Proceedings

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Körperschaft: European Hybrid Microelectronics Conference Nizza (VerfasserIn)
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Veröffentlicht: Reston, VA Internat. Soc. for Hybrid Microelectronics 1993
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245 1 0 |a Proceedings  |c 9th European Hybrid Microelectronics Conference, Nice, Acropolis, France, June 2 - 3 - 4, 1993 
264 1 |a Reston, VA  |b Internat. Soc. for Hybrid Microelectronics  |c 1993 
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adam_text Wednesday/ June 2nd Plenary Opening Session ..............................................................9 Wednesday/ June 2nd Session ÌA Surface Mount Technology ..................13 Session IB Advanced Materials ..........................51 Session 1С Thick And Thin Film Technology ..........83 Session ID Product Development .......................135 Thursday, June 3rd Session 2A MCM Packaging ............................183 Session 2B Sensors ..........................................241 Session 2C Advanced Interconnection ................303 Session 2D Optoelectronics and Microwave .......359 Friday, June 4th Session ЗА Power Hybrids ...............................405 Session 3B Reliability ......................................451 Plenary Closing Session... ..........................................................493 IV PLENARY OPENING SESSION WELCOME AND ADDRESSES : K-Kwrnell Cretan 9th EHMC, A. Van Calster, Chairman ISHM European Поїш Committee. Senator P. Lof fitte, President of Route des Honte Technologies , Région Provence - Alpes - Côte D Azur, France. Prominent Poper: Smort Cards: an Industry from an Idea . .........70 M. Lossus, Prestóent Gemplus, France. Keynote Poper: Miemtechnologies: International Realities and Outlooks. Research and Development in France. ..... 11 і і Gognepain, Director of Deportment SPI, CNRS, France. SESSION 1A SURFACE MOUNT TECHNOLOGY Отпит: С. Vol, Thomson CSf , France. Laser Soldering of Toda/s Bedronk Components. ..............14 A.HJ. Меток, Philos, The Netherlands. Optical Laser Probe for Solder Joinfs Quality Testing through Thermal Response Analysis ......-26 W. Oaeys, Y. Donw, S. Dita«, A. Hljozi, V. QuMœtl, Universi* de Bordeaux 1, fronce. і Z -Ажѕ Conductive Adhesivas las Solder Replacement. ............. M I Chung, T. Deveteaux, С. Monti, M. Yon, N. (tecto, j ILTecfmofosyJiK, U.SA interaction of Very High 1 Density SMT Connectors with | AdvancedMultilayer Substraies. _________________ .43 і Y. Betopotòy. Beta, Electronics, U.SA SESSION Iß ADVANCED MATERIALS Chairman: P. Colta*, Nokia, Finland. Polymeric Composites for Hybrid Microelectronics ..............52 I. Krivka, R. Kúzel, J. Prokeš, 0. Stefan. Charles University, Czechoslovak«. С. Kason, ]. Kuta, Chalmers Mrersiry of Technology, Sweden. Structure Dependent Properties of Organic Field-Effect Transistors. ................................60 F. DeWfre, F. Garnier, R. Hop™, 6- Horowitz, P.Lmg.A.Yossar.CN.R.S.France. P. Alnot, S. Ite, В. Servet, Thomson CSF/ LCR, Fronce. Possibilities and Difficulties with the Use of Conductive Adhesives as Solder Replacement. .............................. <5S G. Luyckx, A. Von Den Bosh, Grace N.V, Belgiom. Environmental Performance of Conductive Adhesives Joints. ........................................75 1 Gemo, DIVWey.D.]. Mams, loughboraurjh. Univeraty of Technology, U.K. SESSION 1С THICK AND THIN FILM TECHNOLOGY Clramon: R. feel, Charles University, (жгккЫею. Thin Fi/m Technologies for High Density Active Matrix Addressed Displays. ..................84 1. De Boets, A.M. De Ceber, J. Capo«, A. Van Coter, H. De Smet, J. Vanfleteren, J. Farei, M. Westeott, ІШда Systems Conodo W, Congela. low Profife, High Frequency, Power Supplies Using Thick Film Manar Transformers. ..__....91 P. Єосгжєй, I lockson, Uimerstiy of nymauih, U.S. Advanced Thick Fib Materials for Multi-Chip Modules : Processing and Performance. .............................99 A. Berzins, J. Smythe, G. Shorthouse, Johnson tócÄev Technology, U.K. THICK AND THIN TECHNOLOGY (continued) Advanced Processing and Novel Applications of Hybrid Multilayer Green Tapes. ...........707 J. Bonsky, ). Engemonn, university ot Wuppertal, Germany. E.K. Polzer, DuPont Electronics Gmbh, Germany. D. Borttey, E .Cose, Michigan Stote Uimersiry, U.SA A Sealing Process for Printed-Through Hofes........715 K. Dröeke, Philips Kommui*atms Industrie AG, Gemmy. An Introduction to Thick Film Fine-line Printing Screens. ........723 B.P. Carr, Coors Euroscreen/Coors Ceramics Electronics Ltd, (U. SESSION ID 135 PRODUCT DEVELOPMENT Umrem: В. George, Technoompri Mkradrmts ltd, U.K. Solutions for the Printing and Handing of Co-Fired Ceramic Materials in Volume Manufacturing. ........................136 R.ukpatrick.Oek.Ult. Cost Effective Direct Packaging of Chip and Wire Hybrids. .......744 L faaeitnoyr, 1. Мав, M. Soita, Lewicki Mkroetectrorac Gmbh, Germany. ITCC- An Economical and Industrial Interconnect and Packaging Solution for MCM s. _____.....................750 i.W. Qcognce, Ou Pont us Невшѕ, Swfzedoni E. Polzer, Du Pont de Nemours, Germony. M. ttossiot, E. Percbois, Sorep, France. PRODUCT DEVELOPMENT [continued) Study of the Thermomechanical Problems in Hybrid Assemblies satisfying the Automotive Electronics Conditions. ..............158 11 Aucouturi«, E. Woitgord, C Zardmi, tornerai* ie Bouleaux 1, France. Silicon Sensors for Automotive Applications. ...........................166 J.P. Rouet, G. Grandjean, Sogem, France. Future Low Cost Electronics Packaging for Automotive Application ..............................174 G. Bonhomme, R. H Amans, P. Lewandowski, Siemens Automotive SA.Fronce. SESSION 2A! MCM PACKAGING. Chairman: t. Schippet, Hybnà Mkroeiectronies Design Support, the Nethedonds. Fabrication and Thermal Analysis of 3 tXmenskmatty located Ш Packages. ..............184 T. íshtóa, I. Miyano, S. Sakoguchi, К. Ышт, Hitachi ltd, Japan. M. УоггигЈо, Semiconductor Design I ond Bevsiopment Center, Hitachi ltd. Jopan. і I. Kudoishi, Hitachi VISI Engineering Corp, Jopan. MCM-L· Muhkhip on POs, : a Complementary Interconnect toMCM<andMCM-D | far Avionics Applications.. ........192 | G. Menozzi, Sextant Аиолкціе, France. і Advanced Multichip Module j Technologies. ...........................200 j A. Boumgarfner, W. Heck, Ü. Meier, H. Mier, J. ] Springer, Alcatel Sel, Germany. MCM PACKAGING (continued} Advanced Electronic Packaging in High Energy Physics. ------.....208 A. Bjomekletr, H. Månsen, H. íafjord, Center for Industrial Research, Norwoy. High-density Package, Cofíred, Multichip Module, 3D, a Mass Memory Mixed Technology for Space Applications. .................216 ».Mossemi, Mutra Marconi Space France, France. Qualification and Validation of a Process for Thin Film Muhkhip Module. ....................224 M. Akmo, G. Argooò, D. Aáert, M. Beudon, MJ. Boużd, С. Unisse, В. Jourdain, В. Imole, J.C. ОЬегііп, J. Pota, F. Tempte, J. Torres, CNET, France. Global Optimization ofMCMs wilh ASICs Using Concurrent Engineering.............................232 i.ř. Cozam«, G. toperfap, Dossourt EtectTonkjue, France. SESSION 2В SENSORS ChrJrman: R. M Acqua, Miteco, Haly. law-Cost Integrated Silicon Sensors for Industrial Applications. .......242 S. Ansermet, 1. Molan, D. Otter, F. Roboli, Ascom Mtooetaronks, Switzerland. App&oatkm of a New PÏÏ Temperature Sensor with a Switch-Over KR in Food Industry. ...................._______250 J.J. Sonde*. T.W. HoWank, Krata* Ш, Potad. Instated Metal Substrates for Thkk Fan Sensor Applications. __._____.___......261 D. Мой, P. Roto, A. Totani, Universita è Brescia, Italy. : SENSORS ¡continued) ; -A Thkk Film Resistor Circuit as a Prosthesis for Blind Persons. .......................__..___269 l De Bœrfer, M. to, G. De Mey, University oí . Ghent, Belgium. Hybrid Chemical and Physical Sensor Arrays. .........................277 Jl Atkinson, University of Southampton, U.K. Thick Film SO2 Sensor. ............289 I. Borycka, U. Golonka, G. Pástiak, The Technical University of Wrodntv, Poland. A New Heat Detector for High Volume Building Automation .............................296 M. Grönlund, К. Laiholuoto, H. Pohpnen, Technical Research Centre of Finland, Finland. SESSION 2C ADVANCED INTERCONNECTION Chairman: P. Wilhelm, Philips Kommunikations Ind AG, Germany. A Work/wide View of 3D Interconnection : Bare Chip Stacking/Package Stacking. .................................304 C. Vol, Thoroon-CSF, France. Surface Activated Bonding ond te Application to Microbonding at Room Temperature ............................314 T. Sugo, T. Fujiwnka, G. Sosaki, The University of Tokyo, Japon. Manufacturing Yield Forecasting in High Density VWre Bonding. .........................322 I MessrJ, X. ЅапШоЛ, M Я France. ADVANCED INTERCONNECTION (continued) Recent Developments m High Lead Count TAB Packaging. ..............................33 J RJ. Crowtey, EJ. Vardoman, Fľip -СЫр Bonding on Green Tape Ceramic Substrates. .........339 II Disfa, Siegelt Gmbh, Garnony. ІВоеиДШ, Е.Ш, TU Berin, Micropefipherics Center, Germany. Vi ! Wins Bumping Technology for Gokl and Solder Wire Bumping on I.C.Devices............357 j R.T. lee, W.H. lyrle, Т.Д. Schon, U. Shnrmo, Ï Motoroło SPS, U.S.A. SESSION ЗА 405 SESSION 2D 359 OPTOELECTRONICS AND MICROWAVE Chairman : M. Ciez, Research ond Development Centre for Hybtid Microelectronics, Pokmd. M.CM Technology Makes (he Miniatvrized Optical Er Doped Fiber Amplifier a Reality. .................................360 G. Delrosso, G. Grasso, G. Szota Miszenh , Pirelli Cmi SPA, lidy. Novel Techniques for tow Cost, High Performance, Optoelectronic Component Assembly. ................................368 I.P. Holi, BT Laboratories, U.K. Technology of Optical Thkk Films ...............................376 Is Keresztes-Nogy, G. Horsanyi. | Technical University of Budapest, Hungary. ; OPTOELECTRONICS AND I MICROWAVE (continued) Superminhhirized Double- Balanced Mixer-Modulator for SMTby Thick Film Print/Fire Process ....................................384 | У. Ando, У. Arai, M. flsawa, Taiset Co, ltd. Jopan. ¡MA Stein, T. Woda, I Eteclro-Sœnce Loborotories, Inc, U.SA I High-Freąuency Elements • and Components in Thkk-Film I Multilayer-Circuits. ...................392 j ti. Iter, Technical University Ilmenau, Genroiy. Gate and Mixed Hybrids Technologies in the Development j of Phase Shifter Arrays. ...........400 IE. Caiena, I Grate, A. Di Man*, U. Di j Marcantonio, Atenta Spazio, Italy. POWER HYBRIDS Chairmen: G. De Mey, (Stall University, Belgium. Application of Diamond in Power Device Modules .........406 B.FirçliOiWer.W.ffie.R.Kiihnerr, H. Schworzbaier, Siemens AG, Geimony. F. Koch, ТесЬпЫ University of Мили, Gemmy. R. Messer, University of Solfori, U.K. A High Performance Hermetic Direct Bond Copper Package. .................................414 M. Anderson, Brush Wdlman Соф, U.S.A. J. Dickson, 8. Pakrteer, J. Grobów, Tegmen top, U.SA Finite Element Analysis in the Design of a Power Converter. ...............................421 L AKwez-Borao, Cûuinones ile lo Guio, S. Ollera Vetasco, AkatcJ-Sesa, Spoin. Foil - Clips for Power Module Interconnects ............................431 H. Esrom, HJ. Krokoszinski, Aseo Brown Boveñ, Germany. Advanced Packaging Methods of Spacecraft Power Converters. ..............................439 H.K. Kim, Space Systems/loral, U.SA SESSION 3B RELIABILITY Chairman: G. Horsonyi, Technical University of Budapest, Hungary. Thin Film HDI for MCM Assessment of Behaviour Under Environment Tests. Qualitative Structure Analysis ....................452 J.P. Otoguet, G. Teissiei, Thomson Hybrides, Fronce. A. Belane, S. tose, Thomson CSf (ЅШ, France. Topo-Spke Programme for Electro - Thermal Analysis. .................................460 A. Kos, University of Mining and Metallurgy, PaiandjA Study of Crossover Failures A Study of Crossover Failures in Thick Film Multilayers ...........468 W. De Сеитск, J. toco, I.M. Stols, 1. Be Schepper, Limburg University Centre, Belgium. M.F. Boeket, WA Crag, CR. Pkksring, Ot) Pont ltd, U.K. Quality Assurance for Mvm chip Modules for AMI Techniques ...............................474 AJ. Bastet», I.W. Kessler, S.R. Matteil, J.E. Semmens, Sonoscan Ine, U.S.A. Design Approach to Reliable Microelectronic Packages .........484 M. Cushing, Ï. Hokim, M. Peét, Cake Electronic Pockoging Research Centet, University of Moiytond, U.S.A. PLENARY CLOSING SESSION : Chairman: Y. Le Goff, Vice^airman, 9th EHMC 493 Visions of Future in Mkroetectromcs : Advanced Products in Microfabrications ...............494 Praf. W. ВШ, Ins m fer Мгеївскй, Mainz, Gemmy. How Can Europe Succeed in Microekcironks? ...............495 R. Heikes, International Consultant, Fronce. 3D slide show. $ mskk of a H Mbitáips . IBM. Essaimes pbrr. Fronce. Congress Report. J. Joly, J. Gurnet, Technical Programme Committee. Best Paper Award. С Vol., Conference Programme. Student Award. H.Baudry, Universities liaison. Announcement of Ш EMC 1995. S. Notfyng, Miran 10* EHMC 1 995, ISHM Nordic. Closing Remarks. K. Kurarf, Chcromn, 9th EHMC. VII
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