Recurrent events data analysis for product repairs, disease recurrences, and other applications
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| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Philadelphia, Pa.
Society for Industrial and Applied Mathematics (SIAM, 3600 Market Street, Floor 6, Philadelphia, PA 19104)
2003
|
| Schriftenreihe: | ASA-SIAM series on statistics and applied probability
10 |
| Schlagworte: | |
| Online-Zugang: | DE-91 DE-20 DE-706 DE-29 Volltext |
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MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV039747080 | ||
| 003 | DE-604 | ||
| 005 | 20210426 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 111207s2003 sz a||| o|||| 00||| eng d | ||
| 010 | |a 2002030864 | ||
| 020 | |a 0898715229 |c print |9 0898715229 | ||
| 020 | |a 9780898715224 |c print |9 9780898715224 | ||
| 020 | |z 9780898718454 |c electronic bk. |9 9780898718454 | ||
| 024 | 7 | |a 10.1137/1.9780898718454 |2 doi | |
| 035 | |a (OCoLC)775728569 | ||
| 035 | |a (DE-599)BVBBV039747080 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a sz |c XA-CH | ||
| 049 | |a DE-91 |a DE-29 |a DE-706 |a DE-83 |a DE-20 | ||
| 084 | |a SK 850 |0 (DE-625)143263: |2 rvk | ||
| 100 | 1 | |a Nelson, Wayne |d 1936- |0 (DE-588)131346490 |4 aut | |
| 245 | 1 | 0 | |a Recurrent events data analysis for product repairs, disease recurrences, and other applications |c Wayne B. Nelson |
| 264 | 1 | |a Philadelphia, Pa. |b Society for Industrial and Applied Mathematics (SIAM, 3600 Market Street, Floor 6, Philadelphia, PA 19104) |c 2003 | |
| 300 | |a 1 Online-Ressource (xi, 151 Seiten) |b Illustrationen | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 1 | |a ASA-SIAM series on statistics and applied probability |v 10 | |
| 650 | 4 | |a Failure time data analysis | |
| 650 | 4 | |a Survival analysis (Biometry) | |
| 650 | 0 | 7 | |a Lebensdauer |0 (DE-588)4034837-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Statistische Analyse |0 (DE-588)4116599-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Lebensdauer |0 (DE-588)4034837-4 |D s |
| 689 | 0 | 1 | |a Statistische Analyse |0 (DE-588)4116599-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 710 | 2 | |a Society for Industrial and Applied Mathematics |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 0898715229 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 9780898715224 |
| 830 | 0 | |a ASA-SIAM series on statistics and applied probability |v 10 |w (DE-604)BV047230102 |9 10 | |
| 856 | 4 | 0 | |u https://doi.org/10.1137/1.9780898718454 |x Verlag |3 Volltext |
| 912 | |a ZDB-72-SIA | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-024594611 | |
| 966 | e | |u https://doi.org/10.1137/1.9780898718454 |l DE-91 |p ZDB-72-SIA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1137/1.9780898718454 |l DE-20 |p ZDB-72-SIA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1137/1.9780898718454 |l DE-706 |p ZDB-72-SIA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1137/1.9780898718454 |l DE-29 |p ZDB-72-SIA |x Verlag |3 Volltext | |
Datensatz im Suchindex
| DE-BY-TUM_katkey | 1805591 |
|---|---|
| _version_ | 1820867779383787520 |
| any_adam_object | |
| author | Nelson, Wayne 1936- |
| author_GND | (DE-588)131346490 |
| author_facet | Nelson, Wayne 1936- |
| author_role | aut |
| author_sort | Nelson, Wayne 1936- |
| author_variant | w n wn |
| building | Verbundindex |
| bvnumber | BV039747080 |
| classification_rvk | SK 850 |
| collection | ZDB-72-SIA |
| ctrlnum | (OCoLC)775728569 (DE-599)BVBBV039747080 |
| discipline | Mathematik |
| doi_str_mv | 10.1137/1.9780898718454 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02409nam a2200541zcb4500</leader><controlfield tag="001">BV039747080</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20210426 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">111207s2003 sz a||| o|||| 00||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2002030864</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0898715229</subfield><subfield code="c">print</subfield><subfield code="9">0898715229</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780898715224</subfield><subfield code="c">print</subfield><subfield code="9">9780898715224</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9780898718454</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">9780898718454</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1137/1.9780898718454</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)775728569</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV039747080</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">sz</subfield><subfield code="c">XA-CH</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">SK 850</subfield><subfield code="0">(DE-625)143263:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Nelson, Wayne</subfield><subfield code="d">1936-</subfield><subfield code="0">(DE-588)131346490</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Recurrent events data analysis for product repairs, disease recurrences, and other applications</subfield><subfield code="c">Wayne B. Nelson</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Philadelphia, Pa.</subfield><subfield code="b">Society for Industrial and Applied Mathematics (SIAM, 3600 Market Street, Floor 6, Philadelphia, PA 19104)</subfield><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xi, 151 Seiten)</subfield><subfield code="b">Illustrationen</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">ASA-SIAM series on statistics and applied probability</subfield><subfield code="v">10</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Failure time data analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Survival analysis (Biometry)</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Lebensdauer</subfield><subfield code="0">(DE-588)4034837-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Statistische Analyse</subfield><subfield code="0">(DE-588)4116599-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Lebensdauer</subfield><subfield code="0">(DE-588)4034837-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Statistische Analyse</subfield><subfield code="0">(DE-588)4116599-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Society for Industrial and Applied Mathematics</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">0898715229</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">9780898715224</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">ASA-SIAM series on statistics and applied probability</subfield><subfield code="v">10</subfield><subfield code="w">(DE-604)BV047230102</subfield><subfield code="9">10</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1137/1.9780898718454</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-72-SIA</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-024594611</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1137/1.9780898718454</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-72-SIA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1137/1.9780898718454</subfield><subfield code="l">DE-20</subfield><subfield code="p">ZDB-72-SIA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1137/1.9780898718454</subfield><subfield code="l">DE-706</subfield><subfield code="p">ZDB-72-SIA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1137/1.9780898718454</subfield><subfield code="l">DE-29</subfield><subfield code="p">ZDB-72-SIA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV039747080 |
| illustrated | Illustrated |
| indexdate | 2024-12-24T02:28:11Z |
| institution | BVB |
| isbn | 0898715229 9780898715224 |
| language | English |
| lccn | 2002030864 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024594611 |
| oclc_num | 775728569 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29 DE-706 DE-83 DE-20 |
| owner_facet | DE-91 DE-BY-TUM DE-29 DE-706 DE-83 DE-20 |
| physical | 1 Online-Ressource (xi, 151 Seiten) Illustrationen |
| psigel | ZDB-72-SIA |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Society for Industrial and Applied Mathematics (SIAM, 3600 Market Street, Floor 6, Philadelphia, PA 19104) |
| record_format | marc |
| series | ASA-SIAM series on statistics and applied probability |
| series2 | ASA-SIAM series on statistics and applied probability |
| spellingShingle | Nelson, Wayne 1936- Recurrent events data analysis for product repairs, disease recurrences, and other applications ASA-SIAM series on statistics and applied probability Failure time data analysis Survival analysis (Biometry) Lebensdauer (DE-588)4034837-4 gnd Statistische Analyse (DE-588)4116599-8 gnd |
| subject_GND | (DE-588)4034837-4 (DE-588)4116599-8 |
| title | Recurrent events data analysis for product repairs, disease recurrences, and other applications |
| title_auth | Recurrent events data analysis for product repairs, disease recurrences, and other applications |
| title_exact_search | Recurrent events data analysis for product repairs, disease recurrences, and other applications |
| title_full | Recurrent events data analysis for product repairs, disease recurrences, and other applications Wayne B. Nelson |
| title_fullStr | Recurrent events data analysis for product repairs, disease recurrences, and other applications Wayne B. Nelson |
| title_full_unstemmed | Recurrent events data analysis for product repairs, disease recurrences, and other applications Wayne B. Nelson |
| title_short | Recurrent events data analysis for product repairs, disease recurrences, and other applications |
| title_sort | recurrent events data analysis for product repairs disease recurrences and other applications |
| topic | Failure time data analysis Survival analysis (Biometry) Lebensdauer (DE-588)4034837-4 gnd Statistische Analyse (DE-588)4116599-8 gnd |
| topic_facet | Failure time data analysis Survival analysis (Biometry) Lebensdauer Statistische Analyse |
| url | https://doi.org/10.1137/1.9780898718454 |
| volume_link | (DE-604)BV047230102 |
| work_keys_str_mv | AT nelsonwayne recurrenteventsdataanalysisforproductrepairsdiseaserecurrencesandotherapplications AT societyforindustrialandappliedmathematics recurrenteventsdataanalysisforproductrepairsdiseaserecurrencesandotherapplications |