Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California
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|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
2003
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| Ausgabe: | 1. print. |
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Datensatz im Suchindex
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| author_facet | ISTFA Santa Clara, Calif |
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| ctrlnum | (OCoLC)249504887 (DE-599)BVBBV019778989 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. print. |
| format | Conference Proceeding Book |
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| genre_facet | Konferenzschrift 2003 Santa Clara Calif. |
| id | DE-604.BV019778989 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T20:05:55Z |
| institution | BVB |
| institution_GND | (DE-588)10105725-8 |
| isbn | 0871707888 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-013104986 |
| oclc_num | 249504887 |
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| owner_facet | DE-1050 |
| physical | XVIII, 518 S. Ill., graph. Darst. 1 CD-ROM (12 cm) |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | ASM International |
| record_format | marc |
| spelling | ISTFA 29 2003 Santa Clara, Calif. Verfasser (DE-588)10105725-8 aut Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California Conference proceedings from the 29th International Symposium for Testing and Failure Analysis ISTFA 2003 1. print. Materials Park, Ohio ASM International 2003 XVIII, 518 S. Ill., graph. Darst. 1 CD-ROM (12 cm) txt rdacontent n rdamedia nc rdacarrier Prüftechnik (DE-588)4047610-8 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2003 Santa Clara Calif. gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 |
| spellingShingle | Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4014346-6 (DE-588)1071861417 |
| title | Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California |
| title_alt | Conference proceedings from the 29th International Symposium for Testing and Failure Analysis ISTFA 2003 |
| title_auth | Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California |
| title_exact_search | Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California |
| title_full | Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California |
| title_fullStr | Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California |
| title_full_unstemmed | Proceedings of the 29th International Symposium for Testing and Failure Analysis 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California |
| title_short | Proceedings of the 29th International Symposium for Testing and Failure Analysis |
| title_sort | proceedings of the 29th international symposium for testing and failure analysis 2 6 november 2003 santa clara convention center santa clara california |
| title_sub | 2 - 6 November 2003, Santa Clara Convention Center, Santa Clara, California |
| topic | Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| topic_facet | Prüftechnik Elektronik Konferenzschrift 2003 Santa Clara Calif. |
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