Secondary ion mass spectrometry 4 Osaka, Japan, Nov. 13-19, 1983
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| Format: | Tagungsbericht Buch |
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| Sprache: | English |
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| Schriftenreihe: | Springer series in chemical physics
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Datensatz im Suchindex
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| id | DE-604.BV022027459 |
| illustrated | Illustrated |
| indexdate | 2024-12-23T19:51:38Z |
| institution | BVB |
| institution_GND | (DE-588)244977-8 |
| isbn | 354013316X 038713316X |
| language | English |
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| physical | XV, 503 S. Ill |
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| publisher | Springer |
| record_format | marc |
| series | Springer series in chemical physics |
| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry 4 Osaka, Japan, Nov. 13-19, 1983 ed.: A. Benninghoven ... Berlin [u.a.] Springer XV, 503 S. Ill txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 36 Springer series in chemical physics ... Benninghoven, Alfred Sonstige oth SIMS Sonstige (DE-588)244977-8 oth (DE-604)BV022124762 4 Springer series in chemical physics ... (DE-604)BV000000670 |
| spellingShingle | Secondary ion mass spectrometry Springer series in chemical physics |
| title | Secondary ion mass spectrometry |
| title_auth | Secondary ion mass spectrometry |
| title_exact_search | Secondary ion mass spectrometry |
| title_full | Secondary ion mass spectrometry 4 Osaka, Japan, Nov. 13-19, 1983 ed.: A. Benninghoven ... |
| title_fullStr | Secondary ion mass spectrometry 4 Osaka, Japan, Nov. 13-19, 1983 ed.: A. Benninghoven ... |
| title_full_unstemmed | Secondary ion mass spectrometry 4 Osaka, Japan, Nov. 13-19, 1983 ed.: A. Benninghoven ... |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry osaka japan nov 13 19 1983 |
| volume_link | (DE-604)BV022124762 (DE-604)BV000000670 |
| work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometry4 AT sims secondaryionmassspectrometry4 |