On-the-fly circuit to measure the average working set size
Abstract: "We present two economic methods which estimate the average working set size of a program on the fly with a small constant amount of storage. Both methods are simple enough that they can be implemented inside a VLSI processor chip with small space requirements, or outside the chip to...
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Format: | Buch |
Sprache: | English |
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Urbana, Ill.
1990
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Schriftenreihe: | Center for Supercomputing Research and Development <Urbana, Ill.>: CSRD report
1095 |
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007 | t| | ||
008 | 940206s1990 xx |||| 00||| eng d | ||
035 | |a (OCoLC)26849193 | ||
035 | |a (DE-599)BVBBV009008729 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-29T | ||
100 | 1 | |a Yi, Kwangkeun |e Verfasser |4 aut | |
245 | 1 | 0 | |a On-the-fly circuit to measure the average working set size |c Kwangkeun Yi ; Luddy Harrison |
264 | 1 | |a Urbana, Ill. |c 1990 | |
300 | |a S. 471 - 475 | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Center for Supercomputing Research and Development <Urbana, Ill.>: CSRD report |v 1095 | |
500 | |a Aus: Proceedings of '90 IEEE International Conference on Computer Design: VLSI in Computers and Processors (1990) | ||
520 | 3 | |a Abstract: "We present two economic methods which estimate the average working set size of a program on the fly with a small constant amount of storage. Both methods are simple enough that they can be implemented inside a VLSI processor chip with small space requirements, or outside the chip to probe the memory reference traffic. The on-the-fly circuit tools that can estimate the average working set size of a program without much loss of accuracy makes unnecessary the problematic and expensive procedures (hardware monitoring or simulation) of collecting the reference traces | |
520 | 3 | |a Such tools can be used in all studies that require program locality measurements including the study of a program's locality, the effectiveness study of locality improvement techniques, and the study of [sic] optimizing compiler's effect on program locality. | |
650 | 4 | |a Software engineering | |
700 | 1 | |a Harrison, Luddy |e Verfasser |4 aut | |
830 | 0 | |a Center for Supercomputing Research and Development <Urbana, Ill.>: CSRD report |v 1095 |w (DE-604)BV008930033 |9 1095 | |
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-005955216 |
Datensatz im Suchindex
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any_adam_object | |
author | Yi, Kwangkeun Harrison, Luddy |
author_facet | Yi, Kwangkeun Harrison, Luddy |
author_role | aut aut |
author_sort | Yi, Kwangkeun |
author_variant | k y ky l h lh |
building | Verbundindex |
bvnumber | BV009008729 |
ctrlnum | (OCoLC)26849193 (DE-599)BVBBV009008729 |
format | Book |
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id | DE-604.BV009008729 |
illustrated | Not Illustrated |
indexdate | 2024-12-23T12:55:59Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005955216 |
oclc_num | 26849193 |
open_access_boolean | |
owner | DE-29T |
owner_facet | DE-29T |
physical | S. 471 - 475 |
publishDate | 1990 |
publishDateSearch | 1990 |
publishDateSort | 1990 |
record_format | marc |
series | Center for Supercomputing Research and Development <Urbana, Ill.>: CSRD report |
series2 | Center for Supercomputing Research and Development <Urbana, Ill.>: CSRD report |
spelling | Yi, Kwangkeun Verfasser aut On-the-fly circuit to measure the average working set size Kwangkeun Yi ; Luddy Harrison Urbana, Ill. 1990 S. 471 - 475 txt rdacontent n rdamedia nc rdacarrier Center for Supercomputing Research and Development <Urbana, Ill.>: CSRD report 1095 Aus: Proceedings of '90 IEEE International Conference on Computer Design: VLSI in Computers and Processors (1990) Abstract: "We present two economic methods which estimate the average working set size of a program on the fly with a small constant amount of storage. Both methods are simple enough that they can be implemented inside a VLSI processor chip with small space requirements, or outside the chip to probe the memory reference traffic. The on-the-fly circuit tools that can estimate the average working set size of a program without much loss of accuracy makes unnecessary the problematic and expensive procedures (hardware monitoring or simulation) of collecting the reference traces Such tools can be used in all studies that require program locality measurements including the study of a program's locality, the effectiveness study of locality improvement techniques, and the study of [sic] optimizing compiler's effect on program locality. Software engineering Harrison, Luddy Verfasser aut Center for Supercomputing Research and Development <Urbana, Ill.>: CSRD report 1095 (DE-604)BV008930033 1095 |
spellingShingle | Yi, Kwangkeun Harrison, Luddy On-the-fly circuit to measure the average working set size Center for Supercomputing Research and Development <Urbana, Ill.>: CSRD report Software engineering |
title | On-the-fly circuit to measure the average working set size |
title_auth | On-the-fly circuit to measure the average working set size |
title_exact_search | On-the-fly circuit to measure the average working set size |
title_full | On-the-fly circuit to measure the average working set size Kwangkeun Yi ; Luddy Harrison |
title_fullStr | On-the-fly circuit to measure the average working set size Kwangkeun Yi ; Luddy Harrison |
title_full_unstemmed | On-the-fly circuit to measure the average working set size Kwangkeun Yi ; Luddy Harrison |
title_short | On-the-fly circuit to measure the average working set size |
title_sort | on the fly circuit to measure the average working set size |
topic | Software engineering |
topic_facet | Software engineering |
volume_link | (DE-604)BV008930033 |
work_keys_str_mv | AT yikwangkeun ontheflycircuittomeasuretheaverageworkingsetsize AT harrisonluddy ontheflycircuittomeasuretheaverageworkingsetsize |