Photomechanics

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Sprache:English
Veröffentlicht: Berlin [u.a.] Springer 2000
Schriftenreihe:Topics in applied physics 77
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Datensatz im Suchindex

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adam_text PRAMOD K. RASTOGI (ED.) PHOTOMECHANICS WITH 314 FIGURES SPRINGER CONTENTS OPTICS FOR ENGINEERS DANIEL MALACARA-HERNAENDEZ 1 1. INTRODUCTION 1 2. GEOMETRICAL OPTICS PRINCIPLES 1 2.1. FERMAT S PRINCIPLE AND THE LAW OF REFRACTION 1 2.2. FIRST-ORDER OPTICS 3 2.3. ABERRATIONS 7 3. WAVE-OPTICS FUNDAMENTALS 12 3.1. YOUNG S DOUBLE SLIT 12 3.2. MICHELSON INTERFEROMETER 13 3.3. COHERENCE AND LIGHT SOURCES 14 4. MAIN INTERFEROMETERS USED IN OPTICAL ENGINEERING 15 4.1. FIZCAU INTERFEROMETER AND NEWTONS RINGS 16 4.2. TWYMAN-GREEN INTERFEROMETER 19 4.3. RONCHI AND LATERAL-SHEAR INTERFEROMETERS 22 4.4. TALBOT INTERFEROMETCR AND MOIRE DENECTOMETRY 26 4.5. FOUCAULT TEST AND SCHLIEREN TECHNIQUES 27 4.6. TWO-WAVELENGTH INTERFEROMCTRY 28 4.7. HOLOGRAPHIE PRINCIPLES 29 5. SUMMARY 31 REFERENCES 31 INTRODUCTION TO ENGINEERING MECHANICS ANAND ASUNDI 33 1. INTRODUCTION 33 2. BASIC CONCEPTS 34 2.1. STRESS 34 2.2. STRESS TRANSFORMATION 35 2.3. STRESS TRANSFORMATION USING MOHR S CIRCLE 36 2.4. DISPLACEMENT AND STRAIN 37 2.5. STRAIN TRANSFORMATION 39 2.6. STRESS-STRAIN RELATIONS 40 2.7. BOUNDARY CONDITIONS 41 3. THEORY OF ELASTICITY APPROACH 42 3.1. PLANE STRESS FORMULATION 44 3.2. PLANE STRAIN FORMULATION 45 X CONTENTS 4. STRENGTH OF MATERIALS APPROACH 46 5. EXAMPLES 47 5.1. AXIAL LOADING 47 5.2. BENDING OF BEAMS 49 5.3. COMBINED BENDING AND AXIAL LOAD 52 6. CONCLUSION 53 FURTHER READING 54 FRINGE ANALYSIS YVES SURREL 55 1. INTRODUCTION 55 2. PHASE EVALUATION 57 2.1. LOCAL AND GLOBAL STRATEGIES 57 2.2. LOCAL PHASE DETECTION 58 2.3. GLOBAL PHASE DETECTION 77 2.4. RESIDUAL PHASE ERRORS 81 2.5. EFFECT OF ADDITIVE NOISE 84 3. PHASE UNWRAPPING 86 3.1. SPATIAL APPROACH 87 3.2. TEMPORAL APPROACH 89 4. CONCLUSION 94 REFERENCCS 99 PRINCIPLES OF HOLOGRAPHIE INTERFEROMETRY AND SPECKLE METROLOGY PRAMOD K. RASTOGI 103 1. HOLOGRAPHIE INTERFEROMETRY 103 1.1. TYPES OF HOLOGRAPHIE INTERFEROMETRY 104 1.2. THERMOPLASTIC CAMERA 107 1.3. MAPPING OF THE RESOLVED PART OF DISPLACEINENT 109 1.4. DETERMINATION OF THE WAVEFRONT PHASE USING PHASE-SHIFTING INTERFEROMETRY 110 1.5. OUT-OF-PLANE DISPLACEMENT MEASUREMENT 111 1.6. IN-PLANE DISPLACEMENT MEASUREMENT 112 1.7. HOLOGRAPHIE SHEARING INTERFEROMETRY 115 1.8. COMPARATIVE HOLOGRAPHIE INTERFEROMETRY 117 1.9. VIBRATION ANALYSIS 119 2. SPECKLE METROLOGY 124 2.1. FOCUSED SPECKLE PHOTOGRAPHY 125 2.2. DCFOCUSED SPECKLE PHOTOGRAPHY 128 2.3. SPECKLE SHEARING PHOTOGRAPHY 129 2.4. SPECKLE INTERFEROMETRY 131 2.5. SPECKLE SHEARING INTERFEROMETRY 140 CONTENTS XI 3. CONCLUSIONS 145 REFERENCES 145 MOIRE METHODS FOR ENGINEERING AND SCIENCE MOIRE INTERFEROMETRY AND SHADOW MOIRE DANIEL POST, BONGTAE HAN, AND PETER G. IFJU 151 1. INTRODUCTION 151 2. MOIRE INTERFEROMETRY 152 2.1. BASIC CONCEPTS 152 2.2. EQUIPMCNT 156 2.3. SPECIMEN GRAETINGS 157 2.4. BITHERMAL LOADING (ISOTHERMAL LOADING) 158 2.5. FRMGE COUNTING 158 2.6. STRAIN ANALYSIS 160 2.7. CARRIER FRINGES 160 2.8. OUT-OF-PLANE DEFORMATION 162 3. ADVANCED TECHNIQUES IN MOIRE INTERFEROMETRY 164 3.1. MICROSCOPIC MOIRE INTERFEROMETRY 164 3.2. CURVED SURFACES 166 3.3. REPLICATION OF DEFORMED GRAETINGS 170 4. DIVERSE APPLICATIONS OF MOIRE INTERFEROMETRY 171 4.1. THERMAL DEFORNIATIONS OF MICROELECTRONICS DEVICES 171 4.2. TEXTILE COMPOSITES 173 4.3. FRACTURE MECHANICS 176 4.4. MICROMECHAIUECS: GRAIN DEFORMATIONS 177 5. SHADOW MOIRE 180 5.1. BASIC CONCEPTS 180 5.2. ADDITIONAL CONSIDERATIONS 183 6. INCREASED SENSITIVITY, SHADOW MOIRE 184 6.1. PHASE STEPPING (OR QUASI-HETERODYNE) METHOD 184 6.2. OPTICAL/DIGITAL FRINGE MULTIPLICATION (O/DFM) 185 7. APPLICATIONS OF SHADOW MOIRE 185 7.1. POST-BUCKLING BEHAVIOR OF A COMPOSITE COLUMN 185 7.2. PRE-BUCKLING BEHAVIOR OF AN ALUMINUM CHANNEL 189 7.3. WARPAGE OF ELECTRONIC DEVICES 191 REFERENCES 194 DIGITAL PHOTOELASTICITY TERRY Y. CHEN 197 1. BASIC PRINCIPLES OF PHOTOELASTICITY 197 1.1. LIGHT AND COMPLEX NOTATION 197 1.2. POLARIZATION OF LIGHT 198 1.3. RETARDATION 200 1.4. OPTICAL MEDIA 200 1.5. THE STRESS-OPTIC LAW 202 XII CONTENTS 1.6. PLANE POLARISCOPE 204 1.7. CIRCULAR POLARISCOPE 207 2. COMPUTER EVALUATION OF PHOTOELASTIC FRINGC PATTERNS 210 2.1. DIGITAL IMAGE PROCESSING 211 2.2. EXTRACTION OF FRINGE POINT 213 2.3. FRINGE MULTIPLICATION 213 2.4. DETERMINATION OF THE ISOCHROMATIC FRINGE ORDER 215 2.5. DETERMINATION OF PRINCIPAL STRESS DIRECTION 222 3. APPLICATIONS OF EVALUATED DATA 226 3.1. STRESS ANALYSIS 226 3.2. EXAMPLES 227 4. SYSTEM AND ERROR ASSESSMENT 227 5. CONCLUSIONS 230 REFERENCCS 230 OPTICAL FIBER STRAIN SENSING IN ENGINEERING MECHANICS JAMES S. SIRKIS 233 1. INTRINSIC FABRY-PEROT SENSOR 234 1.1. OPTICAL ARRANGEMENT 234 1.2. RESPONSE TO STRAIN AND TEMPERATURE 236 1.3. SENSOR MULTIPLEXING 239 2. EXTRINSIC FABRY-PEROT STRAIN SENSOR 239 2.1. OPTICAL ARRANGEMENT 241 2.2. RESPONSE TO STRAIN AND TEMPERATURE 242 2.3. SELF-TEMPERATURE COMPENSATION 243 2.4. EFP SENSOR VARIANTS 244 2.5. SENSOR MULTIPLEXING 246 3. BRAGG GRAETING STRAIN SENSOR 246 3.1. BRAGG GRAETING FABRICATION 247 3.2. STRAIN AND TEMPERATURE RESPONSE 250 3.3. EFFECTS OF GRADIENTS 250 3.4. BRAGG GRAETING RELIABILITY 251 3.5. SENSOR MULTIPLEXING 251 4. FIBER-OPTIC COATINGS AND CABLES 253 5. COMMERCIAL PACKAGING 256 6. SENSOR BONDING TCCHNIQUES 257 7. DEINODULATION 258 7.1. SERRODYNE FRINGE COUNTING (IFP SENSORS) 259 7.2. WHITE LIGHT CROSS-CORRELATOR (EFP SENSORS) 260 7.3. SCANNING FABRY-PEROT FILTER (BRAGG GRAETING SENSORS) 262 7.4. SPECTRAL INTERROGATION (EFP SENSORS) 263 7.5. OTHER DEMODULATORS 266 8. SENSOR COMPARISON 266 REFERCNCES 269 CONTENTS XIII LONG-GAGE FIBER-OPTIC SENSORS FOR STRUCTURAL MONITORING DANIELE INAUDI 273 1. INTRODUCTION: MONITORING VERSUS MEASURING STRUCTURES 273 2. LONG-GAGE VERSUS SHORT-GAGE SENSORS 274 3. INTERFEROMETRIC SENSORS : 275 3.1. OPTICAL ARRANGEMENTS 276 3.2. STRAIN AND TEMPERATURE SENSITIVITY 276 3.3. DEMODULATION TECHNIQUES 277 3.4. SENSOR PACKAGING 280 3.5. APPLICATION EXAMPLE: MONITORING THE VERSOIX BRIDGE 283 4. INTENSITY-BASED SENSORS 284 5. BRILLOUIN-SCATTERING SENSORS 286 5.1. PRINCIPLES 286 5.2. MEASUREMENT TECHNIQUES 287 5.3. SENSOR PACKAGING 289 5.4. APPLICATION EXAMPLE: TEMPERATURE MONITORING OF THE LUZZONE DAM 290 6. OUTLOOK 291 7. CONCLUSIONS 291 REFERENCES 292 TECHNIQUES FOR NON-BIREFRINGENT OBJECTS: COHERENT SHEARING INTERFEROMETRY AND CAUSTICS SRIDHAR KRISHNASWAMY 295 1. INTRODUCTION 295 2. ELASTO-OPTIC RELATIONS 297 2.1. OPTICAL PHASE SHIFT DUE TO TRANSMISSION THROUGH AN OPTICALLY ISOTROPIE LINEAR ELASTIC MEDIUM 297 2.2. OPTICAL PHASE-SHIFT DUE TO REFLECTION FROM A POLISHED SURFACE 298 3. SHEARING INTERFEROMETRY 299 3.1. A DUAL-GRATING SHEARING INTERFEROMETER - THE COHERENT GRADIENT SENSOR (CGS) 300 3.2. A POLARIZATION-BASED SHEARING INTERFEROMETER: COMPACT POLARISCOPE / SHEARING INTERFEROMETER (PSI) 304 4. OPTICAL CAUSTICS 309 5. APPLICATIONS 311 5.1. COMPRESSIVE LINE LOAD ON THE EDGE OF A PLATE 312 5.2. PRACTURE MECHANICS 315 6. CONCLUSION 319 REFERENCES 319 XIV CONTENTS ADVANCES IN TWO-DIMENSIONAL AND THREE-DIMENSIONAL COMPUTER VISION MICHAEL A. SUTTON, STEPHEN R. MCNEILL, JEFFREY D. HELM, AND YUH J. CHAO 323 1. INTRODUCTION 323 2. THEORY AND NUMERICAL IMPLEMENTATION 326 2.1. TWO-DIMENSIONAL VIDEO IMAGE CORRELATION 326 2.2. THREE-DIMENSIONAL VIDEO IMAGE CORRELATION 334 3. APPLICATIONS 343 3.1. TWO-DIMENSIONAL VIDEO IMAGE CORRELATION 343 3.2. THREE-DIMENSIONAL VIDEO IMAGE CORRELATION 354 4. DISCUSSION 366 5. SUMMARY 367 REFERENCES 368 LASER DOPPLER AND PULSED LASER VELOCIMETRY IN FLUID MECHANICS JEREMY M. COUPLAND 373 1. INTRODUCTION 373 1.1. THE SCATTERING AND DYNAMIC PROPERTIES OF SEEDING PARTICLES . 375 2. LASER DOPPLER VELOCIMETRY (LDV) 376 2.1. FUNDAMCNTALS OF LDV 376 2.2. FOURIER OPTICA MODEL OF LDV 381 2.3. THE DOPPLER SIGNAL AND SIGNAL PROCESSING 386 2.4. LDV MEASUREMENTS IN PRACTICE 389 3. PLANAR DOPPLER VELOCIMETRY (PDV) 391 4. PULSED LASER VELOCIMETRY 395 4.1. PARTICLE IMAGE VELOCIMETRY (PIV) 395 4.2. REINOVAL OF DIRECTIONAL AMBIGUITY 399 4.3. PIV MEASUREMENTS IN PRACTICE 400 4.4. THREE-DIMENSIONAL PIV 402 4.5. HOLOGRAPHIE PARTICLE IMAGE VELOCIMETRY (HPIV) 402 5. CONCLUSIONS, DISCUSSION AND FUTURE DEVELOPMENT 408 REFERENCES 410 SURFACE CHARACTERIZATION AND ROUGHNESS MEASUREMENT IN ENGINEERING DAVID J. WHITEHOUSE 413 1. GENERAL 413 1.1. HISTORICAL 413 1.2. NATURC AND IMPORTANCE OF SURFACES 414 1.3. TRENDS 416 2. INSTRUMENTATION 419 2.1. GENERAL POINTS 419 CONTENTS XV 2.2. THE STYLUS 422 2.3. BASIC INSTRUMENT 425 2.4. THE STYLUS METHOD (MECHANICAL) 427 2.5. THE OPTICAL METHODS 428 2.6. OTHER CONVENTIONAL METHODS 433 2.7. NON-CONVENTIONAL METHODS 433 3. PRE-PROCESSING AND FILTERING 433 3.1. LEVCLLING 433 3.2. CURVE FITTING FOR FORM 433 3.3. FILTERING FOR WAVINESS 434 4. PARAMETERS 439 4.1. GENERAL 439 4.2. HEIGHT PARAMETERS (SEE [36] FOR EXAMPLE) 440 4.3. PEAK PARAMETERS 441 4.4. SPACING PARAMETERS 442 4.5. PEAK PARAMETERS (STATISTICAL) 443 4.6. HYBRID PARAMETERS 445 4.7. EFFECTS OF FILTERING ON PARAMETER VALUES 445 5. RANDOM PROCESS ANALYSIS IN SURFACE METROLOGY 446 5.1. GENERAL 446 5.2. HEIGHT INFORMATION 446 5.3. SPACING INFORMATION 447 6. AREAL (OR THREE-DIMENSIONAL) PARAMETERS 453 6.1. GENERAL 453 6.2. COMMENTS ON AREAL MCASUREMENT 454 7. CONCLUSIONS 458 REFERENCES 459 INDEX 463
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isbn 3540659900
language English
oai_aleph_id oai:aleph.bib-bvb.de:BVB01-008710483
oclc_num 42682796
open_access_boolean
owner DE-355
DE-BY-UBR
DE-29T
DE-703
DE-92
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owner_facet DE-355
DE-BY-UBR
DE-29T
DE-703
DE-92
DE-522
DE-83
DE-11
DE-188
physical XV, 471 S. Ill., graph. Darst
publishDate 2000
publishDateSearch 2000
publishDateSort 2000
publisher Springer
record_format marc
series Topics in applied physics
series2 Topics in applied physics
spellingShingle Photomechanics
Topics in applied physics
Contrôle non destructif ram
Dispositifs optoélectroniques ram
Interférométrie holographique ram
Moiré, Méthode de ram
Holographic interferometry
Moiré method
Nondestructive testing
Optoelectronic devices
Photonics
Holographische Interferometrie (DE-588)4123390-6 gnd
Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd
Photonik (DE-588)4243979-6 gnd
Optoelektronisches Bauelement (DE-588)4043689-5 gnd
subject_GND (DE-588)4123390-6
(DE-588)4067689-4
(DE-588)4243979-6
(DE-588)4043689-5
title Photomechanics
title_auth Photomechanics
title_exact_search Photomechanics
title_full Photomechanics Pramod K. Rastogi (ed.)
title_fullStr Photomechanics Pramod K. Rastogi (ed.)
title_full_unstemmed Photomechanics Pramod K. Rastogi (ed.)
title_short Photomechanics
title_sort photomechanics
topic Contrôle non destructif ram
Dispositifs optoélectroniques ram
Interférométrie holographique ram
Moiré, Méthode de ram
Holographic interferometry
Moiré method
Nondestructive testing
Optoelectronic devices
Photonics
Holographische Interferometrie (DE-588)4123390-6 gnd
Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd
Photonik (DE-588)4243979-6 gnd
Optoelektronisches Bauelement (DE-588)4043689-5 gnd
topic_facet Contrôle non destructif
Dispositifs optoélectroniques
Interférométrie holographique
Moiré, Méthode de
Holographic interferometry
Moiré method
Nondestructive testing
Optoelectronic devices
Photonics
Holographische Interferometrie
Zerstörungsfreie Werkstoffprüfung
Photonik
Optoelektronisches Bauelement
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volume_link (DE-604)BV008007504
work_keys_str_mv AT rastogipramodk photomechanics