Data mining and diagnosing IC fails
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer
2005
|
| Schriftenreihe: | Frontiers in electronic testing
31 |
| Schlagworte: | |
| Online-Zugang: | Inhaltstext |
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MARC
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Datensatz im Suchindex
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| discipline_str_mv | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
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| index_date | 2024-07-02T21:54:25Z |
| indexdate | 2024-07-09T21:20:56Z |
| institution | BVB |
| isbn | 0387249931 9780387249933 |
| language | English |
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| publishDate | 2005 |
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| publisher | Springer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Huisman, Leendert M. Verfasser aut Data mining and diagnosing IC fails Leendert M. Huisman New York, NY Springer 2005 270 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 31 Data mining Integrated circuits Testing Statistical methods Semiconductors Failures Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Data Mining (DE-588)4428654-5 gnd rswk-swf Funktionstest (DE-588)4155698-7 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Funktionstest (DE-588)4155698-7 s Fehlererkennung (DE-588)4133764-5 s Data Mining (DE-588)4428654-5 s DE-604 Frontiers in electronic testing 31 (DE-604)BV010836129 31 text/html http://deposit.dnb.de/cgi-bin/dokserv?id=2739380&prov=M&dok_var=1&dok_ext=htm Inhaltstext |
| spellingShingle | Huisman, Leendert M. Data mining and diagnosing IC fails Frontiers in electronic testing Data mining Integrated circuits Testing Statistical methods Semiconductors Failures Integrierte Schaltung (DE-588)4027242-4 gnd Fehlererkennung (DE-588)4133764-5 gnd Data Mining (DE-588)4428654-5 gnd Funktionstest (DE-588)4155698-7 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4133764-5 (DE-588)4428654-5 (DE-588)4155698-7 |
| title | Data mining and diagnosing IC fails |
| title_auth | Data mining and diagnosing IC fails |
| title_exact_search | Data mining and diagnosing IC fails |
| title_exact_search_txtP | Data mining and diagnosing IC fails |
| title_full | Data mining and diagnosing IC fails Leendert M. Huisman |
| title_fullStr | Data mining and diagnosing IC fails Leendert M. Huisman |
| title_full_unstemmed | Data mining and diagnosing IC fails Leendert M. Huisman |
| title_short | Data mining and diagnosing IC fails |
| title_sort | data mining and diagnosing ic fails |
| topic | Data mining Integrated circuits Testing Statistical methods Semiconductors Failures Integrierte Schaltung (DE-588)4027242-4 gnd Fehlererkennung (DE-588)4133764-5 gnd Data Mining (DE-588)4428654-5 gnd Funktionstest (DE-588)4155698-7 gnd |
| topic_facet | Data mining Integrated circuits Testing Statistical methods Semiconductors Failures Integrierte Schaltung Fehlererkennung Data Mining Funktionstest |
| url | http://deposit.dnb.de/cgi-bin/dokserv?id=2739380&prov=M&dok_var=1&dok_ext=htm |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT huismanleendertm datamininganddiagnosingicfails |