Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK

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Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Berlin [u.a.] Springer 2005
Schriftenreihe:	Springer Proceedings in Physics 107
Schlagworte:	Electronics Materials Particles (Nuclear physics) Weights and measures Halbleiter Mikroskopie Konferenzschrift > 2005 > Oxford
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genre	(DE-588)1071861417 Konferenzschrift 2005 Oxford gnd-content
genre_facet	Konferenzschrift 2005 Oxford
id	DE-604.BV036650697
illustrated	Not Illustrated
index_date	2024-09-19T15:27:00Z
indexdate	2024-11-25T17:37:10Z
institution	BVB
isbn	9783540319153
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-020570210
oclc_num	315815277
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owner	DE-526 DE-522 DE-634 DE-2070s DE-210 DE-155 DE-BY-UBR DE-150 DE-70 DE-22 DE-BY-UBG DE-54 DE-128 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-898 DE-BY-UBR DE-92 DE-M347 DE-859 DE-573 DE-1028 DE-1050 DE-858 DE-1102 DE-1046 DE-1047 DE-Aug4 DE-706 DE-20 DE-739 DE-355 DE-BY-UBR DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-29 DE-703 DE-473 DE-BY-UBG DE-384 DE-12 DE-860 DE-B768 DE-523
owner_facet	DE-526 DE-522 DE-634 DE-2070s DE-210 DE-155 DE-BY-UBR DE-150 DE-70 DE-22 DE-BY-UBG DE-54 DE-128 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-898 DE-BY-UBR DE-92 DE-M347 DE-859 DE-573 DE-1028 DE-1050 DE-858 DE-1102 DE-1046 DE-1047 DE-Aug4 DE-706 DE-20 DE-739 DE-355 DE-BY-UBR DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-29 DE-703 DE-473 DE-BY-UBG DE-384 DE-12 DE-860 DE-B768 DE-523
physical	1 Online-Ressource
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publishDate	2005
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publisher	Springer
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series	Springer Proceedings in Physics
series2	Springer Proceedings in Physics
spellingShingle	Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK Springer Proceedings in Physics Electronics Materials Particles (Nuclear physics) Weights and measures Halbleiter (DE-588)4022993-2 gnd Mikroskopie (DE-588)4039238-7 gnd
subject_GND	(DE-588)4022993-2 (DE-588)4039238-7 (DE-588)1071861417
title	Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK
title_auth	Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK
title_exact_search	Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK
title_full	Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK A. G. Cullis ; J. L. Hutchison (Eds.)
title_fullStr	Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK A. G. Cullis ; J. L. Hutchison (Eds.)
title_full_unstemmed	Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK A. G. Cullis ; J. L. Hutchison (Eds.)
title_short	Microscopy of Semiconducting Materials
title_sort	microscopy of semiconducting materials proceedings of the 14th conference april 11 14 2005 oxford uk
title_sub	Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK
topic	Electronics Materials Particles (Nuclear physics) Weights and measures Halbleiter (DE-588)4022993-2 gnd Mikroskopie (DE-588)4039238-7 gnd
topic_facet	Electronics Materials Particles (Nuclear physics) Weights and measures Halbleiter Mikroskopie Konferenzschrift 2005 Oxford
url	https://doi.org/10.1007/3-540-31915-8
volume_link	(DE-604)BV041207043
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Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK

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