Nanometer variation-tolerant SRAM circuits and statistical design for yield
<p>Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption a...
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York, NY [u.a.]
Springer
2013
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| Schlagworte: | |
| Online-Zugang: | DE-634 DE-Aug4 DE-573 DE-92 DE-898 DE-859 DE-863 DE-706 Volltext Inhaltsverzeichnis Abstract |
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