Scanning microscopy for nanotechnology techniques and applications
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2006
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245 | 1 | 0 | |a Scanning microscopy for nanotechnology |b techniques and applications |c ed. by Weilie Zhou ... |
264 | 1 | |a New York, NY |b Springer |c 2006 | |
300 | |a XIV, 522 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
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650 | 4 | |a Nanotechnology | |
650 | 4 | |a Scanning electron microscopy | |
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700 | 1 | |a Zhou, Weilie |e Sonstige |4 oth | |
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Datensatz im Suchindex
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adam_text | SCANNING MICROSCOPY FOR NANOTECHNOLOGY TECHNIQUES AND APPLICATIONS
EDITED BY WEILIE ZHOU UNIVERSITY OF NEW ORLEANS NEW ORLEANS, LOUISIANA
AND ZHONG LIN WANG GEORGIA INSTITUTE OF TECHNOLOGY ATFANTA, GEORGIA ~
SPRINGER* CONTENTS* 1.* FUNDAMENTALS OF SCANNING ELECTRON* MICROSCOPY
(SEM). . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 1*
WEILIE ZHOU, ROBERT APKARIAN, ZHONG LIN WANG, AND* DAVIDJOY* I.*
INTRODUCTION . 2.* CONFIGURATION OF SCANNING ELECTRON MICROSCOPES . . .
. . . . . . . . .. 9* 3.* SAMPIE PREPARATION 32* 4.* SUMMARY 39* 2.*
BACKSCATTERING DETECTOR AND EBSD IN NANOMATERIALS* CHARACTERIZATION 41*
TIM MAITLAND AND SCOTT SITZMAN* 1.* INTRODUCTION 41* 2.* DATA
MEASUREMENT. 51* 3.* DATA ANALYSIS 54* 4.* APPLICATIONS 61* 5.* CURRENT
LIMITATIONS AND FUTURE 74* 6.* CONCLUSION 75* 3. X-RAY MICROANALYSIS IN
NANOMATERIALS* 76* ROBERT ANDERHALT 1.* INTRODUCTION 76* 2.* MONTE CARLO
MODELING OF NANOMATERIALS 87* 3.* CASE STUDIES 91* 4.* SUMMARY 100* XII
CONTENTS 4. LOW KV SCANNING ELECTRON MICROSCOPY* 101* M. DAVID FREY 1.
INTRODUCTION* 101* 2.* ELECTRON GENERATION AND ACCELERATING VOLTAGE 103*
3.* WHY USE LOW KV? 105* 4.* USING LOW KV 112* 5.* CONCLUSION 119* 5.*
E-BEAM NANOLITHOGRAPHY INTEGRATED WITH SCANNING* ELECTRON MICROSEOPE
120* JOE NABITY, LESELY ANGLIN COMPBELL, MO ZHU, AND* WEILIE ZHOU* 1.
INTRODUCTION* 120* 2.* MATERIALS AND PROCESSING PREPARATION 127* 3.*
PATTERN GENERATION. . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . 132* 4.* PATTERN PROCESSING . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . 137* 5.* APPLICATIONS 143*
6.* SUMMARY 148* 6.* SCANNING TRANSMISSION ELECTRON MICROSCOPY FOR*
NANOSTRUCTURE CHARACTERIZATION 152* S. J. PENNYCOOK, A. R. LUPINI, M.
VARELA, A. BORISEVICH, Y. PENG, M. P. OXLEY, K. VAN BENTHEM, M. F.
CHISHOLM 1. INTRODUCTION* 152* 2.* IMAGING IN THE STEM 155* 3.*
SPECTROSCOPIC IMAGING 173* 4.* THREE-DIMENSIONAL IMAGING 176* 5.* RECENT
APPLICATIONS TO NANOSTRUCTURE CHARACTERIZATION 177* 6.* FUTURE
DIRECTIONS 188* 7.* INTRODUCTION TO IN-SITU NANOMANIPULATION FOR*
NANOMATERIALS ENGINEERING 192* RISHI GUPTA AND RICHARD E. STALLCUP, 11*
1. INTRODUCTION* 192* 2.* SEM CONTAMINATION 193* 3. TYPES OF
NANOMANIPULATORS* 197* 4.* END EFFECTORS 200* 5.* APPLICATIONS OF
NANOMANIPULATORS 205* 6.* SUMMARY 223* CONTENTS XIII 8.* APPLICATIONS OF
FIS AND DUALSEAM FOR* NANOFABRICATION . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . .. 225* BRANDON VAN LEER, LUCILLE A. GIANNUZZI,
AND* PAUL ANZALONE* 1. INTRODUCTION* 225* 2. ONBOARD DIGITAL PATTEMING
WITH THE ION BEAM* 226* 3. FM MILLING OR CVD DEPOSITION WITH BITMAP
FILES 230* 4. ONBOARD DIGITAL PATTEMING WITH THE ELECTRON BEAM 231* 5.*
AUTOMATION FOR NANOMETER CONTROL 233* 6. DIRECT FABRICATION OF NANOSCALE
STRUCTURES* 234* 7.* SUMMARY 234* 9. NANOWIRES AND CARBON NANOTUBES*
237* JIANYE LI AND JIE LIU 1. INTRODUCTION* 237* 2. III-V COMPOUND
SEMICONDUCTORS NANOWIRES* 237* 3. LI-VI COMPOUND SEMICONDUCTORS
NANOWIRES* 250* 4.* EIEMENTAL NANOWIRES 260* 5. CARBON NANOTUBES* 267*
6. CONCLUSIONS* 278* 10.* PHOTONIE CRYSTALS AND DEVICES 281* XUDONG WANG
AND ZHONG LIN WANG I. INTRODUCTION* 281* 2. SEM IMAGING OF PHOTONIE
CRYSTALS* 289* 3. FABRICATION OF PHOTONIE CRYSTALS IN SEM* 298* 4.*
SUMMARY 302* 11.* NANOPARTICLES AND COLLOIDAL SELF-ASSEMBLY 306* GABRIEL
CARUNTU, DANIELA CA RUNTU, AND* CHARLES J. Q CONNOR* 1. INTRODUCTION*
306* 2. METAL NANOPARTICLES* 307* 3.* MESOPOROUS AND NANOPOROUS METAL
NANOSTRUCTURES 322* 4.* NANOCRYSTALLINE OXIDE 329* 5.* NANOSTRUCTURED
SEMICONDUCTOR AND THERMOELECTRIC MATERIALS 347* 6.* CONCLUSIONS 353* XIV
CONTENTS 12.* NANO-BUILDING BLOCKS FABRICATED THROUGH TEMPLATES ....
357* FENG LI AND JOHN B. WILEY* 1. INTRODUCTION* 357* 2. MATERIALS AND
METHODS* 358* 3. NANO-BUILDING BLOCKS* 361* 4. CONCLUSIONS* 380* 13.*
ONE-DIMENSIONAL WURTZITE SEMICONDUCTING* NANOSTRUCTURES 384* PU XIAN GAO
AND ZHONG LIN WANG 1. INTRODUCTION* 384* 2. SYNTHESIS AND FABRICATION OF
ID NANOSTRUCTURES 384* 3. ONE-DIMENSIONAL METAL OXIDE NANOSTRUCTURES*
389* 4. GROWTH MECHANISMS* 414* 5. SUMMARY* 423* 14.* BIO-INSPIRED
NANOMATERIALS 427* PENG WANG, GUOBAO WEI, XIAOHUA LIU, AND PETER X. MA
1. INTRODUCTION* 427* 2. NANOFIBERS* 429* 3. NANOPARTICLES* 444* 4.
SURFACE MODIFICATION* 455* 5. SUMMARY* 462* 15.* CRYO-TEMPERATURE STAGES
IN NANOSTRUCTURAL* RESEARCH 467* ROBERT P. APKARIAN 1. INTRODUCTION*
467* 2. TERRNINOLOGY USED IN CRYO-HRSEM OF AQUEOUS SYSTEMS 468* 3.
LIQUID WATER, ICE, AND VITRIFIED WATER* 469* 4. HISTORY OF LOW
TEMPERATURE SEM* 472* 5. INSTRUMENTATION AND METHODS* 473* AUTHOR INDEX*
491* SUBJECT INDEX* 513*
|
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ctrlnum | (OCoLC)255526576 (DE-599)BVBBV022460214 |
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dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik Technik |
format | Book |
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id | DE-604.BV022460214 |
illustrated | Illustrated |
indexdate | 2024-12-23T20:05:47Z |
institution | BVB |
isbn | 0387333258 9780387333250 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015667907 |
oclc_num | 255526576 |
open_access_boolean | |
owner | DE-703 DE-20 DE-91G DE-BY-TUM |
owner_facet | DE-703 DE-20 DE-91G DE-BY-TUM |
physical | XIV, 522 S. Ill., graph. Darst. |
publishDate | 2006 |
publishDateSearch | 2006 |
publishDateSort | 2006 |
publisher | Springer |
record_format | marc |
spellingShingle | Scanning microscopy for nanotechnology techniques and applications Nanotechnology Scanning electron microscopy Nanotechnologie (DE-588)4327470-5 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
subject_GND | (DE-588)4327470-5 (DE-588)4048455-5 |
title | Scanning microscopy for nanotechnology techniques and applications |
title_auth | Scanning microscopy for nanotechnology techniques and applications |
title_exact_search | Scanning microscopy for nanotechnology techniques and applications |
title_full | Scanning microscopy for nanotechnology techniques and applications ed. by Weilie Zhou ... |
title_fullStr | Scanning microscopy for nanotechnology techniques and applications ed. by Weilie Zhou ... |
title_full_unstemmed | Scanning microscopy for nanotechnology techniques and applications ed. by Weilie Zhou ... |
title_short | Scanning microscopy for nanotechnology |
title_sort | scanning microscopy for nanotechnology techniques and applications |
title_sub | techniques and applications |
topic | Nanotechnology Scanning electron microscopy Nanotechnologie (DE-588)4327470-5 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
topic_facet | Nanotechnology Scanning electron microscopy Nanotechnologie Rasterelektronenmikroskopie |
url | http://deposit.dnb.de/cgi-bin/dokserv?id=2784081&prov=M&dok_var=1&dok_ext=htm http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=015667907&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT zhouweilie scanningmicroscopyfornanotechnologytechniquesandapplications |