Progress in transmission electron microscopy 1 Concepts and techniques
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| Sprache: | English |
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Berlin [u.a.]
Springer
2001
[Beijing] Tsinghua Univ. Press 2001 |
| Schriftenreihe: | Springer series in surface sciences
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| 264 | 1 | |a [Beijing] |b Tsinghua Univ. Press |c 2001 | |
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Datensatz im Suchindex
| _version_ | 1819726017598586880 |
|---|---|
| adam_text | XIAO-FENG ZHANG ZE ZHANG (EDS.) PROGRESS IN TRANSMISSION ELECTRON
MICROSCOPY 1 CONCEPTS AND TECHNIQUES WITH 169 FIGURES AND 13 TABLES
SPRINGER CONTENTS 1 THE MODERN MICROSCOPE TODAY.... 1 1.1 INTRODUCTION 1
1.2 MICROSCOPE DEVELOPMENT 1 1.3 THE MODERN MICROSCOPE 2 1.3.1
INTRODUCTION 3 1.3.2 ELECTRON OPTICS: LENSES 5 1.3.3 ELECTRON OPTICS:
MICROSCOPE 10 1.3.4 VACUUM SYSTEM 17 1.3.5 IMAGE ACQUISITION 21 1.3.6
ENERGY FILTERING 27 1.4 MICROSCOPES IN THE FUTURE 30 1.4.1
MONOCHROMATORS: IMPROVING THE ENERGY SPREAD 31 1.4.2 C S CORRECTORS:
IMPROVING THE SPHERICAL ABERRATION COEFFICIENT 32 1.4.3 COMPUTER
CONTROL: AUTOMATED AND REMOTE OPERATION 32 REFERENCES 34 2 THE QUEST FOR
ULTRA-HIGH RESOLUTION 35 2.1 INTRODUCTION 35 2.2 IMAGING CONCEPTS 39 2.3
TEM, STEM AND DIFFRACTION MODES 47 2.3.1 TEM MODE 47 2.3.2 STEM MODE 48
2.3.3 DIFFRACTION MODES 52 2.4 THE USE OF ULTRA-HIGH VOLTAGES 53 2.5 THE
CORRECTION OF ABERRATIONS 55 2.6 ELECTRON HOLOGRAPHY 58 2.6.1 IN-LINE
STEM AND TEM ELECTRON HOLOGRAPHY 58 2.6.2 OFF-AXIS ELECTRON HOLOGRAPHY
62 2.7 COMBINATIONS OF ELECTRON DIFFRACTION AND IMAGING: PTYCHOGRAPHY 65
2.8 ATOMIC FOCUSERS 69 2.9 DISCUSSION 74 REFERENCES 77 VIII 3 Z-CONTRAST
IMAGING IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE 81 3.1
INTRODUCTION 81 3.2 PRINCIPLES OF THE METHOD 84 3.2.1 FORMATION OF AN
INCOHERENT IMAGE 84 3.2.2 PROBE FORMATION 86 3.2.3 INCOHERENT SCATTERING
89 3.2.4 DYNAMICAL DIFFRACTION 92 3.3 ADVANTAGES OF Z-CONTRAST IMAGING
96 3.3.1 IMPROVED RESOLUTION 96 3.3.2 DIRECTLY INTERPRETABLE IMAGE 99
3.3.3 HIGH COMPOSITIONAL SENSITIVITY 100 3.3.4 SIMULTANEOUS CONVENTIONAL
HREM IMAGE 103 3.3.5 ATOMIC RESOLUTION SPECTROSCOPY 105 3.4 PROBLEMS 107
APPENDIX: INCOHERENT IMAGING OF WEAKLY SCATTERING OBJECTS 108 REFERENCES
109 4 INELASTIC SCATTERING IN ELECTRON MICROSCOPY-EFFECTS, SPECTROMETRY
AND IMAGING 113 4.1 INELASTIC EXCITATION PROCESSES IN ELECTRON
SCATTERING 113 4.2 PHONON SCATTERING 117 4.3 EFFECTS OF INELASTIC
EXCITATIONS ON ELASTIC WAVE 119 4.3.1 THE DEBYE-WALLER FACTOR 119 4.3.2
THE ABSORPTION POTENTIAL 120 4.4 SIGNAL FROM THERMAL DIFFUSE SCATTERING
120 4.4.1 FORMATION OF Z-CONTRAST IMAGING 120 4.4.2 THE FROZEN LATTICE
MODEL FOR PHONON SCATTERING 122 4.4.3 EFFECTS ON ELECTRON HOLOGRAPHY 124
4.4.4 EFFECT ON ATOMIC-RESOLUTION LATTICE IMAGING 127 4.5 SIGNAL FROM
PLASMON EXCITATION 130 4.5.1 VOLUME PLASMON EXCITATION 131 4.5.2 SURFACE
EXCITATION IN NANOPARTICLES 132 4.6 ATOMIC INNER SHELL EXCITATION 134
4.6.1 COMPOSITION MICROANALYSIS 134 4.6.2 NEAR EDGE FINE STRUCTURE AND
BONDING IN CRYSTALS 135 4.6.3 WHITE LINES AND THE OCCUPATION NUMBER OF
THE D-BAND ELECTRONS 136 4.6.4 QUANTIFYING OXYGEN DEFICIENCY IN OXIDES
139 4.7 ENERGY FILTERED ELECTRON IMAGING 140 4.7.1 COMPOSITION-SENSITIVE
IMAGING USING VALENCE-LOSS ELECTRONS 142 IX 4.7.2 COMPOSITION-SENSITIVE
IMAGING USING INNER-SHELL - LONIZATION EDGES 144 4.7.3 MAPPING THE
BONDING AND VALENCE STATE USING FINE EDGE STRUCTURES 146 4.8 DYNAMIC
DIFFRACTION THEORY OF DIFFUSELY SCATTERED ELECTRONS 148 4.8.1 THE FIRST
ORDER DIFFUSE SCATTERING THEORY 149 4.8.2 HIGH ORDER DIFFUSE SCATTERING
THEORY 151 4.8.3 WHAT IS 1 MISSING IN CONVENTIONAL CALCULATION? 154 4.9
SUMMARY 156 REFERENCES 157 5 QUANTITATIVE ANALYSIS OF HIGH-RESOLUTION
ATOMIC IMAGES 161 5.1 INTRODUCTION 161 5.2 QUANTITATIVE GEOMETRY
ANALYSES OF HREM IMAGES 164 5.2.1 ATOMIC IMAGE SEGMENTATION 165 5.2.2
METHODS FOR BRIGHT SPOTS LOCALIZATION IN AN ATOMIC IMAGE 169 5.2.3
LATTICE DISPLACEMENT MEASUREMENT 170 5.3 QUANTITATIVE CONTRAST ANALYSIS
OF HREM IMAGES 171 5.3.1 R-FACTOR 172 5.3.2 CORRELATION COEFFICIENT 172
5.3.3 NORMALIZED EUCLIDEAN DISTANCE (NED) 172 5.3.4 CROSS-CORRELATION
FACTOR (XCF) 173 5.3.5 NORMALIZED INNER PRODUCT (NIP) 173 5.3.6
NORMALIZED QUADRATIC DIFFERENCE (NQD) 173 5.3.7 NORMALIZED IMAGE CROSS
CORRELATION FUNCTION 173 5.3.8 VECTOR PATTERN CORRELATION 174 5.3.9
^-CRITERION 174 5.4 DEFECTIVE STRUCTURE DETERMINATION BY THE
QUANTITATIVE ANALYSIS OF ATOMIC IMAGES 174 5.4.1 INTRODUCTION 174 5.4.2
NON-LINEAR LEAST-SQUARE ALGORITHM 175 5.4.3 THE J 2 FITTING ALGORITHM
176 5.4.4 GENERAL STRATEGIES 177 5.5 DETECTING CHANGES IN THE CHEMICAL
COMPOSITION BY QUANTITATIVE ATOMIC IMAGE ANALYSIS 178 5.5.1 CHEMICAL
LATTICE IMAGING OF MATERIALS 178 5.5.2 VECTOR PATTERN CORRELATION METHOD
180 5.5.3 THE DE-CONVOLUTION AND DIFFERENCE-CONVOLUTION METHODS 181
5.5.4 T-C METHOD 183 5.5.5 FOURIER COEFFICIENT METHOD 183 5.5.6
QUANTITEM METHOD 185 5.6 LIMITATION AND FUTURE DEVELOPMENT 187
REFERENCES : 189 6 ELECTRON CRYSTALLOGRAPHY-STRUCTURE DETERMINATION BY
COMBINING HREM, CRYSTALLOGRAPHIC IMAGE PROCESSING AND ELECTRON
DIFFRACTION 191 6.1 INTRODUCTION 191 6.2 FUNDAMENTAL ELECTRON
CRYSTALLOGRAPHY 192 6.2.1 CRYSTAL STRUCTURE, CRYSTAL POTENTIAL AND
STRUCTURE FACTORS 193 6.2.2 CRYSTALLOGRAPHIC STRUCTURE FACTOR PHASES =
ATOM POSITIONS 196 6.3 SOLVING CRYSTAL STRUCTURES FROM HREM IMAGES BY
CRYSTALLOGRAPHIC IMAGE PROCESSING 200 6.3.1 RELATION BETWEEN HREM IMAGES
AND THE PROJECTED CRYSTAL POTENTIAL FOR WEAK-PHASE-OBJECTS 200 6.3.2
RECORDING AND QUANTIFYING HREM IMAGES FOR STRUCTURE DETERMINATION 202
6.3.3 EXTRACTING CRYSTALLOGRAPHIC AMPLITUDES AND PHASES 203 6.3.4
DETERMINING AND COMPENSATING FOR DEFOCUS AND ASTIGMATISM 205 6.3.5
DETERMINING THE PROJECTED SYMMETRY 208 6.3.6 COMPENSATING FOR CRYSTAL
TILT 210 6.4 SOLVING CRYSTAL STRUCTURES FROM SAED PATTERNS BY DIRECT
METHODS 212 6.4.1 INTRODUCTION TO DIRECT METHODS 212 6.4.2 RECORDING AND
DIGITIZING SAED PATTERNS FOR STRUCTURE DETERMINATION 213 6.4.3
APPLICATION OF DIRECT METHODS ON ELECTRON DIFFRACTION DATA 214 6.5
REFINING CRYSTAL STRUCTURES 216 6.5.1 INTRODUCTION TO STRUCTURE
REFINEMENT 216 6.5.2 REFINING STRUCTURE AGAINST SAED INTENSITIES 216
6.5.3 REFINING STRUCTURE AGAINST X-RAY POWDER DIFFRACTION INTENSITIES
219 6.6 3D ELECTRON CRYSTALLOGRAPHY 219 6.7 CONCLUSIONS 220 REFERENCES
220 XI 7 ELECTRON AMORPHOGRAPHY 223 7.1 INTRODUCTION 223 7.2 THEORETICAL
BACKGROUND 225 7.2.1 RADIAL DISTRIBUTION FUNCTIONS 225 7.2.2 DEBYE
FORMULA 227 7.2.3 EXPERIMENTAL RDFS 228 7.2.4 MODIFICATION FUNCTIONS 231
7.3 EXAMPLES OF APPLICATION 232 7.3.1 SHORT-RANGE ORDER IN APERIODIC
SILICAS 233 7.3.2 FIRST SHARP DIFFRACTION PEAK AND MEDIUM-RANGE ORDER
236 7.4 DISCUSSION 239 7.4.1 PARTIAL RDFS 239 7.4.2 TRUNCATION EFFECT
240 7.5 CONCLUDING REMARKS 242 REFERENCES 242 8 WEAK-BEAM ELECTRON
MICROSCOPY 245 8.1 INTRODUCTION 245 8.2 PRINCIPLES OF THE WEAK-BEAM
TECHNIQUE 246 8.2.1 PENDOLLOSUNG 248 8.2.2 THE AMPLITUDE-PHASE DIAGRAM
249 8.2.3 WEAK-BEAM IMAGE OF A DISLOCATION 250 8.2.4 THE
COUPLED-PENDULUM AS AN ANALOGUE OF WEAK-BEAM LMAGING(COCKAYNE, 1972) 250
8.2.5 THE AMPLITUDE-PHASE DIAGRAM FOR WEAK-BEAM IMAGING 251 8.3
PRACTICAL WEAK-BEAM MICROSCOPY 254 8.3.1 CONDITIONS IMPOSED BY THEORY
254 8.3.2 EXPERIMENTAL PROCEDURES 256 8.4 APPLICATIONS 258 8.4.1
DISLOCATION DISSOCIATION 258 8.4.2 DETERMINATION OF STACKING FAULT
ENERGIES 260 8.4.3 INVISIBILITY CRITERIA 263 8.4.4 WEAK-BEAM MICROSCOPY
AS THE PREFERRED TOOL FOR STUDYING COMPLEX DEFECT GEOMETRIES 263 8.4.5
STACKING FAULTS 265 8.4.6 SUPERLATTICE DISLOCATIONS A TRAP FOR THE
UNWARY 267 8.5 OTHER WEAK-BEAM STUDIES 269 8.6 CONCLUSIONS 269
REFERENCES 269 XII 9 POINT GROUP AND SPACE GROUP IDENTIFICATION BY
CONVERGENT BEAM ELECTRON DIFFRACTION 273 9.1 INTRODUCTION 273 9.1.1 WHY
POINT GROUP AND SPACE GROUP IDENTIFICATION 273 9.1.2 WHYUSECBED 274
9.1.3 HOW TO OBTAIN CBED PATTERNS 275 9.2 POINT GROUP IDENTIFICATION 277
9.3 SPACE GROUP IDENTIFICATION 287 9.4 EXAMPLES OF POINT GROUP AND SPACE
GROUP IDENTIFICATION 293 9.5 SPECIAL TECHNIQUES AND OTHER APPLICATIONS
297 9.6 EPILOGUE 298 REFERENCES 299 10 ADVANCED TECHNIQUES IN TEM
SPECIMEN PREPARATION 301 10.1 ABSTRACT 301 10.2 INITIAL PREPARATION 302
10.2.1 DIAMOND WHEEL SAWING 303 10.2.2 WIRE SAWING 304 10.2.3 SPARK
MACHINING 305 10.3 PRETHINNING 305 10.4 DISC CUTTING 306 10.4.1 DISCS
FROM SHEET 307 10.5 FINAL THINNING 307 10.5.1 DIMPLING 309 10.5.2
ELECTROPOLISHING 311 10.6 ION BEAM MILLING 313 10.6.1 ION MILLING
PARAMETERS 314 10.6.2 SPECIAL PREPARATION TECHNIQUES 318 10.7 TRIPOD
POLISHING 321 10.7.1 PREPARATION OF SPECIMENS 322 10.7.2 IRREGULAR
SPECIMENS 324 10.8 SMALL ANGLE CLEAVAGE TECHNIQUE 324 10.8.1 CLEAVING
CONSIDERATIONS 325 10.8.2 PREPARATION OF SPECIMENS 327 10.8.3 OTHER
APPLICATIONS 331 10.9 ULTRAMICROTOMY 332 10.10 DIRECT PREPARATION
METHODS 334 10.11 FOCUSED ION BEAM 336 10.11.1 THE FOCUSED ION BEAM
(FIB) INSTRUMENT 336 10.11.2 CONVENTIONAL FIB TEM SPECIMEN PREPARATION
338 10.11.3 THE LIFT-OUT TECHNIQUE 339 XIII 10.11.4 FIB PREPARATION
TRICKS OF THE TRADE 341 10.11.5 SPECIMEN PREPARATION INDUCED DAMAGE 341
10.11.6 ADVANTAGES AND DISADVANTAGES OF THE FIB METHODS 342 10.11.7
ADVANCES IN FIB INSTRUMENTATION 342 10.11.8 FINAL COMMENTS 343 10.12
PLASMA CLEANING 343 10.12.1 BACKGROUND 344 10.12.2 PLASMA BASICS 345
10.12.3 PLASMA PROCESSING: VOLATILIZATION OF HYDROCARBONS 347 10.12.4
EXPERIMENTAL DETAILS 348 10.12.5 PLASMA CONDITIONS AND THE EFFECTS ON
THE SPECIMEN/STAGE 350 10.13 CONCLUSION 351 REFERENCES 352 INDEX 363
|
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| id | DE-604.BV013360703 |
| illustrated | Illustrated |
| indexdate | 2024-12-23T15:26:19Z |
| institution | BVB |
| isbn | 3540676805 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009114014 |
| oclc_num | 82535752 |
| open_access_boolean | |
| owner | DE-703 DE-355 DE-BY-UBR DE-83 DE-11 |
| owner_facet | DE-703 DE-355 DE-BY-UBR DE-83 DE-11 |
| physical | XVI, 365 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Springer Tsinghua Univ. Press |
| record_format | marc |
| series | Springer series in surface sciences |
| series2 | Springer series in surface sciences Physics and astronomy online library |
| spellingShingle | Progress in transmission electron microscopy Springer series in surface sciences Microscopie électronique en transmission - Technologie ram Transmission electron microscopy Transmission electron microscopy Technique |
| title | Progress in transmission electron microscopy |
| title_auth | Progress in transmission electron microscopy |
| title_exact_search | Progress in transmission electron microscopy |
| title_full | Progress in transmission electron microscopy 1 Concepts and techniques Xiao-Feng Zhang ... (ed.) |
| title_fullStr | Progress in transmission electron microscopy 1 Concepts and techniques Xiao-Feng Zhang ... (ed.) |
| title_full_unstemmed | Progress in transmission electron microscopy 1 Concepts and techniques Xiao-Feng Zhang ... (ed.) |
| title_short | Progress in transmission electron microscopy |
| title_sort | progress in transmission electron microscopy concepts and techniques |
| topic | Microscopie électronique en transmission - Technologie ram Transmission electron microscopy Transmission electron microscopy Technique |
| topic_facet | Microscopie électronique en transmission - Technologie Transmission electron microscopy Transmission electron microscopy Technique |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009114014&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV013360702 (DE-604)BV000600785 |
| work_keys_str_mv | AT zhangxiaofeng progressintransmissionelectronmicroscopy1 |