Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1976,1. 9. Symposium ... Pt. 2, Physical applications ... , Pt. 3, Techniques for particulate matter ... , Pt. 4, Microelectronic device fabrication ... Apr. 5 - 9, 1976, Toronto.
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| Format: | Tagungsbericht Buch |
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| Sprache: | Undetermined |
| Veröffentlicht: |
Chicago, Ill.
1976
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Datensatz im Suchindex
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| spelling | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1976,1. 9. Symposium ... Pt. 2, Physical applications ... , Pt. 3, Techniques for particulate matter ... , Pt. 4, Microelectronic device fabrication ... Apr. 5 - 9, 1976, Toronto. Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* 1976 Chicago, Ill. txt rdacontent n rdamedia nc rdacarrier Johari, Om Sonstige oth Scanning Electron Microscope Symposium Sonstige (DE-588)2880-0 oth (DE-604)BV009381834 1976,1 |
| spellingShingle | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_auth | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_exact_search | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_full | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1976,1. 9. Symposium ... Pt. 2, Physical applications ... , Pt. 3, Techniques for particulate matter ... , Pt. 4, Microelectronic device fabrication ... Apr. 5 - 9, 1976, Toronto. Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_fullStr | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1976,1. 9. Symposium ... Pt. 2, Physical applications ... , Pt. 3, Techniques for particulate matter ... , Pt. 4, Microelectronic device fabrication ... Apr. 5 - 9, 1976, Toronto. Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_full_unstemmed | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1976,1. 9. Symposium ... Pt. 2, Physical applications ... , Pt. 3, Techniques for particulate matter ... , Pt. 4, Microelectronic device fabrication ... Apr. 5 - 9, 1976, Toronto. Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy proceedings of the annual scanning electron microscopy symposium |
| title_sub | Proceedings of the Annual Scanning Electron Microscopy Symposium |
| volume_link | (DE-604)BV009381834 |
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