Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California
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| Format: | Elektronisch Tagungsbericht Software E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
[Piscataway, NJ]
IEEE
2008
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| Schlagworte: | |
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MARC
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Datensatz im Suchindex
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| id | DE-604.BV035230125 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:29:07Z |
| institution | BVB |
| institution_GND | (DE-588)16008090-3 |
| isbn | 9781424424030 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017036090 |
| oclc_num | 634485368 |
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| owner | DE-29T |
| owner_facet | DE-29T |
| physical | 1 CD-ROM 12 cm |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | IEEE |
| record_format | marc |
| spelling | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week [Piscataway, NJ] IEEE 2008 1 CD-ROM 12 cm c rdamedia cd rdacarrier Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2008 Santa Clara Calif. gnd-content (DE-588)4139307-7 CD-ROM gnd-carrier Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 International Test Conference 2008 Santa Clara, Calif. Sonstige (DE-588)16008090-3 oth |
| spellingShingle | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)1071861417 (DE-588)4139307-7 |
| title | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_auth | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_exact_search | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_full | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_fullStr | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_full_unstemmed | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_short | Conference proceedings |
| title_sort | conference proceedings oct 26 31 2008 santa clara california |
| title_sub | Oct. 26 - 31, 2008, Santa Clara, California |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Prüftechnik Konferenzschrift 2008 Santa Clara Calif. CD-ROM |
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