Micro and nano mechanical testing of materials and devices
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer
2008
|
| Ausgabe: | 1. ed. |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV035369972 | ||
| 003 | DE-604 | ||
| 005 | 20090817 | ||
| 007 | t| | ||
| 008 | 090316s2008 gw ad|| |||| 00||| eng d | ||
| 015 | |a 08,N10,0781 |2 dnb | ||
| 016 | 7 | |a 98756515X |2 DE-101 | |
| 020 | |a 9780387787008 |c Gb. |9 978-0-387-78700-8 | ||
| 024 | 3 | |a 9780387787008 | |
| 028 | 5 | 2 | |a 11971023 |
| 035 | |a (OCoLC)214306579 | ||
| 035 | |a (DE-599)DNB98756515X | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BE | ||
| 049 | |a DE-703 | ||
| 050 | 0 | |a TK7875 | |
| 082 | 0 | |a 621.381 |2 22 | |
| 084 | |a VE 9850 |0 (DE-625)147163:253 |2 rvk | ||
| 084 | |a 670 |2 sdnb | ||
| 245 | 1 | 0 | |a Micro and nano mechanical testing of materials and devices |c Fuqian Yang ... ed. |
| 250 | |a 1. ed. | ||
| 264 | 1 | |a New York, NY |b Springer |c 2008 | |
| 300 | |a XIII, 387 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Härteeindruck |2 swd | |
| 650 | 7 | |a MEMS |2 swd | |
| 650 | 7 | |a Mechanische Eigenschaft |2 swd | |
| 650 | 7 | |a Nanoelektromechanik |2 swd | |
| 650 | 7 | |a Nanometerbereich |2 swd | |
| 650 | 7 | |a Nanostruktur |2 swd | |
| 650 | 7 | |a Werkstoffprüfung |2 swd | |
| 650 | 7 | |a Zuverlässigkeit |2 swd | |
| 650 | 4 | |a Materials |x Testing | |
| 650 | 4 | |a Microelectromechanical systems |x Testing | |
| 650 | 4 | |a Nanoelectromechanical systems |x Testing | |
| 700 | 1 | |a Yang, Fuqian |4 edt | |
| 856 | 4 | 2 | |m Digitalisierung UB Bayreuth |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017173877&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-017173877 | |
Datensatz im Suchindex
| _version_ | 1819785203076300800 |
|---|---|
| adam_text | Contents
Foreword
..........................................................
v
1
Principles and Applications of Indentation
...................... 1
Mototsugu Sakai
2
Size Effects in Nanoindentation
................................ 49
Xue Feng, Yonggang Huang, and Keh-chih Hwang
3
Indentation in Shape Memory Alloys
........................... 71
Yang-Tse Cheng and David S. Grummon
4
Adhesive Contact of Solid Surfaces
............................. 87
Fuqian Yang
5
Nanomechanical Characterization of One-Dimensional
Nanostructures
............................................. 105
Yousheng Zhang, Eunice Phay Shing Tan, Chorng Haur Sow,
and Chwee
Teck
Lim
6
Deformation Behavior of Nanoporous Metals
.................... 121
Juergen Biener, Andrea M. Hodge, and Alex V. Hamza
7
Residual Stress Determination Using Nanoindentation Technique
... 139
Zhi-Hui Xu and Xiaodong Li
8
Piezoelectric Response in the Contact Deformation of Piezoelectric
Materials
.................................................. 155
Fuqian Yang
9
Mechanics of Carbon Nanotubes and Their Composites
........... 179
Liang Chi Zhang
10
Microbridge
Tests
...........................................215
Tong-Yi Zhang
χ
Contents
11 Nanoscale
Testing
of One-Dimensional Nanostructures
............287
Bei Peng,
Yugang Sun,Yong Zhu, Hsien-Hau Wang,
and
Horacio
Dante
Espinosa
12
Metrologies for Mechanical Response of Micro- and Nanoscale
Systems
....................................................313
Robert R. Keller, Donna C. Hurley, David T. Read, and Paul Rice
13
Mechanical Characterization of Low-Dimensional Structures
Through On-Chip Tests
......................................349
Alberto Corigliano,
Fabrizio
Cacchione,
and Sarah
Zerbini
Index
.............................................................385
|
| any_adam_object | 1 |
| author2 | Yang, Fuqian |
| author2_role | edt |
| author2_variant | f y fy |
| author_facet | Yang, Fuqian |
| building | Verbundindex |
| bvnumber | BV035369972 |
| callnumber-first | T - Technology |
| callnumber-label | TK7875 |
| callnumber-raw | TK7875 |
| callnumber-search | TK7875 |
| callnumber-sort | TK 47875 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | VE 9850 |
| ctrlnum | (OCoLC)214306579 (DE-599)DNB98756515X |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. ed. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01735nam a2200517 c 4500</leader><controlfield tag="001">BV035369972</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090817 </controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">090316s2008 gw ad|| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">08,N10,0781</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">98756515X</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780387787008</subfield><subfield code="c">Gb.</subfield><subfield code="9">978-0-387-78700-8</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9780387787008</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">11971023</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)214306579</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DNB98756515X</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7875</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VE 9850</subfield><subfield code="0">(DE-625)147163:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">670</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Micro and nano mechanical testing of materials and devices</subfield><subfield code="c">Fuqian Yang ... ed.</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Springer</subfield><subfield code="c">2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 387 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Härteeindruck</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">MEMS</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Mechanische Eigenschaft</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Nanoelektromechanik</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Nanometerbereich</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Nanostruktur</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Werkstoffprüfung</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectromechanical systems</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanoelectromechanical systems</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yang, Fuqian</subfield><subfield code="4">edt</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Bayreuth</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017173877&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-017173877</subfield></datafield></record></collection> |
| id | DE-604.BV035369972 |
| illustrated | Illustrated |
| indexdate | 2024-12-23T21:27:47Z |
| institution | BVB |
| isbn | 9780387787008 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017173877 |
| oclc_num | 214306579 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | XIII, 387 S. Ill., graph. Darst. |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Springer |
| record_format | marc |
| spellingShingle | Micro and nano mechanical testing of materials and devices Härteeindruck swd MEMS swd Mechanische Eigenschaft swd Nanoelektromechanik swd Nanometerbereich swd Nanostruktur swd Werkstoffprüfung swd Zuverlässigkeit swd Materials Testing Microelectromechanical systems Testing Nanoelectromechanical systems Testing |
| title | Micro and nano mechanical testing of materials and devices |
| title_auth | Micro and nano mechanical testing of materials and devices |
| title_exact_search | Micro and nano mechanical testing of materials and devices |
| title_full | Micro and nano mechanical testing of materials and devices Fuqian Yang ... ed. |
| title_fullStr | Micro and nano mechanical testing of materials and devices Fuqian Yang ... ed. |
| title_full_unstemmed | Micro and nano mechanical testing of materials and devices Fuqian Yang ... ed. |
| title_short | Micro and nano mechanical testing of materials and devices |
| title_sort | micro and nano mechanical testing of materials and devices |
| topic | Härteeindruck swd MEMS swd Mechanische Eigenschaft swd Nanoelektromechanik swd Nanometerbereich swd Nanostruktur swd Werkstoffprüfung swd Zuverlässigkeit swd Materials Testing Microelectromechanical systems Testing Nanoelectromechanical systems Testing |
| topic_facet | Härteeindruck MEMS Mechanische Eigenschaft Nanoelektromechanik Nanometerbereich Nanostruktur Werkstoffprüfung Zuverlässigkeit Materials Testing Microelectromechanical systems Testing Nanoelectromechanical systems Testing |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017173877&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT yangfuqian microandnanomechanicaltestingofmaterialsanddevices |