Proceedings of the 14th International Conference on Defects in Semiconductors Paris, France, August 18 - 22, 1986

Defects in semiconductors proceeding of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997

Theory of defects in semiconductors with 15 tables
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Defects in semiconductors
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Charged semiconductor defects structure, thermodynamics and diffusion
von: Seebauer, Edmund G., et al.
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Proceedings of the 22nd International Conference on Defects in Semiconductors ICDS-22 ; held in Aarhus, Denmark, 28 July - 1 August 2003
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Papers presented at the European Research Conference on Extended Defects in Semiconductors (7th International Symposium on Structure and Properties of Extended Defects in Semiconductors), Holzhau near Dresden (FRG), August 29 to September 3, 1992
Veröffentlicht: (1993)

Beam injection assessment of defects in semiconductors 2nd international Workshop Meudon-Bellevue, France, 15 - 18 July 1991
Veröffentlicht: (1992)

Beam injection assessment of defects in semiconductors 2nd International Workshop, Meudon-Bellevue, France 15 - 18 July 1991
Veröffentlicht: (1992)

Papers presented at the European Research Conference on Extended Defects in Semiconductors Holzhau near Dresden (FRG) August 29 to September 3, 1992
Veröffentlicht: (1993)

Gettering and defect engineering in semiconductor technology proceedings of the 4th international autumn meeting, held in Chossewitz, near Frankfurt (Oder), Germany, October 13 - 19 1991
Veröffentlicht: (1991)

Imperfections and active centres in semiconductors
von: Rhodes, René G.
Veröffentlicht: (1964)

Proceedings of the 3rd International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology Garzau, German Democratic Republic, October 8 - 13, 1989
Veröffentlicht: (1989)

Extended defects in semiconductors proceedings
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Extended defects in semiconductors electronic properties, device effects and structures
von: Holt, David B., et al.
Veröffentlicht: (2007)

Extended defects in semiconductors electronic properties, device effects and structures
von: Holt, David B., et al.
Veröffentlicht: (2007)

Dopants and defects in semiconductors
von: McCluskey, Matthew D., et al.
Veröffentlicht: (2020)

Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Batz-sur-Mer, France, September 29 - October 2, 2003
Veröffentlicht: (2004)

Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA
Veröffentlicht: (1985)

Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA
Veröffentlicht: (1985)

Defect recognition and image processing in semiconductors 1997 proceedings of the Seventh International Conference on Defect Recognition and Image Processing in Semicondictors (DRIP VII) held in Templin, Germany, 7 - 10 Septemer 1997
Veröffentlicht: (1998)

Containing papers presented at the 4th International Workshop on Beam Injection Assessment of Defects in Semiconductors, BIADS '96 3 - 6 june 1996, Escorial, Spain
Veröffentlicht: (1996)

Beam injection assessment of defects in semiconductors international workshop, Meudon-Bellevue, France, 18-19-20 July 1988
Veröffentlicht: (1989)

Defects in nanocrystals structural and physico-chemical aspects
von: Pizzini, Sergio
Veröffentlicht: (2020)

Proceedings of the 14th International Conference on Defects in Semiconductors ICDS-14 ; Paris, France, August 18-22, 1986

Proceedings of the 3. International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology
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Defect recognition in semiconductors before and after processing proceedings of the fourth International Conference ; Wilmslow, UK, 18 - 22 March 1991
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Chemistry and defects in semiconductor heterostructures symposium held April 24 - 27, 1989, San Diego, California, USA
Veröffentlicht: (1989)

Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000
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Lattice Defects in Semiconductors, 1974 invited and contributed papers from the International Conference on Lattice Defects in Semiconductors, held in Freiburg, 22-25 July 1974
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Točečnye defekty v poluprovodnikovych soedinenijach
von: Sakalas, Aloizas P., et al.
Veröffentlicht: (1988)

Thirteenth International Conference on Defects in Semiconductors proceedings of the 13th Internat. Conference on Defects in Semiconductors ... ; held at Coronado, Calif., Aug. 12 - 17, 1984
Veröffentlicht: (1985)

Gettering and defect engineering in the semiconductor technology proceedings of the 3rd International Autumn Meeting ... GADEST '89 ; Garzau, German Democratic Republic, October 8 - 13, 1989
Veröffentlicht: (1989)

Defect engineering in semiconductor growth, processing and device technology symposium held April 26 - May 1, 1992, San Francisco, California, U.S.A.
Veröffentlicht: (1992)

Defect Complexes in Semiconductor Structures Proceedings of the International School Held in Mátrafüred, Hungary September 13–17, 1982
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Chaos and stability in defect processes in semiconductors
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Defect interaction and clustering in semiconductors
Veröffentlicht: (2002)