Fundamentals of powder diffraction and structural characterization of materials
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| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston
Kluwer
2003
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MARC
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|---|---|---|---|
| 001 | BV017073708 | ||
| 003 | DE-604 | ||
| 005 | 20201211 | ||
| 007 | t | ||
| 008 | 030415s2003 xxua||| |||| 00||| eng d | ||
| 010 | |a 2003050112 | ||
| 020 | |a 1402073658 |c acidfree paper |9 1-402-07365-8 | ||
| 035 | |a (OCoLC)52001703 | ||
| 035 | |a (DE-599)BVBBV017073708 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-703 |a DE-11 |a DE-19 | ||
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| 100 | 1 | |a Pecharsky, Vitalij K. |d 1954- |e Verfasser |0 (DE-588)1139474723 |4 aut | |
| 245 | 1 | 0 | |a Fundamentals of powder diffraction and structural characterization of materials |c by Vitalij K. Pecharsky, Peter Y. Zavalij |
| 264 | 1 | |a Boston |b Kluwer |c 2003 | |
| 300 | |a XXIII, 713 S. |b Ill. |e 1 CD-ROM (12 cm) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Powders |x Optical properties |x Measurement | |
| 650 | 4 | |a X-ray crystallography | |
| 650 | 4 | |a X-rays |x Diffraction |x Measurement | |
| 650 | 0 | 7 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Pulvermethode |0 (DE-588)4176353-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kristallstrukturanalyse |0 (DE-588)4137204-9 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Kristallstrukturanalyse |0 (DE-588)4137204-9 |D s |
| 689 | 0 | 1 | |a Pulvermethode |0 (DE-588)4176353-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |D s |
| 689 | 1 | 1 | |a Pulvermethode |0 (DE-588)4176353-1 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Zavalij, Peter Y. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-010300464 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804129961872719872 |
|---|---|
| any_adam_object | |
| author | Pecharsky, Vitalij K. 1954- Zavalij, Peter Y. |
| author_GND | (DE-588)1139474723 |
| author_facet | Pecharsky, Vitalij K. 1954- Zavalij, Peter Y. |
| author_role | aut aut |
| author_sort | Pecharsky, Vitalij K. 1954- |
| author_variant | v k p vk vkp p y z py pyz |
| building | Verbundindex |
| bvnumber | BV017073708 |
| callnumber-first | Q - Science |
| callnumber-label | QC482 |
| callnumber-raw | QC482.D5 |
| callnumber-search | QC482.D5 |
| callnumber-sort | QC 3482 D5 |
| callnumber-subject | QC - Physics |
| classification_rvk | UQ 5400 VG 9900 |
| ctrlnum | (OCoLC)52001703 (DE-599)BVBBV017073708 |
| dewey-full | 548/.83 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548/.83 |
| dewey-search | 548/.83 |
| dewey-sort | 3548 283 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV017073708 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:13:28Z |
| institution | BVB |
| isbn | 1402073658 |
| language | English |
| lccn | 2003050112 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010300464 |
| oclc_num | 52001703 |
| open_access_boolean | |
| owner | DE-703 DE-11 DE-19 DE-BY-UBM |
| owner_facet | DE-703 DE-11 DE-19 DE-BY-UBM |
| physical | XXIII, 713 S. Ill. 1 CD-ROM (12 cm) |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Kluwer |
| record_format | marc |
| spelling | Pecharsky, Vitalij K. 1954- Verfasser (DE-588)1139474723 aut Fundamentals of powder diffraction and structural characterization of materials by Vitalij K. Pecharsky, Peter Y. Zavalij Boston Kluwer 2003 XXIII, 713 S. Ill. 1 CD-ROM (12 cm) txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references and index Powders Optical properties Measurement X-ray crystallography X-rays Diffraction Measurement Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Pulvermethode (DE-588)4176353-1 gnd rswk-swf Kristallstrukturanalyse (DE-588)4137204-9 gnd rswk-swf Kristallstrukturanalyse (DE-588)4137204-9 s Pulvermethode (DE-588)4176353-1 s DE-604 Röntgenstrukturanalyse (DE-588)4137203-7 s 1\p DE-604 Zavalij, Peter Y. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Pecharsky, Vitalij K. 1954- Zavalij, Peter Y. Fundamentals of powder diffraction and structural characterization of materials Powders Optical properties Measurement X-ray crystallography X-rays Diffraction Measurement Röntgenstrukturanalyse (DE-588)4137203-7 gnd Pulvermethode (DE-588)4176353-1 gnd Kristallstrukturanalyse (DE-588)4137204-9 gnd |
| subject_GND | (DE-588)4137203-7 (DE-588)4176353-1 (DE-588)4137204-9 |
| title | Fundamentals of powder diffraction and structural characterization of materials |
| title_auth | Fundamentals of powder diffraction and structural characterization of materials |
| title_exact_search | Fundamentals of powder diffraction and structural characterization of materials |
| title_full | Fundamentals of powder diffraction and structural characterization of materials by Vitalij K. Pecharsky, Peter Y. Zavalij |
| title_fullStr | Fundamentals of powder diffraction and structural characterization of materials by Vitalij K. Pecharsky, Peter Y. Zavalij |
| title_full_unstemmed | Fundamentals of powder diffraction and structural characterization of materials by Vitalij K. Pecharsky, Peter Y. Zavalij |
| title_short | Fundamentals of powder diffraction and structural characterization of materials |
| title_sort | fundamentals of powder diffraction and structural characterization of materials |
| topic | Powders Optical properties Measurement X-ray crystallography X-rays Diffraction Measurement Röntgenstrukturanalyse (DE-588)4137203-7 gnd Pulvermethode (DE-588)4176353-1 gnd Kristallstrukturanalyse (DE-588)4137204-9 gnd |
| topic_facet | Powders Optical properties Measurement X-ray crystallography X-rays Diffraction Measurement Röntgenstrukturanalyse Pulvermethode Kristallstrukturanalyse |
| work_keys_str_mv | AT pecharskyvitalijk fundamentalsofpowderdiffractionandstructuralcharacterizationofmaterials AT zavalijpetery fundamentalsofpowderdiffractionandstructuralcharacterizationofmaterials |