Deterministic built-in self-test with guaranteed test quality and low overhead
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| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Düsseldorf
VDI-Verl.
2002
|
| Ausgabe: | Als Ms. gedr. |
| Schriftenreihe: | Fortschritt-Berichte VDI
Reihe 20, Rechnerunterstützte Verfahren ; 347 |
| Schlagworte: | |
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MARC
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| 490 | 1 | |a Fortschritt-Berichte VDI : Reihe 20, Rechnerunterstützte Verfahren |v 347 | |
| 490 | 0 | |a Berichte der GI-GMM-ITG-Kooperationsgemeinschaft rechnergestützer Schaltungs- und Systementwurf | |
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Datensatz im Suchindex
| DE-BY-TUM_call_number | 0701 65 B 276 |
|---|---|
| DE-BY-TUM_katkey | 1286772 |
| DE-BY-TUM_location | Mag |
| DE-BY-TUM_media_number | 040070878867 |
| _version_ | 1820881898570776576 |
| any_adam_object | |
| author | Kiefer, Gundolf |
| author_facet | Kiefer, Gundolf |
| author_role | aut |
| author_sort | Kiefer, Gundolf |
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| building | Verbundindex |
| bvnumber | BV014582519 |
| ctrlnum | (OCoLC)248108867 (DE-599)BVBBV014582519 |
| edition | Als Ms. gedr. |
| format | Thesis Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV014582519 |
| illustrated | Illustrated |
| indexdate | 2024-12-23T15:57:46Z |
| institution | BVB |
| isbn | 3183347202 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009913529 |
| oclc_num | 248108867 |
| open_access_boolean | |
| owner | DE-91G DE-BY-TUM DE-210 DE-83 DE-634 |
| owner_facet | DE-91G DE-BY-TUM DE-210 DE-83 DE-634 |
| physical | X, 127 S. graph. Darst. |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | VDI-Verl. |
| record_format | marc |
| series | Fortschritt-Berichte VDI |
| series2 | Fortschritt-Berichte VDI : Reihe 20, Rechnerunterstützte Verfahren Berichte der GI-GMM-ITG-Kooperationsgemeinschaft rechnergestützer Schaltungs- und Systementwurf |
| spellingShingle | Kiefer, Gundolf Deterministic built-in self-test with guaranteed test quality and low overhead Fortschritt-Berichte VDI Built-in self test (DE-588)4516486-1 gnd Testmustergenerator (DE-588)4210166-9 gnd Logiksynthese (DE-588)4348178-4 gnd |
| subject_GND | (DE-588)4516486-1 (DE-588)4210166-9 (DE-588)4348178-4 (DE-588)4113937-9 |
| title | Deterministic built-in self-test with guaranteed test quality and low overhead |
| title_auth | Deterministic built-in self-test with guaranteed test quality and low overhead |
| title_exact_search | Deterministic built-in self-test with guaranteed test quality and low overhead |
| title_full | Deterministic built-in self-test with guaranteed test quality and low overhead Gundolf Kiefer, Aachen |
| title_fullStr | Deterministic built-in self-test with guaranteed test quality and low overhead Gundolf Kiefer, Aachen |
| title_full_unstemmed | Deterministic built-in self-test with guaranteed test quality and low overhead Gundolf Kiefer, Aachen |
| title_short | Deterministic built-in self-test with guaranteed test quality and low overhead |
| title_sort | deterministic built in self test with guaranteed test quality and low overhead |
| topic | Built-in self test (DE-588)4516486-1 gnd Testmustergenerator (DE-588)4210166-9 gnd Logiksynthese (DE-588)4348178-4 gnd |
| topic_facet | Built-in self test Testmustergenerator Logiksynthese Hochschulschrift |
| volume_link | (DE-604)BV021786833 |
| work_keys_str_mv | AT kiefergundolf deterministicbuiltinselftestwithguaranteedtestqualityandlowoverhead |