors  |x Design and construction  |x Materials 
650 4 |a Compound semiconductors  |x Design and construction  |x Materials 
650 4 |a Silicon-on-insulator technology 
856 4 0 |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610  |x Aggregator  |3 Volltext 
912 |a ZDB-4-EBA 
999 |a oai:aleph.bib-bvb.de:BVB01-028533347 
966 e |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610  |l FAW01  |p ZDB-4-EBA  |q FAW_PDA_EBA  |x Aggregator  |3 Volltext 
966 e |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610  |l FAW02  |p ZDB-4-EBA  |q FAW_PDA_EBA  |x Aggregator  |3 Volltext 

Datensatz im Suchindex

_version_ 1804175526929104896
any_adam_object
author Wong, Terence K. S.
author_facet Wong, Terence K. S.
author_role aut
author_sort Wong, Terence K. S.
author_variant t k s w tks tksw
building Verbundindex
bvnumber BV043109156
collection ZDB-4-EBA
ctrlnum (OCoLC)811371628
(DE-599)BVBBV043109156
dewey-full 621.3815
dewey-hundreds 600 - Technology (Applied sciences)
dewey-ones 621 - Applied physics
dewey-raw 621.3815
dewey-search 621.3815
dewey-sort 3621.3815
dewey-tens 620 - Engineering and allied operations
discipline Elektrotechnik / Elektronik / Nachrichtentechnik
format Electronic
eBook
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01789nmm a2200397zc 4500</leader><controlfield tag="001">BV043109156</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">151126s2012 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1608053598</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">1-60805-359-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781608053599</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-1-60805-359-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)811371628</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043109156</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield><subfield code="a">DE-1047</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wong, Terence K. S.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Semiconductor strain metrology</subfield><subfield code="b">principles and applications</subfield><subfield code="c">Terence K.S. Wong</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">[Saif Zone, Sharjah, U.A.E]</subfield><subfield code="b">Bentham Science</subfield><subfield code="c">[2012]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (136 p. :)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY &amp; ENGINEERING / Electronics / Circuits / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY &amp; ENGINEERING / Electronics / Circuits / Integrated</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Design and construction</subfield><subfield code="x">Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Compound semiconductors</subfield><subfield code="x">Design and construction</subfield><subfield code="x">Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon-on-insulator technology</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&amp;scope=site&amp;db=nlebk&amp;db=nlabk&amp;AN=500610</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028533347</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&amp;scope=site&amp;db=nlebk&amp;db=nlabk&amp;AN=500610</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&amp;scope=site&amp;db=nlebk&amp;db=nlabk&amp;AN=500610</subfield><subfield code="l">FAW02</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id DE-604.BV043109156
illustrated Not Illustrated
indexdate 2024-07-10T07:17:42Z
institution BVB
isbn 1608053598
9781608053599
language English
oai_aleph_id oai:aleph.bib-bvb.de:BVB01-028533347
oclc_num 811371628
open_access_boolean
owner DE-1046
DE-1047
owner_facet DE-1046
DE-1047
physical 1 Online-Ressource (136 p. :)
psigel ZDB-4-EBA
ZDB-4-EBA FAW_PDA_EBA
publishDate 2012
publishDateSearch 2012
publishDateSort 2012
publisher Bentham Science
record_format marc
spelling Wong, Terence K. S. Verfasser aut
Semiconductor strain metrology principles and applications Terence K.S. Wong
[Saif Zone, Sharjah, U.A.E] Bentham Science [2012]
1 Online-Ressource (136 p. :)
txt rdacontent
c rdamedia
cr rdacarrier
Includes bibliographical references and index
TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh
Semiconductors Design and construction Materials
Compound semiconductors Design and construction Materials
Silicon-on-insulator technology
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610 Aggregator Volltext
spellingShingle Wong, Terence K. S.
Semiconductor strain metrology principles and applications
TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh
Semiconductors Design and construction Materials
Compound semiconductors Design and construction Materials
Silicon-on-insulator technology
title Semiconductor strain metrology principles and applications
title_auth Semiconductor strain metrology principles and applications
title_exact_search Semiconductor strain metrology principles and applications
title_full Semiconductor strain metrology principles and applications Terence K.S. Wong
title_fullStr Semiconductor strain metrology principles and applications Terence K.S. Wong
title_full_unstemmed Semiconductor strain metrology principles and applications Terence K.S. Wong
title_short Semiconductor strain metrology
title_sort semiconductor strain metrology principles and applications
title_sub principles and applications
topic TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh
Semiconductors Design and construction Materials
Compound semiconductors Design and construction Materials
Silicon-on-insulator technology
topic_facet TECHNOLOGY & ENGINEERING / Electronics / Circuits / General
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated
Semiconductors Design and construction Materials
Compound semiconductors Design and construction Materials
Silicon-on-insulator technology
url http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610
work_keys_str_mv AT wongterenceks semiconductorstrainmetrologyprinciplesandapplications