Equal distance sampling of superellipse models
Abstract: "Superellipses are parametric models that can be used for representing two dimensional object parts or aspects of 3-D parts. Previously little care was given to obtaining a precise sampling of the contour of these models. Equal-distance sampling of superellipse model contours is howev...
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| Hauptverfasser: | , |
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| Format: | Buch |
| Sprache: | English |
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Edinburgh
1995
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