ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996

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Körperschaft: ISCSI Karuizawa (VerfasserIn)
Format: Tagungsbericht Buch
Sprache:English
Veröffentlicht: Amsterdam u.a. Elsevier 1997
Schriftenreihe:Applied surface science 117/118
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LEADER 00000nam a2200000 cb4500
001 BV011394910
003 DE-604
005 19970624
007 t
008 970623s1997 ad|| |||| 10||| eng d
035 |a (OCoLC)38238264 
035 |a (DE-599)BVBBV011394910 
040 |a DE-604  |b ger  |e rakddb 
041 0 |a eng 
049 |a DE-384  |a DE-355  |a DE-29T  |a DE-706 
050 0 |a TA418.7 
082 0 |a 541.377 
111 2 |a ISCSI  |n 2  |d 1996  |c Karuizawa  |j Verfasser  |0 (DE-588)5246267-5  |4 aut 
245 1 0 |a ISCSI-2  |b Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996  |c guest eds.: T. Hattori ... 
264 1 |a Amsterdam u.a.  |b Elsevier  |c 1997 
300 |a XVIII, 856 S.  |b zahlr. Ill. u. graph. Darst. 
336 |b txt  |2 rdacontent 
337 |b n  |2 rdamedia 
338 |b nc  |2 rdacarrier 
490 0 |a Applied surface science  |v 117/118 
500 |a Einzelaufnahme von Zeitschr.-Bd. 
650 7 |a Chimie des surfaces - Congrès  |2 ram 
650 7 |a Contacts métal-semiconducteur - Congrès  |2 ram 
650 7 |a Nanostructures - Congrès  |2 ram 
650 7 |a Semiconducteurs - Couches minces - Congrès  |2 ram 
650 4 |a Semiconductors  |v Congresses 
650 4 |a Semiconductors  |x Junctions  |v Congresses 
650 0 7 |a Halbleitergrenzfläche  |0 (DE-588)4158802-2  |2 gnd  |9 rswk-swf 
655 7 |0 (DE-588)1071861417  |a Konferenzschrift  |y 1996  |z Karuizawa  |2 gnd-content 
689 0 0 |a Halbleitergrenzfläche  |0 (DE-588)4158802-2  |D s 
689 0 |5 DE-604 
700 1 |a Hattori, Takeo  |e Sonstige  |4 oth 
999 |a oai:aleph.bib-bvb.de:BVB01-007659839 

Datensatz im Suchindex

_version_ 1804125907847217152
any_adam_object
author_corporate ISCSI Karuizawa
author_corporate_role aut
author_facet ISCSI Karuizawa
author_sort ISCSI Karuizawa
building Verbundindex
bvnumber BV011394910
callnumber-first T - Technology
callnumber-label TA418
callnumber-raw TA418.7
callnumber-search TA418.7
callnumber-sort TA 3418.7
callnumber-subject TA - General and Civil Engineering
ctrlnum (OCoLC)38238264
(DE-599)BVBBV011394910
dewey-full 541.377
dewey-hundreds 500 - Natural sciences and mathematics
dewey-ones 541 - Physical chemistry
dewey-raw 541.377
dewey-search 541.377
dewey-sort 3541.377
dewey-tens 540 - Chemistry and allied sciences
discipline Chemie / Pharmazie
format Conference Proceeding
Book
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01619nam a2200421 cb4500</leader><controlfield tag="001">BV011394910</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19970624 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">970623s1997 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)38238264</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011394910</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA418.7</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">541.377</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">ISCSI</subfield><subfield code="n">2</subfield><subfield code="d">1996</subfield><subfield code="c">Karuizawa</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5246267-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISCSI-2</subfield><subfield code="b">Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996</subfield><subfield code="c">guest eds.: T. Hattori ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam u.a.</subfield><subfield code="b">Elsevier</subfield><subfield code="c">1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVIII, 856 S.</subfield><subfield code="b">zahlr. Ill. u. graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Applied surface science</subfield><subfield code="v">117/118</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme von Zeitschr.-Bd.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Chimie des surfaces - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Contacts métal-semiconducteur - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Nanostructures - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconducteurs - Couches minces - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Junctions</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleitergrenzfläche</subfield><subfield code="0">(DE-588)4158802-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1996</subfield><subfield code="z">Karuizawa</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleitergrenzfläche</subfield><subfield code="0">(DE-588)4158802-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hattori, Takeo</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007659839</subfield></datafield></record></collection>
genre (DE-588)1071861417 Konferenzschrift 1996 Karuizawa gnd-content
genre_facet Konferenzschrift 1996 Karuizawa
id DE-604.BV011394910
illustrated Illustrated
indexdate 2024-07-09T18:09:01Z
institution BVB
institution_GND (DE-588)5246267-5
language English
oai_aleph_id oai:aleph.bib-bvb.de:BVB01-007659839
oclc_num 38238264
open_access_boolean
owner DE-384
DE-355
DE-BY-UBR
DE-29T
DE-706
owner_facet DE-384
DE-355
DE-BY-UBR
DE-29T
DE-706
physical XVIII, 856 S. zahlr. Ill. u. graph. Darst.
publishDate 1997
publishDateSearch 1997
publishDateSort 1997
publisher Elsevier
record_format marc
series2 Applied surface science
spelling ISCSI 2 1996 Karuizawa Verfasser (DE-588)5246267-5 aut
ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996 guest eds.: T. Hattori ...
Amsterdam u.a. Elsevier 1997
XVIII, 856 S. zahlr. Ill. u. graph. Darst.
txt rdacontent
n rdamedia
nc rdacarrier
Applied surface science 117/118
Einzelaufnahme von Zeitschr.-Bd.
Chimie des surfaces - Congrès ram
Contacts métal-semiconducteur - Congrès ram
Nanostructures - Congrès ram
Semiconducteurs - Couches minces - Congrès ram
Semiconductors Congresses
Semiconductors Junctions Congresses
Halbleitergrenzfläche (DE-588)4158802-2 gnd rswk-swf
(DE-588)1071861417 Konferenzschrift 1996 Karuizawa gnd-content
Halbleitergrenzfläche (DE-588)4158802-2 s
DE-604
Hattori, Takeo Sonstige oth
spellingShingle ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996
Chimie des surfaces - Congrès ram
Contacts métal-semiconducteur - Congrès ram
Nanostructures - Congrès ram
Semiconducteurs - Couches minces - Congrès ram
Semiconductors Congresses
Semiconductors Junctions Congresses
Halbleitergrenzfläche (DE-588)4158802-2 gnd
subject_GND (DE-588)4158802-2
(DE-588)1071861417
title ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996
title_auth ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996
title_exact_search ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996
title_full ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996 guest eds.: T. Hattori ...
title_fullStr ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996 guest eds.: T. Hattori ...
title_full_unstemmed ISCSI-2 Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996 guest eds.: T. Hattori ...
title_short ISCSI-2
title_sort iscsi 2 proceedings of the second international symposium on the control of semiconductor interfaces karuizawa japan october 28 november 1 1996
title_sub Proceedings of the second International Symposium on the Control of Semiconductor Interfaces ; Karuizawa, Japan, October 28 - November 1, 1996
topic Chimie des surfaces - Congrès ram
Contacts métal-semiconducteur - Congrès ram
Nanostructures - Congrès ram
Semiconducteurs - Couches minces - Congrès ram
Semiconductors Congresses
Semiconductors Junctions Congresses
Halbleitergrenzfläche (DE-588)4158802-2 gnd
topic_facet Chimie des surfaces - Congrès
Contacts métal-semiconducteur - Congrès
Nanostructures - Congrès
Semiconducteurs - Couches minces - Congrès
Semiconductors Congresses
Semiconductors Junctions Congresses
Halbleitergrenzfläche
Konferenzschrift 1996 Karuizawa
work_keys_str_mv AT iscsikaruizawa iscsi2proceedingsofthesecondinternationalsymposiumonthecontrolofsemiconductorinterfaceskaruizawajapanoctober28november11996
AT hattoritakeo iscsi2proceedingsofthesecondinternationalsymposiumonthecontrolofsemiconductorinterfaceskaruizawajapanoctober28november11996