Know the risk learning from errors and accidents : safety and risk in today's technology
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Butterworth-Heinemann
c2003
|
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV042315978 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150129s2003 |||| o||u| ||||||eng d | ||
| 020 | |a 0750675969 |9 0-7506-7596-9 | ||
| 020 | |a 9780750675963 |9 978-0-7506-7596-3 | ||
| 035 | |a (ZDB-33-EBS)ocn162592340 | ||
| 035 | |a (OCoLC)178046242 | ||
| 035 | |a (DE-599)BVBBV042315978 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 620.8/6 |2 22 | |
| 100 | 1 | |a Duffey, R. B., (Romney B.) |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Know the risk |b learning from errors and accidents : safety and risk in today's technology |c Romney Beecher Duffey, John Walton Saull |
| 264 | 1 | |a Amsterdam |b Butterworth-Heinemann |c c2003 | |
| 300 | |a 1 Online-Ressource (xiv, 227 p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a We live in a technological world, exposed to many risks and errors and the fear of death. Know the Risk shows us how we can learn from the many errors and tragic accidents which have plagued our developing technological world. This breakthrough volume presents a new concept and theory that shows how errors can and should be analyzed so that learning and experience are accounted for. The authors show that, by using a universal learning curve, errors can be tracked and managed so that they are reduced to the smallest number possible. The authors have devoted a number of years to gathering data, analyzing theories relating to error reduction, design improvement, management of errors and assignment of cause. The analyzed data relates to millions of errors. They find a common thread between all technology-related accidents and link all of these errors (from the headline stories to the everyday accidents). | ||
| 500 | |a They challenge the reader to take a different look at the stream of threats, risks, dangers, statistics and errors by presenting a new perspective. The book makes use of detailed illustrations and explores many headline accidents which highlight human weaknesses in harnessing and exploiting the technology we have developed; from the Titanic to Chernobyl, Bhopal to Concorde, the Mary Rose to the Paddington rail crash and examine errors over which we have little or no control. By analyzing the vast data society has collected, the authors show how the famous accidents and our everyday risks are related. The authors prove the strength of their observations by comparing their findings to the recorded history of tragedies, disasters, accidents and incidents in chemical, airline, shipping, rail, automobile, nuclear, medical, industrial and manufacturing technologies. | ||
| 500 | |a They also address the management of Quality and losses in production, the search for zero defects and the avoidance of personal risk and danger. Stresses the importance of a learning environment for safety improvement Places both quality and safety management in the same learning context Learn how to track and manage errors to reduce as quickly as possible | ||
| 500 | |a Includes bibliographical references (p. 201-210) and index | ||
| 650 | 7 | |a Industrial safety |2 fast | |
| 650 | 4 | |a Industrial safety | |
| 700 | 1 | |a Saull, John Walton |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/book/9780750675963 |x Verlag |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 940 | 1 | |q FLA_PDA_ESD | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027752969 | ||
| 966 | e | |u http://www.sciencedirect.com/science/book/9780750675963 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804152910803632129 |
|---|---|
| any_adam_object | |
| author | Duffey, R. B., (Romney B.) |
| author_facet | Duffey, R. B., (Romney B.) |
| author_role | aut |
| author_sort | Duffey, R. B., (Romney B.) |
| author_variant | r b r b d rbrb rbrbd |
| building | Verbundindex |
| bvnumber | BV042315978 |
| collection | ZDB-33-ESD |
| ctrlnum | (ZDB-33-EBS)ocn162592340 (OCoLC)178046242 (DE-599)BVBBV042315978 |
| dewey-full | 620.8/6 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.8/6 |
| dewey-search | 620.8/6 |
| dewey-sort | 3620.8 16 |
| dewey-tens | 620 - Engineering and allied operations |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03606nmm a2200421zc 4500</leader><controlfield tag="001">BV042315978</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150129s2003 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0750675969</subfield><subfield code="9">0-7506-7596-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780750675963</subfield><subfield code="9">978-0-7506-7596-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-EBS)ocn162592340</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)178046242</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042315978</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.8/6</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Duffey, R. B., (Romney B.)</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Know the risk</subfield><subfield code="b">learning from errors and accidents : safety and risk in today's technology</subfield><subfield code="c">Romney Beecher Duffey, John Walton Saull</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">Butterworth-Heinemann</subfield><subfield code="c">c2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xiv, 227 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">We live in a technological world, exposed to many risks and errors and the fear of death. Know the Risk shows us how we can learn from the many errors and tragic accidents which have plagued our developing technological world. This breakthrough volume presents a new concept and theory that shows how errors can and should be analyzed so that learning and experience are accounted for. The authors show that, by using a universal learning curve, errors can be tracked and managed so that they are reduced to the smallest number possible. The authors have devoted a number of years to gathering data, analyzing theories relating to error reduction, design improvement, management of errors and assignment of cause. The analyzed data relates to millions of errors. They find a common thread between all technology-related accidents and link all of these errors (from the headline stories to the everyday accidents). </subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">They challenge the reader to take a different look at the stream of threats, risks, dangers, statistics and errors by presenting a new perspective. The book makes use of detailed illustrations and explores many headline accidents which highlight human weaknesses in harnessing and exploiting the technology we have developed; from the Titanic to Chernobyl, Bhopal to Concorde, the Mary Rose to the Paddington rail crash and examine errors over which we have little or no control. By analyzing the vast data society has collected, the authors show how the famous accidents and our everyday risks are related. The authors prove the strength of their observations by comparing their findings to the recorded history of tragedies, disasters, accidents and incidents in chemical, airline, shipping, rail, automobile, nuclear, medical, industrial and manufacturing technologies. </subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">They also address the management of Quality and losses in production, the search for zero defects and the avoidance of personal risk and danger. Stresses the importance of a learning environment for safety improvement Places both quality and safety management in the same learning context Learn how to track and manage errors to reduce as quickly as possible</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. 201-210) and index</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Industrial safety</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Industrial safety</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Saull, John Walton</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/book/9780750675963</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FLA_PDA_ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027752969</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/book/9780750675963</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV042315978 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:18:13Z |
| institution | BVB |
| isbn | 0750675969 9780750675963 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027752969 |
| oclc_num | 162592340 178046242 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | 1 Online-Ressource (xiv, 227 p.) |
| psigel | ZDB-33-ESD FLA_PDA_ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Butterworth-Heinemann |
| record_format | marc |
| spelling | Duffey, R. B., (Romney B.) Verfasser aut Know the risk learning from errors and accidents : safety and risk in today's technology Romney Beecher Duffey, John Walton Saull Amsterdam Butterworth-Heinemann c2003 1 Online-Ressource (xiv, 227 p.) txt rdacontent c rdamedia cr rdacarrier We live in a technological world, exposed to many risks and errors and the fear of death. Know the Risk shows us how we can learn from the many errors and tragic accidents which have plagued our developing technological world. This breakthrough volume presents a new concept and theory that shows how errors can and should be analyzed so that learning and experience are accounted for. The authors show that, by using a universal learning curve, errors can be tracked and managed so that they are reduced to the smallest number possible. The authors have devoted a number of years to gathering data, analyzing theories relating to error reduction, design improvement, management of errors and assignment of cause. The analyzed data relates to millions of errors. They find a common thread between all technology-related accidents and link all of these errors (from the headline stories to the everyday accidents). They challenge the reader to take a different look at the stream of threats, risks, dangers, statistics and errors by presenting a new perspective. The book makes use of detailed illustrations and explores many headline accidents which highlight human weaknesses in harnessing and exploiting the technology we have developed; from the Titanic to Chernobyl, Bhopal to Concorde, the Mary Rose to the Paddington rail crash and examine errors over which we have little or no control. By analyzing the vast data society has collected, the authors show how the famous accidents and our everyday risks are related. The authors prove the strength of their observations by comparing their findings to the recorded history of tragedies, disasters, accidents and incidents in chemical, airline, shipping, rail, automobile, nuclear, medical, industrial and manufacturing technologies. They also address the management of Quality and losses in production, the search for zero defects and the avoidance of personal risk and danger. Stresses the importance of a learning environment for safety improvement Places both quality and safety management in the same learning context Learn how to track and manage errors to reduce as quickly as possible Includes bibliographical references (p. 201-210) and index Industrial safety fast Industrial safety Saull, John Walton Sonstige oth http://www.sciencedirect.com/science/book/9780750675963 Verlag Volltext |
| spellingShingle | Duffey, R. B., (Romney B.) Know the risk learning from errors and accidents : safety and risk in today's technology Industrial safety fast Industrial safety |
| title | Know the risk learning from errors and accidents : safety and risk in today's technology |
| title_auth | Know the risk learning from errors and accidents : safety and risk in today's technology |
| title_exact_search | Know the risk learning from errors and accidents : safety and risk in today's technology |
| title_full | Know the risk learning from errors and accidents : safety and risk in today's technology Romney Beecher Duffey, John Walton Saull |
| title_fullStr | Know the risk learning from errors and accidents : safety and risk in today's technology Romney Beecher Duffey, John Walton Saull |
| title_full_unstemmed | Know the risk learning from errors and accidents : safety and risk in today's technology Romney Beecher Duffey, John Walton Saull |
| title_short | Know the risk |
| title_sort | know the risk learning from errors and accidents safety and risk in today s technology |
| title_sub | learning from errors and accidents : safety and risk in today's technology |
| topic | Industrial safety fast Industrial safety |
| topic_facet | Industrial safety |
| url | http://www.sciencedirect.com/science/book/9780750675963 |
| work_keys_str_mv | AT duffeyrbromneyb knowtherisklearningfromerrorsandaccidentssafetyandriskintodaystechnology AT saulljohnwalton knowtherisklearningfromerrorsandaccidentssafetyandriskintodaystechnology |