Advanced materials 2000 future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000
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| 245 | 1 | 0 | |a Advanced materials 2000 |b future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 |c [ed. by Y. Bando ...] |
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Datensatz im Suchindex
| DE-BY-TUM_call_number | 0702/WER 400f 07.2002 B 1086 |
|---|---|
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| DE-BY-TUM_media_number | 040070853448 |
| _version_ | 1816712179048513537 |
| adam_text | CONTENTS
Nanotubulites ...............................................................................................................1
S. Iijima
School of
Science and Engineering, Meijo
University, JST/ICORP Nonotubulites project,
NEC R&D Group
Electron Energy-Loss Spectroscopy (EELS) on Nanotubes
...................................................3
C. Collier, M. Kodak , E.
Sandre ,
О.
Stephan ,
К.
Suenaga3 and M. Tencé
Laboratoire de Physique des Solides, Université Paris-Sud, laboratoire Aimé
Cotton,
Université
Paris-Sud, 3JST Nanotubulites Project, Meijo
University
HRTEM
and EELS of
Multi-
and Single-Walled Nanotubes in the B-C-N System
.....................5
D. Golberg, Y.
Bando,
L.
Bourgeois,
К.
Kurashima,
W.
Han and
T. Sato
National
Institute for
Research
in Inorganic Materials
Disclinations in Boron Nitride and Carbon
........................................................................7
L. Bourgeois, Y.
Bando, W.
Q.
Han,
К.
Kurashima
and T. Sato
National
Institute for Research in Inorganic Materials
High Spatial Resolution Analyses of Valence Loss Spectra at the Surface of Nanotubes
...............9
K. Suenaga ·2, S. Iijima ·3·4, M. Kodak2, O.
Stephan2
and
С
Collier
JST, 2LPS and
LAC, Université Paris-Sud, 3NEC
Corporation, 4Meijo University
Production of Carbon Nanotubes via Catalytic Chemical Vapour Deposition (CCVD)
Technique
..................................................................................................................11
K. Mukhopadhyay
,
M. Kanai , A. Koshio , T.
Sugai ,
S. Bandow2,
N.
Tanaka3 and H. Shinohara
Department of Chemistry, Nagoya University, 2Japan Science and Technology Corporation, c/o
Department of Physics, Meijo University, department of Applied Physics, Nagoya University
Emission of Electrons and Ions from Carbon Nanofibers under High Electric Field
..................13
Y.
Saito
Department of Electrical and Electronic Engineering,
Mie
University
Atomic Resolution Electronic Structure in Semiconductors
...................................................15
P. E. Batson
IBM Thomas J. Watson Research Center
High Energy-Resolution EELS Microscope and Its Application
.............................................17
M. Terauchi and M. Tanaka
Research Institute for Scientific Measurements, Tohoku University
Elemental and Chemical Shift Analysis by Spatially-Resolved EELS
.......................................19
K. Kimoto , Y. Matsui and T. Aoyama2
National Institute for Research in Inorganic Materials, Hitachi Research Laboratory, Hitachi Ltd.
Quantitative Compositional Mapping with EFTEM: Applications to Advanced Materials
.........21
F. Hofer, G. Kothleitner, W. Grogger and P. Warbichler
Research Institute for Electron Microscopy,
Graz
University of Technology
Spectrum-Imaging of Inhomogeneous Nanostructures in Ion Implanted Materials
..................23
H.
Kuráta,
H.
Abe and
К.
Hojou
Department of Materials Science, Japan Atomic Energy Research Institute
Quantitative Analysis of Diffuse Scattering by Energy-Filtered
ТЕМ
....................................25
D.
Shindo,
Y
Murakami and Y. Ikematsu
Institute for Advanced Materials Processing, Tohoku University
New Observation Method of Local Structures by Convergent Beam Illumination
.....................27
M. Mitome
National Institute for Research in Inorganic Materials
UHV
-
Electron Microscope Observation of Nanoscale Materials: Wires and Dots
.....................29
K. Takayanagi , Y. Ohshima , H. Ohnishi2 and Y. Kondo2
Tokyo Institute of Technology, 2ERATO, Japan Science and Technology
co. op.
In-situ Observation of Solid-Liquid Interfaces4
..................................................................31
H. Saka
Department of Quantum Engineering, Nagoya University
The Stability of Nanostructured Inert Gas Precipitates in Aluminum under Ion and Electron
Irradiation
......................................................................................................·...........33
K. Furuya, M. Song and K. Mitsuishi
National Research Institute for Metals
In-situ Observation of Alloying Process in Nm-Sized Particles
.............................................35
H. Mori and H. Yasuda
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University
Atomic-Resolution Z-Contrast Imaging: Application to Interface Science
..............................37
S. J. Pennycook and G. Duscher2
Solid State Division, Oak Ridge National Laboratory, department of Physics and Astronomy,
Vanderbilt University
Atomie
Resolution
ТЕМ
Analysis of Grain Boundaries in Covalent Bonding Materials
............39
H. Ichinose, H. Sawada and E. Takuma
Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University
of Tokyo
Nanoscale Polar and Chemical Nanodomains in Dielectric Relaxors
.......................................41
L. A. Bursill
School of Physics, The University of Melbourne
Dynamical Behavior of Diffusing Atoms at Metal/Metal Interface under Electron Irradiation
· · · 43
H. Takahashi, S. Ohta and T. Shibayama
Center for Advanced Research of Energy Technology, Hokkaido University
Real-Time Observation of Individual Vortices in High-Tc Superconductors
by
Lorentz
Microscopy
...................................................................................................45
A. Tonomura
Advanced Research Laboratory, Hitachi, Ltd., CREST, Japan Science and Technology Corporation
Observation of the Interaction of Vortices with Dislocations in a Nb Superconductor by Cryo-
Lorentz Electron Microscopy
..........................................................................................47
M.
Cantoni1,
S. Horiuchŕ,
M. Uchida2,
С.
Tsuruta2 and Y.
Matsui2
Centre
Interdépartemental
de Microscopie
Electronique,
EPFL-CIME, 2National Institute for
Research in
Inorganic
Materials
The Stage for the Vortices to Play Peak Effect in the Jc Property of
High
-Гс
Superconductors: A
Novel
ТЕМ
Approach
...................................................................................................49
H. Suematsu , T. Akao , S. Lee1, S. Nagaya2, K. Kurashima3, Y.
Bando3
and
H. Yamauchi
Materials and Structures Laboratory, Tokyo Institute of Technology, 2Chubu Electric Power Co.,
3National Institute of Research in Inorganic Materials
Relations between Structure, Charge Ordering and CMR Properties in the
Lni.xCaxMnO3
Manganites
..................................................................................................................51
M. Hervieu,
С
Martin, A. Maignan and B. Raveau
Laboratoire CRISMAT-ISMRA et Université de
Caen
Charge-Ordered Phase and Ordering Dynamics in Cr-Doped Perovskite Manganese Oxides
Studied by
ТЕМ
............................................................................................................53
S.
Mori ,
R.
Shoji1,
N.
Yamamoto and Y. Moritomo2
Tokyo Institute of Technology, 2CIRSE, Nagoya University
New Type of Charge- and Orbital-Order Structure in
Pri.xCaxMnO3
Studied by Low-Temperature
ТЕМ
...........................................................................................................................55
T.
Asaka1 2,
S.
Tsutsumi2,
S.
Yantada3,
T.
Arima3,
С.
Tsuruta ,
К.
Kimoto and Y. Matsui1
National Institute for Research in Inorganic Materials, 2Dept. of
Min. Res.
Eng., Waseda
University, institute of Materials Sciences, University of Tsukuba
iu
Cs-Corrected STEM
......................................................................................................57
N.
Dęliby , O. L.
Křivánek
and A. R.
Lupini2
Nion Co., Cavendish Laboratory, University of Cambridge
With the Correction of Spherical Aberration for
а ТЕМ
towards
Sub-Ångstrom
Point Resolution
............................................................................................................59
M. Haider
CEOS GmbH
Development of a New STEM
..........................................................................................61
S. Isakozawa , T. Hashimoto , S.
Taya ,
H.
Тапака , К.
Kaji2
and T. Aoyama2
instruments, Hitachi, Ltd., Hitachi Research
Lab.,
Hitachi, Ltd.
HAADF-STEM of Unperiodic Systems with Z-Contrast -Amorphous Materials, Quasicrystals and
Disordered Alloys-
.........................................................................................................63
N.
Tanaka
Department of Applied Physics, Nagoya University
Real-Time
Defocus
Image Modulation Processing Electron Microscope
.................................65
Y
Takai , H. Utsuro1, T. Kawasaki ,
Y
Kimura , T. Ikuta2, R. Shimizu
Department of Material and Life Science, Osaka University, 2Osaka Electro-Communication
University
Atomic Scale Analysis of Surface Structures
.....................................................................67
L. D. Marks
Department of Materials Science and Engineering, Northwestern University
iv
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| indexdate | 2024-11-25T17:19:56Z |
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| spellingShingle | Advanced materials 2000 future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 Elektronenmikroskopie (DE-588)4014327-2 gnd Hochleistungswerkstoff (DE-588)4312250-4 gnd Nanostruktur (DE-588)4204530-7 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4312250-4 (DE-588)4204530-7 (DE-588)1071861417 |
| title | Advanced materials 2000 future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 |
| title_auth | Advanced materials 2000 future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 |
| title_exact_search | Advanced materials 2000 future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 |
| title_full | Advanced materials 2000 future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 [ed. by Y. Bando ...] |
| title_fullStr | Advanced materials 2000 future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 [ed. by Y. Bando ...] |
| title_full_unstemmed | Advanced materials 2000 future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 [ed. by Y. Bando ...] |
| title_short | Advanced materials 2000 |
| title_sort | advanced materials 2000 future and present of electron microscopy new methods and applications in advanced materials proceedings of the 7th nirim international symposium on advanced materials isam 2000 february 29 march 3 2000 |
| title_sub | future and present of electron microscopy: new methods and applications in advanced materials ; proceedings of the 7th NIRIM International Symposium on Advanced Materials (ISAM 2000), February 29 - March 3, 2000 |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Hochleistungswerkstoff (DE-588)4312250-4 gnd Nanostruktur (DE-588)4204530-7 gnd |
| topic_facet | Elektronenmikroskopie Hochleistungswerkstoff Nanostruktur Konferenzschrift 2000 Hayama |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009949718&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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