Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
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| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Pennington, NJ
Eletrochemical Soc.
1992
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| Schriftenreihe: | Electrochemical Society: Proceedings
1992,2 |
| Schlagworte: | |
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| 245 | 1 | 0 | |a Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |c ed. by J. L. Benton ... |
| 246 | 1 | 3 | |a Diagnostic techniques for semiconductor materials and devices |
| 264 | 1 | |a Pennington, NJ |b Eletrochemical Soc. |c 1992 | |
| 300 | |a X, 280 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 490 | 1 | |a Electrochemical Society: Proceedings |v 1992,2 | |
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| 650 | 7 | |a Semiconducteurs - Essais |2 ram | |
| 650 | 7 | |a Semiconducteurs - Qualité - Contrôle |2 ram | |
| 650 | 4 | |a Semiconductors |x Testing |v Congresses | |
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Datensatz im Suchindex
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| any_adam_object | |
| author_corporate | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Phoenix, Ariz |
| author_corporate_role | aut |
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| building | Verbundindex |
| bvnumber | BV010637198 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)25677673 (DE-599)BVBBV010637198 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1991 Phoenix Ariz. gnd-content |
| genre_facet | Konferenzschrift 1991 Phoenix Ariz. |
| id | DE-604.BV010637198 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:56:22Z |
| institution | BVB |
| institution_GND | (DE-588)5071442-9 |
| isbn | 1566770017 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007096466 |
| oclc_num | 25677673 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | X, 280 S. Ill., graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Eletrochemical Soc. |
| record_format | marc |
| series | Electrochemical Society: Proceedings |
| series2 | Electrochemical Society: Proceedings |
| spelling | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices 2 1991 Phoenix, Ariz. Verfasser (DE-588)5071442-9 aut Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ed. by J. L. Benton ... Diagnostic techniques for semiconductor materials and devices Pennington, NJ Eletrochemical Soc. 1992 X, 280 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electrochemical Society: Proceedings 1992,2 Materiais e dispositivos semicondutores larpcal Semiconducteurs - Essais ram Semiconducteurs - Qualité - Contrôle ram Semiconductors Testing Congresses Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1991 Phoenix Ariz. gnd-content Halbleiterwerkstoff (DE-588)4158817-4 s DE-604 Halbleiterbauelement (DE-588)4113826-0 s Werkstoffprüfung (DE-588)4037934-6 s 1\p DE-604 Benton, J. L. Sonstige oth Electrochemical Society: Proceedings 1992,2 (DE-604)BV001900941 1992,2 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Electrochemical Society: Proceedings Materiais e dispositivos semicondutores larpcal Semiconducteurs - Essais ram Semiconducteurs - Qualité - Contrôle ram Semiconductors Testing Congresses Halbleiterwerkstoff (DE-588)4158817-4 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| subject_GND | (DE-588)4158817-4 (DE-588)4037934-6 (DE-588)4113826-0 (DE-588)1071861417 |
| title | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_alt | Diagnostic techniques for semiconductor materials and devices |
| title_auth | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_exact_search | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_full | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ed. by J. L. Benton ... |
| title_fullStr | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ed. by J. L. Benton ... |
| title_full_unstemmed | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ed. by J. L. Benton ... |
| title_short | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_sort | proceedings of the symposium on diagnostic techniques for semiconductor materials and devices |
| topic | Materiais e dispositivos semicondutores larpcal Semiconducteurs - Essais ram Semiconducteurs - Qualité - Contrôle ram Semiconductors Testing Congresses Halbleiterwerkstoff (DE-588)4158817-4 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| topic_facet | Materiais e dispositivos semicondutores Semiconducteurs - Essais Semiconducteurs - Qualité - Contrôle Semiconductors Testing Congresses Halbleiterwerkstoff Werkstoffprüfung Halbleiterbauelement Konferenzschrift 1991 Phoenix Ariz. |
| volume_link | (DE-604)BV001900941 |
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