Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
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| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Pennington, NJ
Electrochemical Soc.
1994
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| Schriftenreihe: | Electrochemical Society: Proceedings
1994,33 |
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| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013176946 | ||
| 003 | DE-604 | ||
| 005 | 20010212 | ||
| 007 | t| | ||
| 008 | 000529s1994 xx ad|| |||| 10||| eng d | ||
| 020 | |a 1566770920 |9 1-56677-092-0 | ||
| 035 | |a (OCoLC)32389560 | ||
| 035 | |a (DE-599)BVBBV013176946 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 | ||
| 050 | 0 | |a TK7871.85 | |
| 082 | 0 | |a 621.3815/2/0287 |2 20 | |
| 084 | |a UQ 8010 |0 (DE-625)146585: |2 rvk | ||
| 111 | 2 | |a Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |n 3 |d 1994 |c Miami Beach, Fla. |j Verfasser |0 (DE-588)5234461-7 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |c ed. D. K. Schroder ... |
| 246 | 1 | 3 | |a Diagnostic techniques for semiconductor materials and devices |
| 264 | 1 | |a Pennington, NJ |b Electrochemical Soc. |c 1994 | |
| 300 | |a XI, 387 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Electrochemical Society: Proceedings |v 1994,33 | |
| 650 | 7 | |a Semiconducteurs - Essais |2 ram | |
| 650 | 4 | |a Semiconductors |x Testing |v Congresses | |
| 650 | 0 | 7 | |a Halbleiterwerkstoff |0 (DE-588)4158817-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1994 |z Miami Beach Fla. |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 0 | 1 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleiterwerkstoff |0 (DE-588)4158817-4 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Schroder, Dieter K. |e Sonstige |4 oth | |
| 830 | 0 | |a Electrochemical Society: Proceedings |v 1994,33 |w (DE-604)BV001900941 |9 1994,33 | |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-008978168 | |
Datensatz im Suchindex
| _version_ | 1819245144950439936 |
|---|---|
| any_adam_object | |
| author_corporate | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Miami Beach, Fla |
| author_corporate_role | aut |
| author_facet | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Miami Beach, Fla |
| author_sort | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Miami Beach, Fla |
| building | Verbundindex |
| bvnumber | BV013176946 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UQ 8010 |
| ctrlnum | (OCoLC)32389560 (DE-599)BVBBV013176946 |
| dewey-full | 621.3815/2/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2/0287 |
| dewey-search | 621.3815/2/0287 |
| dewey-sort | 3621.3815 12 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01994nam a2200481 cb4500</leader><controlfield tag="001">BV013176946</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010212 </controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">000529s1994 xx ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1566770920</subfield><subfield code="9">1-56677-092-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)32389560</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013176946</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.85</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2/0287</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 8010</subfield><subfield code="0">(DE-625)146585:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Symposium on Diagnostic Techniques for Semiconductor Materials and Devices</subfield><subfield code="n">3</subfield><subfield code="d">1994</subfield><subfield code="c">Miami Beach, Fla.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5234461-7</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices</subfield><subfield code="c">ed. D. K. Schroder ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Diagnostic techniques for semiconductor materials and devices</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Pennington, NJ</subfield><subfield code="b">Electrochemical Soc.</subfield><subfield code="c">1994</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 387 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Electrochemical Society: Proceedings</subfield><subfield code="v">1994,33</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconducteurs - Essais</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterwerkstoff</subfield><subfield code="0">(DE-588)4158817-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1994</subfield><subfield code="z">Miami Beach Fla.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Halbleiterwerkstoff</subfield><subfield code="0">(DE-588)4158817-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schroder, Dieter K.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Electrochemical Society: Proceedings</subfield><subfield code="v">1994,33</subfield><subfield code="w">(DE-604)BV001900941</subfield><subfield code="9">1994,33</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008978168</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1994 Miami Beach Fla. gnd-content |
| genre_facet | Konferenzschrift 1994 Miami Beach Fla. |
| id | DE-604.BV013176946 |
| illustrated | Illustrated |
| indexdate | 2024-12-23T15:22:49Z |
| institution | BVB |
| institution_GND | (DE-588)5234461-7 |
| isbn | 1566770920 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008978168 |
| oclc_num | 32389560 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | XI, 387 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Electrochemical Soc. |
| record_format | marc |
| series | Electrochemical Society: Proceedings |
| series2 | Electrochemical Society: Proceedings |
| spelling | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices 3 1994 Miami Beach, Fla. Verfasser (DE-588)5234461-7 aut Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ed. D. K. Schroder ... Diagnostic techniques for semiconductor materials and devices Pennington, NJ Electrochemical Soc. 1994 XI, 387 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electrochemical Society: Proceedings 1994,33 Semiconducteurs - Essais ram Semiconductors Testing Congresses Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1994 Miami Beach Fla. gnd-content Halbleiterbauelement (DE-588)4113826-0 s Werkstoffprüfung (DE-588)4037934-6 s DE-604 Halbleiterwerkstoff (DE-588)4158817-4 s 1\p DE-604 Schroder, Dieter K. Sonstige oth Electrochemical Society: Proceedings 1994,33 (DE-604)BV001900941 1994,33 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Electrochemical Society: Proceedings Semiconducteurs - Essais ram Semiconductors Testing Congresses Halbleiterwerkstoff (DE-588)4158817-4 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Werkstoffprüfung (DE-588)4037934-6 gnd |
| subject_GND | (DE-588)4158817-4 (DE-588)4113826-0 (DE-588)4037934-6 (DE-588)1071861417 |
| title | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_alt | Diagnostic techniques for semiconductor materials and devices |
| title_auth | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_exact_search | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_full | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ed. D. K. Schroder ... |
| title_fullStr | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ed. D. K. Schroder ... |
| title_full_unstemmed | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ed. D. K. Schroder ... |
| title_short | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_sort | proceedings of the symposium on diagnostic techniques for semiconductor materials and devices |
| topic | Semiconducteurs - Essais ram Semiconductors Testing Congresses Halbleiterwerkstoff (DE-588)4158817-4 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Werkstoffprüfung (DE-588)4037934-6 gnd |
| topic_facet | Semiconducteurs - Essais Semiconductors Testing Congresses Halbleiterwerkstoff Halbleiterbauelement Werkstoffprüfung Konferenzschrift 1994 Miami Beach Fla. |
| volume_link | (DE-604)BV001900941 |
| work_keys_str_mv | AT symposiumondiagnostictechniquesforsemiconductormaterialsanddevicesmiamibeachfla proceedingsofthesymposiumondiagnostictechniquesforsemiconductormaterialsanddevices AT schroderdieterk proceedingsofthesymposiumondiagnostictechniquesforsemiconductormaterialsanddevices AT symposiumondiagnostictechniquesforsemiconductormaterialsanddevicesmiamibeachfla diagnostictechniquesforsemiconductormaterialsanddevices AT schroderdieterk diagnostictechniquesforsemiconductormaterialsanddevices |