How to count patents and value intellectual property uses of patent renewal and application data

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Hauptverfasser: Lanjouw, Jean O. (VerfasserIn), Pakes, Ariel (VerfasserIn), Putnam, Jonathan (VerfasserIn)
Format: Buch
Sprache:English
Veröffentlicht: Cambridge, Mass. 1996
Schriftenreihe:National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series 5741
Schlagworte:
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Datensatz im Suchindex

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Pakes, Ariel
Putnam, Jonathan
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series National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series
series2 National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series
spelling Lanjouw, Jean O. Verfasser aut
How to count patents and value intellectual property uses of patent renewal and application data Jean O. Lanjouw ; Ariel Pakes ; Jonathan Putnam
Cambridge, Mass. 1996
30, 1 S. graph. Darst.
txt rdacontent
n rdamedia
nc rdacarrier
National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series 5741
Ökonometrisches Modell
Intellectual property Valuation
Patents Valuation Econometric models
Pakes, Ariel Verfasser (DE-588)128970138 aut
Putnam, Jonathan Verfasser aut
Erscheint auch als Online-Ausgabe
National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series 5741 (DE-604)BV002801238 5741
http://papers.nber.org/papers/w5741.pdf kostenfrei Volltext
spellingShingle Lanjouw, Jean O.
Pakes, Ariel
Putnam, Jonathan
How to count patents and value intellectual property uses of patent renewal and application data
National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series
Ökonometrisches Modell
Intellectual property Valuation
Patents Valuation Econometric models
title How to count patents and value intellectual property uses of patent renewal and application data
title_auth How to count patents and value intellectual property uses of patent renewal and application data
title_exact_search How to count patents and value intellectual property uses of patent renewal and application data
title_full How to count patents and value intellectual property uses of patent renewal and application data Jean O. Lanjouw ; Ariel Pakes ; Jonathan Putnam
title_fullStr How to count patents and value intellectual property uses of patent renewal and application data Jean O. Lanjouw ; Ariel Pakes ; Jonathan Putnam
title_full_unstemmed How to count patents and value intellectual property uses of patent renewal and application data Jean O. Lanjouw ; Ariel Pakes ; Jonathan Putnam
title_short How to count patents and value intellectual property
title_sort how to count patents and value intellectual property uses of patent renewal and application data
title_sub uses of patent renewal and application data
topic Ökonometrisches Modell
Intellectual property Valuation
Patents Valuation Econometric models
topic_facet Ökonometrisches Modell
Intellectual property Valuation
Patents Valuation Econometric models
url http://papers.nber.org/papers/w5741.pdf
volume_link (DE-604)BV002801238
work_keys_str_mv AT lanjouwjeano howtocountpatentsandvalueintellectualpropertyusesofpatentrenewalandapplicationdata
AT pakesariel howtocountpatentsandvalueintellectualpropertyusesofpatentrenewalandapplicationdata
AT putnamjonathan howtocountpatentsandvalueintellectualpropertyusesofpatentrenewalandapplicationdata