Imperfections and impurities in semiconductor silicon
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| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York
Wiley
1981
|
| Schriftenreihe: | A Wiley-interscience publication.
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| Schlagworte: | |
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| 245 | 1 | 0 | |a Imperfections and impurities in semiconductor silicon |
| 264 | 1 | |a New York |b Wiley |c 1981 | |
| 300 | |a XIV, 379 S. |b Ill., graph. Darst. | ||
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| 490 | 0 | |a A Wiley-interscience publication. | |
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Datensatz im Suchindex
| DE-BY-TUM_call_number | 0001/82 A 94 |
|---|---|
| DE-BY-TUM_katkey | 369364 |
| DE-BY-TUM_media_number | 040001398656 |
| _version_ | 1816711473935679489 |
| any_adam_object | |
| author | Ravi, Kramadhati V. |
| author_facet | Ravi, Kramadhati V. |
| author_role | aut |
| author_sort | Ravi, Kramadhati V. |
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| bvnumber | BV002268632 |
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| classification_rvk | UP 3100 |
| ctrlnum | (OCoLC)6735454 (DE-599)BVBBV002268632 |
| dewey-full | 537.6/22 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/22 |
| dewey-search | 537.6/22 |
| dewey-sort | 3537.6 222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV002268632 |
| illustrated | Illustrated |
| indexdate | 2024-11-25T17:10:36Z |
| institution | BVB |
| isbn | 0471078174 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001490650 |
| oclc_num | 6735454 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-29T DE-11 |
| owner_facet | DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-29T DE-11 |
| physical | XIV, 379 S. Ill., graph. Darst. |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley-interscience publication. |
| spellingShingle | Ravi, Kramadhati V. Imperfections and impurities in semiconductor silicon Semiconductors Defects Silicon Defects Siliciumhalbleiter (DE-588)4274465-9 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleitertechnologie (DE-588)4158814-9 gnd Silicium (DE-588)4077445-4 gnd |
| subject_GND | (DE-588)4274465-9 (DE-588)4125030-8 (DE-588)4158814-9 (DE-588)4077445-4 |
| title | Imperfections and impurities in semiconductor silicon |
| title_auth | Imperfections and impurities in semiconductor silicon |
| title_exact_search | Imperfections and impurities in semiconductor silicon |
| title_full | Imperfections and impurities in semiconductor silicon |
| title_fullStr | Imperfections and impurities in semiconductor silicon |
| title_full_unstemmed | Imperfections and impurities in semiconductor silicon |
| title_short | Imperfections and impurities in semiconductor silicon |
| title_sort | imperfections and impurities in semiconductor silicon |
| topic | Semiconductors Defects Silicon Defects Siliciumhalbleiter (DE-588)4274465-9 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleitertechnologie (DE-588)4158814-9 gnd Silicium (DE-588)4077445-4 gnd |
| topic_facet | Semiconductors Defects Silicon Defects Siliciumhalbleiter Gitterbaufehler Halbleitertechnologie Silicium |
| work_keys_str_mv | AT ravikramadhativ imperfectionsandimpuritiesinsemiconductorsilicon |