High-resolution electron microscopy
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| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Oxford [u.a.]
Oxford Univ. Press
2013
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| Ausgabe: | 4. ed. |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis Klappentext |
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| 245 | 1 | 0 | |a High-resolution electron microscopy |c John C. H. Spence |
| 250 | |a 4. ed. | ||
| 264 | 1 | |a Oxford [u.a.] |b Oxford Univ. Press |c 2013 | |
| 300 | |a XIX, 406 S. |b Ill., graph. Darst. | ||
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Datensatz im Suchindex
| DE-19_call_number | 1801/UH 6300 S744(4) |
|---|---|
| DE-19_location | 85 |
| DE-BY-UBM_katkey | 4996964 |
| DE-BY-UBM_media_number | 41621317220015 |
| _version_ | 1823055481940213760 |
| adam_text | Contents
Symbols and abbreviations
xvii
1
Preliminaries
1
1.1
Elementary principles of phase-contrast
ТЕМ
imaging
2
1.2
Instrumental requirements for high resolution
8
1.3
First experiments
10
References
1
1
2
Electron optics
13
2.1
The electron wavelength and relativity
13
2.2
Simple lens properties
16
2.3
The paraxial ray equation
22
2.4
The constant-field approximation
24
2.5
Projector lenses
25
2.6
The objective lens
28
2.7
Practical lens design
29
2.8
Aberrations
31
2.9
The pre-field
37
2.10
Aberration correction
38
References
43
Bibliography
45
3
Wave optics
46
3.1
Propagation and Fresnel diffraction
47
3.2
Lens action and the diffraction limit
50
3.3
Wave and ray aberrations (to fifth order)
55
3.4
Strong-phase and weak-phase objects
61
3.5
Diffractograms for aberration analysis
63
References
65
Bibliography
66
4
Coherence and Fourier optics
67
4.1
Independent electrons and computed images
69
4.2
Coherent and incoherent images and the damping envelopes
70
4.3
The characterization of coherence
76
4.4
Spatial coherence using hollow-cone illumination
79
4.5
The effect of source size on coherence
81
4.6
Coherence requirements in practice
83
References
86
Bibliography
87
xiv Contents
5
ТЕМ
imaging of thin crystals and their defects
88
5.1
The effect of lens aberrations on simple lattice fringes
89
5.2
The effect of beam divergence on depth of field
93
5.3
Approximations for the diffracted amplitudes
96
5.4
Images of crystals with variable spacing
—
spinodal decomposition
and modulated structures
102
5.5
Are the atom images black or white? A simple symmetry argument
104
5.6
The multislice method and the polynomial solution
106
5.7
Bloch wave methods, bound states, and symmetry reduction
of the dispersion matrix
107
5.8
Partial coherence effects in dynamical computations
—
beyond
the product representation. Fourier images
113
5.9
Absorption effects
115
5.10
Dynamical forbidden reflections
117
5.11
Relationship between algorithms.
Supercells,
patching
122
5.12
Sign conventions
125
5.13
Image simulation, quantification, and the Stobbs factor
126
5.14
Image interpretation in germanium
—
a case study
129
5.15
Images of defects and nanostructures
134
5.16
Tomography at atomic resolution
—
imaging in three dimensions
143
5.17
Imaging bonds between atoms
145
References
146
6
Imaging molecules: radiation damage
154
6.1
Phase and amplitude contrast
154
6.2
Single atoms in bright field
157
6.3
The use of a higher accelerating voltage
165
6.4
Contrast and atomic number
169
6.5
Dark-field methods
171
6.6
Inelastic scattering
174
6.7
Noise, information, and the Rose equation
177
6.8
Single-particle cryo-electron microscopy: tomography
180
6.9
Electron crystallography of two-dimensional crystals
188
6.10
Organic crystals
190
6.11
Radiation damage: organics and low-voltage EM
192
6.12
Radiation damage: inorganics
195
References
197
7
Image processing, super-resolution, and
diflractive
imaging
204
7.1
Through-focus series, coherent detection, optimization, and error metrics
204
7.2
Tilt series, aperture synthesis
210
7.3
Off-axis electron holography
211
7.4
Imaging with aberration correction: STEM and
ТЕМ
212
7.5
Combining diffraction and image data for crystals
215
7.6
Ptychography, Ronchigrams, shadow images, in-line holography,
and diffractive imaging
219
7.7
Direct inversion from dynamical diffraction patterns
226
References
226
Contents xv
8
Scanning transmission electron microscopy and Z-contrast
233
8.1
Imaging modes, reciprocity, and Bragg scattering
233
8.2
Coherence functions in STEM
240
8.3
Dark-field STEM: incoherent imaging, and resolution limits
243
8.4
Multiple elastic scattering in STEM: channelling
249
8.5
Z-contrast in STEM: thermal diffuse scattering
251
8.6
Three-dimensional STEM tomography
257
References
260
9
Electron sources and detectors
264
9.1
The illumination system
265
9.2
Brightness measurement
268
9.3
Biasing and high-voltage stability for thermal sources
270
9.4
Hair-pin tungsten filaments
274
9.5
Lanthanum hexaboride sources
274
9.6
Field-emission sources
275
9.7
The charged-coupled device detector
276
9.8
Image plates
281
9.9
Film
282
9.10
Direct detection cameras
283
References
286
10
Measurement of electron-optical parameters
289
10.1
Object
ive-
lens focus increments
289
10.2
Spherical aberration constant
291
10.3
Magnification calibration
293
10.4
Chromatic aberration constant
295
10.5
Astigmatic difference: three-fold astigmatism
295
10.6
Diffractogram measurements
296
10.7
Lateral coherence width
299
10.8
Electron wavelength and camera length
302
10.9
Resolution
303
lO.lORonchigram analysis for aberration correction
306
References
312
11
Instabilities and the microscope environment
315
11.1
Magnetic fields
315
11.2
High-volt age instability
318
11.3
Vibration
319
11.4
Specimen movement
319
11.5
Contamination and the vacuum system
321
11.6
Pressure, temperature, and draughts
323
References
323
12
Experimental methods
324
12.1
Astigmatism correction
325
12.2
Taking the picture 326
12.3
Recording atomic-
resolut
ion images
—
an example
328
xvi Contents
12.4
Adjusting the crystal orientation using non-eucentric
specimen holders
335
12.5
Focusing techniques and auto-tuning
337
12.6
Substrates, sample supports, and graphene
340
12.7
Film analysis and handling for cryo-EM
343
12.8
Ancillary instrumentation for HREM
344
12.9
A checklist for high-resolution work
345
References
346
13
Associated techniques
348
13.1
X-ray microanalysis and ALCHEMI
348
13.2
Electron energy loss spectroscopy in STEM
357
13.3
Microdiffraction, CBED,
and precession methods
363
13.4
Cathodoluminescence in STEM
372
13.5
Environmental HREM, imaging surfaces, holography of fields, and
magnetic imaging with twisty beams
376
References
380
Appendices
388
Index
403
This new fourth edition of the standard text on atomic-resolution
transmission electron microscopy
(ТЕМ)
retains material from the previous
edition on the fundamentals of electron optics and aberration correction,
linear imaging theory (including wave aberrations to fifth order) with partial
coherence, and multiple-scattering theory. This edition also features updated
sections on practical methods, with detailed step-by-step accounts of the
procedures needed to obtain the highest quality images of atoms and molecules
using a modern
ТЕМ
or STEM electron microscope. Applications include the
semiconductor industry, superconductor research, solid state chemistry and
nanoscience, and metallurgy, the earth sciences, condensed matter physics,
materials science, and cryo-electron microscopy for structural biology. New
or expanded sections have been added on electron holography, aberration
correction, field-emission guns, imaging filters, super-resolution methods,
ptychography, Ronchigrams, tomography, image quantification and simulation,
radiation damage, the measurement of electron-optical parameters, and detect¬
ors
(CCD
cameras, image plates, and direct-injection solid state detectors). The
theory of scanning transmission electron microscopy (STEM) and Z-contrast are
treated comprehensively. Chapters are devoted to associated techniques, such
as energy-loss spectroscopy, ALCHEMI, nanodiffraction, environmental
ТЕМ,
twisty beams for magnetic imaging, and cathodoluminescence. Sources
of software for image interpretation and electron-optical design are given.
is Regent s Professor of Physics at Arizona State University.
Each section is extensively referenced and there are several useful
appendices
. . .
overall this is an excellent book that meets and exceeds the
author s aims and contains a wealth of information on high resolution electron
microscopy
. . .
the book is written in a relaxed style, which makes it
suitable for beginning and experienced users alike.
Microscopy and Analysis
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668632
|
| any_adam_object | 1 |
| author | Spence, John C. H. |
| author_GND | (DE-588)141845260 |
| author_facet | Spence, John C. H. |
| author_role | aut |
| author_sort | Spence, John C. H. |
| author_variant | j c h s jch jchs |
| building | Verbundindex |
| bvnumber | BV041147249 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)862350923 (DE-599)BVBBV041147249 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| edition | 4. ed. |
| format | Book |
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| id | DE-604.BV041147249 |
| illustrated | Illustrated |
| indexdate | 2025-02-03T17:41:49Z |
| institution | BVB |
| isbn | 9780199668632 9780198795834 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-026122776 |
| oclc_num | 862350923 |
| open_access_boolean | |
| owner | DE-11 DE-703 DE-20 DE-19 DE-BY-UBM DE-29T DE-355 DE-BY-UBR |
| owner_facet | DE-11 DE-703 DE-20 DE-19 DE-BY-UBM DE-29T DE-355 DE-BY-UBR |
| physical | XIX, 406 S. Ill., graph. Darst. |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| spellingShingle | Spence, John C. H. High-resolution electron microscopy Festkörper (DE-588)4016918-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenbeugung (DE-588)4151862-7 gnd Struktur (DE-588)4058125-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4016918-2 (DE-588)4215608-7 (DE-588)4287503-1 (DE-588)4151862-7 (DE-588)4058125-1 (DE-588)4014327-2 |
| title | High-resolution electron microscopy |
| title_auth | High-resolution electron microscopy |
| title_exact_search | High-resolution electron microscopy |
| title_full | High-resolution electron microscopy John C. H. Spence |
| title_fullStr | High-resolution electron microscopy John C. H. Spence |
| title_full_unstemmed | High-resolution electron microscopy John C. H. Spence |
| title_short | High-resolution electron microscopy |
| title_sort | high resolution electron microscopy |
| topic | Festkörper (DE-588)4016918-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenbeugung (DE-588)4151862-7 gnd Struktur (DE-588)4058125-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Festkörper Durchstrahlungselektronenmikroskopie Hochauflösendes Verfahren Elektronenbeugung Struktur Elektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026122776&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026122776&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT spencejohnch highresolutionelectronmicroscopy |