Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
SPIE
1969
|
| Schriftenreihe: | Proceedings / Society of Photo-optical Instrumentation Engineers
18 |
| Schlagworte: | |
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Datensatz im Suchindex
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| building | Verbundindex |
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| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV022031457 |
| illustrated | Illustrated |
| indexdate | 2024-12-23T19:51:42Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015246112 |
| oclc_num | 635333330 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | VIII, 225 S. Ill. |
| publishDate | 1969 |
| publishDateSearch | 1969 |
| publishDateSort | 1969 |
| publisher | SPIE |
| record_format | marc |
| series2 | Proceedings / Society of Photo-optical Instrumentation Engineers |
| spelling | Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY SPIE 1969 VIII, 225 S. Ill. txt rdacontent n rdamedia nc rdacarrier Proceedings / Society of Photo-optical Instrumentation Engineers 18 Mustererkennung (DE-588)4040936-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Mustererkennung (DE-588)4040936-3 s DE-604 Society of Photo-optical Instrumentation Engineers Proceedings 18 (DE-604)BV021847917 |
| spellingShingle | Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY Mustererkennung (DE-588)4040936-3 gnd |
| subject_GND | (DE-588)4040936-3 (DE-588)1071861417 |
| title | Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY |
| title_auth | Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY |
| title_exact_search | Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY |
| title_full | Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY |
| title_fullStr | Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY |
| title_full_unstemmed | Pattern recognition studies Seminar-in-depth, June 9 - 10, 1969, New York, NY |
| title_short | Pattern recognition studies |
| title_sort | pattern recognition studies seminar in depth june 9 10 1969 new york ny |
| title_sub | Seminar-in-depth, June 9 - 10, 1969, New York, NY |
| topic | Mustererkennung (DE-588)4040936-3 gnd |
| topic_facet | Mustererkennung Konferenzschrift |
| volume_link | (DE-604)BV021847917 |