Electronics reliability and measurement technology nondestructive evaluation

Electronics reliability and measurement technology nondestructive evaluation

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Gespeichert in:
Bibliographische Detailangaben
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Park Ridge, N.J., U.S.A. Noyes Data Corp. ©1988
Schlagworte:
Conference proceedings
TECHNOLOGY & ENGINEERING / Electronics / Microelectronics
TECHNOLOGY & ENGINEERING / Electronics / Digital
Integrated circuits / Reliability
Integrated circuits / Testing
Nondestructive testing
Integrated circuits > Reliability > Congresses
Nondestructive testing > Congresses
Integrated circuits > Testing > Congresses
Elektronische Schaltung
Zuverlässigkeit
Elektronik
Elektrotechnologie
Konferenzschrift
Online-Zugang:Volltext
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Beschreibung
Beschreibung:"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots
Includes bibliographical references and index
Beschreibung:1 Online-Ressource (xii, 128 pages)
ISBN:1591240514
9781591240518
9780815511717
081551171X
9780815516996
0815516991
9780815517009
9780080944685
008094468X

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