Trap level spectroscopy in amorphous semiconductors
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2010
|
| Ausgabe: | 1st ed. |
| Schriftenreihe: | Elsevier insights
|
| Schlagworte: | |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV036703344 | ||
| 003 | DE-604 | ||
| 005 | 20110617 | ||
| 007 | t| | ||
| 008 | 101005s2010 xx d||| |||| 00||| eng d | ||
| 015 | |a GBB045319 |2 dnb | ||
| 020 | |z 9780123847157 (hbk.) |9 978-0-12-384715-7 (hbk.) | ||
| 020 | |z 012384715X (hbk.) |9 0-12-38471-5X (hbk.) | ||
| 035 | |a (OCoLC)567148516 | ||
| 035 | |a (DE-599)BVBBV036703344 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-11 | ||
| 082 | 0 | |a 537.6223 |2 22 | |
| 084 | |a UP 3160 |0 (DE-625)146378: |2 rvk | ||
| 100 | 1 | |a Mikla, Victor I. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Trap level spectroscopy in amorphous semiconductors |c Viktor I. Mikla and Victor V. Mikla |
| 250 | |a 1st ed. | ||
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 2010 | |
| 300 | |a VI, 120 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Elsevier insights | |
| 500 | |a Includes bibliographical references | ||
| 650 | 4 | |a Amorphous semiconductors / Spectra | |
| 650 | 4 | |a Amorphous semiconductors / Defects / Analysis | |
| 650 | 4 | |a Deep level transient spectroscopy | |
| 700 | 1 | |a Mikla, Victor V. |e Sonstige |4 oth | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-020621723 | |
Datensatz im Suchindex
| _version_ | 1819278395765161986 |
|---|---|
| any_adam_object | |
| author | Mikla, Victor I. |
| author_facet | Mikla, Victor I. |
| author_role | aut |
| author_sort | Mikla, Victor I. |
| author_variant | v i m vi vim |
| building | Verbundindex |
| bvnumber | BV036703344 |
| classification_rvk | UP 3160 |
| ctrlnum | (OCoLC)567148516 (DE-599)BVBBV036703344 |
| dewey-full | 537.6223 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6223 |
| dewey-search | 537.6223 |
| dewey-sort | 3537.6223 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| edition | 1st ed. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01250nam a2200385 c 4500</leader><controlfield tag="001">BV036703344</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20110617 </controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">101005s2010 xx d||| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBB045319</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9780123847157 (hbk.)</subfield><subfield code="9">978-0-12-384715-7 (hbk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">012384715X (hbk.)</subfield><subfield code="9">0-12-38471-5X (hbk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)567148516</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV036703344</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.6223</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 3160</subfield><subfield code="0">(DE-625)146378:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Mikla, Victor I.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Trap level spectroscopy in amorphous semiconductors</subfield><subfield code="c">Viktor I. Mikla and Victor V. Mikla</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 120 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Elsevier insights</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Amorphous semiconductors / Spectra</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Amorphous semiconductors / Defects / Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Deep level transient spectroscopy</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mikla, Victor V.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-020621723</subfield></datafield></record></collection> |
| id | DE-604.BV036703344 |
| illustrated | Illustrated |
| indexdate | 2024-12-24T00:11:20Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020621723 |
| oclc_num | 567148516 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | VI, 120 S. graph. Darst. |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Elsevier insights |
| spelling | Mikla, Victor I. Verfasser aut Trap level spectroscopy in amorphous semiconductors Viktor I. Mikla and Victor V. Mikla 1st ed. Amsterdam [u.a.] Elsevier 2010 VI, 120 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Elsevier insights Includes bibliographical references Amorphous semiconductors / Spectra Amorphous semiconductors / Defects / Analysis Deep level transient spectroscopy Mikla, Victor V. Sonstige oth |
| spellingShingle | Mikla, Victor I. Trap level spectroscopy in amorphous semiconductors Amorphous semiconductors / Spectra Amorphous semiconductors / Defects / Analysis Deep level transient spectroscopy |
| title | Trap level spectroscopy in amorphous semiconductors |
| title_auth | Trap level spectroscopy in amorphous semiconductors |
| title_exact_search | Trap level spectroscopy in amorphous semiconductors |
| title_full | Trap level spectroscopy in amorphous semiconductors Viktor I. Mikla and Victor V. Mikla |
| title_fullStr | Trap level spectroscopy in amorphous semiconductors Viktor I. Mikla and Victor V. Mikla |
| title_full_unstemmed | Trap level spectroscopy in amorphous semiconductors Viktor I. Mikla and Victor V. Mikla |
| title_short | Trap level spectroscopy in amorphous semiconductors |
| title_sort | trap level spectroscopy in amorphous semiconductors |
| topic | Amorphous semiconductors / Spectra Amorphous semiconductors / Defects / Analysis Deep level transient spectroscopy |
| topic_facet | Amorphous semiconductors / Spectra Amorphous semiconductors / Defects / Analysis Deep level transient spectroscopy |
| work_keys_str_mv | AT miklavictori traplevelspectroscopyinamorphoussemiconductors AT miklavictorv traplevelspectroscopyinamorphoussemiconductors |