Reflection high-energy electron diffraction and reflection electron imaging of surfaces [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987]
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Format: | Tagungsbericht Buch |
Sprache: | English |
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New York [u.a.]
Plenum Press
1988
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Schriftenreihe: | NATO ASI series
Series B, Physics ; 188 |
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245 | 1 | 0 | |a Reflection high-energy electron diffraction and reflection electron imaging of surfaces |b [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] |c ed. by P. K. Larsen ... |
264 | 1 | |a New York [u.a.] |b Plenum Press |c 1988 | |
300 | |a XIII, 541 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
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490 | 1 | |a NATO ASI series : Series B, Physics |v 188 | |
650 | 7 | |a Surfaces (physique) - Technique |2 ram | |
650 | 4 | |a Reflection electron microscopy |v Congresses | |
650 | 4 | |a Reflection high energy electron diffraction |v Congresses | |
650 | 4 | |a Surfaces (Physics) |x Technique |v Congresses | |
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700 | 1 | |a Larsen, P. K. |4 edt | |
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Datensatz im Suchindex
DE-BY-TUM_call_number | 0280 B.18.K.57 |
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DE-BY-TUM_katkey | 121990 |
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adam_text | REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION AND REFLECTION ELECTRON
IMAGING OF SURFACES 4 * EDITED BY IS P. K. LARSEN PHILIPS RESEARCH
LABORATORIES EINDHOVEN, THE NETHERLANDS AND P. J. DOBSON PHILIPS
RESEARCH LABORATORIES REDHILL, UNITED KINGDOM PLENUM PRESS NEW YORK AND
LONDON PUBLISHED IN COOPERATION WITH NATO SCIENTIFIC AFFAIRS DIVISION
CONTENTS SURFACE STRUCTURAL DETERMINATION EXPERIMENTAL EXPERIMENTAL
OVERVIEW OF SURFACE STRUCTURE DETERMINATION BY RHEED S. INO 3 THEORY *]
SURFACE STRUCTURAL DETERMINATION USING RHEED J.L. BEEBY 29 THEORY OF
RHEED BY RECONSTRUCTED SURFACES M.G. KNIBB AND P.A. MAKSYM 43 ACCURATE
DYNAMICAL THEORY FOR RHEED ROCKING-CURVE INTENSITY SPECTRA S.Y. TONG,
T.C. ZHAO AND H.C. POON 63 (^ INELASTIC EFFECTS INELASTIC SCATTERING
EFFECTS IN RHEED AND REFLECTION IMAGING A.L. BLELOCH, A. HOWIE, R.H.
MILNE AND M.G. WALLS 77 EXCITATION OF DIELECTRIC SPHERES BY ELECTRON
BEAMS P.M. ECHENIQUE 91 RESONANCE AND CHANNELING EFFECTS RESONANCE
EFFECTS IN RHEED G. MEYER-EHMSEN 99 INELASTIC SCATTERING AND SECONDARY
ELECTRON EMISSION UNDER RESONANCE CONDITIONS IN RHEED FROM PT(LLL) H.
MARTEN 109 ADATOM SITE DETERMINATION USING CHANNELING EFFECTS IN RHEED
ON X-RAY AND AUGER ELECTRON PRODUCTION J.C.H. SPENCE AND Y. KIM 117 A
NOTE ON THE BLOCH WAVE AND INTEGRAL FORMULATIONS OF RHEED THEORY JON
GJ^NNES 131 DISORDERS AND STEPS IN ELECTRON DIFFRACTION DIFFRACTION FROM
DISORDERED SURFACES: AN OVERVIEW M.G. LAGALLY, D.E. SAVAGE AND M.C.
TRINGIDES 139 THEORY OF ELECTRON SCATTERING FROM DEFECT: STEPS ON
SURFACES WITH NON-EQUIVALENT TERRACES W. MORITZ 175 DIFFRACTION FROM
STEPPED SURFACES M. HENZLER 193 RHEED AND DISORDERED SURFACES B. BOEIGER,
P.*. LARSEN AND G. MEYER EHMSEN 201 TEMPERATURE DIFFUSE SCATTERING IN
RHEED M. ALBRECHT AND G. MEYER-EHMSEN 211 TEMPERATURE DEPENDENCE OF THE
SURFACE DISORDER ON GE(001) DUE TO AR ION BOMBARDMENT A.J. HOEVEN,
J.S.C. KOOLS, J. AARTS AND P.C. ZALM 217 TWO-DIMENSIONAL FIRST-ORDER
PHASE SEPARATION IN AN EPITAXIAL LAYER T.-M. LU AND S.-N. YANG 225
CONVERGENT BEAM DIFFRACTION SURFACE CONVERGENT-BEAM DIFFRACTION FOR
CHARACTERIZATION AND SYMMETRY DETERMINATION J.A. EADES AND M.D. SHANNON
237 CONVERGENT BEAM RHEED CALCULATIONS USING THE SURFACE PARALLEL
MULTISLICE APPROACH A.E. SMITH 251 REFLECTION ELECTRON MICROSCOPY USING
CONVENTIONAL INSTRUMENTS REFLECTION ELECTRON MICROSCOPY IN *** AND STEM
INSTRUMENTS J.M. COWLEY 261 REFLECTION ELECTRON MICROSCOPY WITH USE OF
CTEM: STUDIES OF AU GROWTH ON PT(LLL) K. YAGI, S. OGAWA AND Y. TANISHIRO
285 APPLICATION OF REFLECTION ELECTRON MICROSCOPY FOR SURFACE SCIENCE
(OBSERVATION OF CLEANED CRYSTAL SURFACES OF SI, PT, AU AND AG) Y. UCHIDA
303 REFLECTION MICROSCOPY IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE
R.H. MILNE 317 CONTRAST OF SURFACE STEPS AND DISLOCATIONS UNDER
RESONANCE, NON- RESONANCE, BRAGG, AND NON-BRAGG CONDITIONS TUNG HSU AND
L.-M. PENG 329 MICROPROBE RHEED MICROPROBE REFLECTION HIGH-ENERGY
ELECTRON DIFFRACTION M. ICHIKAWA AND T. DOI 343 SCANNING RHEED STUDIES
OF SILICIDE FORMATION IN A UHV-SEM P.A. BENNETT AND A.P. JOHNSON 371 LOW
ENERGY INSTRUMENTS LOW ENERGY ELECTRON REFLECTION MICROSCOPY (LEEM) AND
ITS APPLICATION TO THE STUDY OF SI SURFACES E. BAUER AND W. TELIEPS 381
LOW ENERGY SCANNING ELECTRON MICROSCOPE T. ICHINOKAWA 385 ELECTRON
DIFFRACTION STUDIES OF GROWTH SEMICONDUCTORS RHEED INTENSITY
OSCILLATIONS DURING MBE GROWTH OF III-V COMPOUNDS - AN OVERVIEW B.A.
JOYCE, J.H. NEAVE, J. ZHANG AND P.J. DOBSON 397 RHEED OSCILLATIONS
CONTROL OF GAAS AND ALAS MBE GROWTH USING PHASE- LOCK MODULATED BEAMS F.
BRIONES, L. GONZALEZ AND J.A. VELA 419 THE CONTRIBUTION OF ATOMIC STEPS
TO REFLECTION HIGH ENERGY ELECTRON DIFFRACTION FROM SEMICONDUCTOR
SURFACES P.R. PUKITE, P.I. COHEN AND S. BATRA 427 * J RHEED STUDIES OF
GROWING GE AND SI SURFACES J. AARTS AND P.K. LARSEN 449 A / LEED
INVESTIGATIONS OF SI MBE ONTO SI(100) M. HORN, U. GOETTER AND M. HENZLER
463 METALS QUANTITATIVE STUDIES OF THE GROWTH OF METALS ON GAAS(110)
USING RHEED D.E. SAVAGE AND M.G. LAGALLY 475 RHEED INTENSITY
OSCILLATIONS IN METAL EPITAXY G. LILIENKAMP, *. KOZIOL AND E. BAUER 489
THEORY CALCULATION OF RHEED INTENSITY FROM GROWING SURFACES T. KAWAMURA
501 STUDIES OF GROWTH KINETICS ON SURFACES WITH DIFFRACTION M.C.
TRINGIDES AND M.G. LAGALLY 523 INDEX 539
|
any_adam_object | 1 |
author2 | Larsen, P. K. |
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building | Verbundindex |
bvnumber | BV001780436 |
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ctrlnum | (OCoLC)18463066 (DE-599)BVBBV001780436 |
dewey-full | 530.4/1 |
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dewey-ones | 530 - Physics |
dewey-raw | 530.4/1 |
dewey-search | 530.4/1 |
dewey-sort | 3530.4 11 |
dewey-tens | 530 - Physics |
discipline | Physik |
format | Conference Proceeding Book |
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genre | (DE-588)1071861417 Konferenzschrift 1987 Veldhoven gnd-content |
genre_facet | Konferenzschrift 1987 Veldhoven |
id | DE-604.BV001780436 |
illustrated | Illustrated |
indexdate | 2024-12-23T10:24:12Z |
institution | BVB |
institution_GND | (DE-588)5003265-3 |
isbn | 0306430355 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001200031 |
oclc_num | 18463066 |
open_access_boolean | |
owner | DE-12 DE-384 DE-355 DE-BY-UBR DE-20 DE-29T DE-91G DE-BY-TUM DE-703 DE-83 DE-11 DE-188 |
owner_facet | DE-12 DE-384 DE-355 DE-BY-UBR DE-20 DE-29T DE-91G DE-BY-TUM DE-703 DE-83 DE-11 DE-188 |
physical | XIII, 541 S. Ill., graph. Darst. |
publishDate | 1988 |
publishDateSearch | 1988 |
publishDateSort | 1988 |
publisher | Plenum Press |
record_format | marc |
series | NATO ASI series |
series2 | NATO ASI series : Series B, Physics |
spellingShingle | Reflection high-energy electron diffraction and reflection electron imaging of surfaces [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] NATO ASI series Surfaces (physique) - Technique ram Reflection electron microscopy Congresses Reflection high energy electron diffraction Congresses Surfaces (Physics) Technique Congresses RHEED (DE-588)4295703-5 gnd Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
subject_GND | (DE-588)4295703-5 (DE-588)4295699-7 (DE-588)4127823-9 (DE-588)1071861417 |
title | Reflection high-energy electron diffraction and reflection electron imaging of surfaces [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] |
title_auth | Reflection high-energy electron diffraction and reflection electron imaging of surfaces [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] |
title_exact_search | Reflection high-energy electron diffraction and reflection electron imaging of surfaces [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] |
title_full | Reflection high-energy electron diffraction and reflection electron imaging of surfaces [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] ed. by P. K. Larsen ... |
title_fullStr | Reflection high-energy electron diffraction and reflection electron imaging of surfaces [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] ed. by P. K. Larsen ... |
title_full_unstemmed | Reflection high-energy electron diffraction and reflection electron imaging of surfaces [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] ed. by P. K. Larsen ... |
title_short | Reflection high-energy electron diffraction and reflection electron imaging of surfaces |
title_sort | reflection high energy electron diffraction and reflection electron imaging of surfaces proceedings of a nato arw held in veldhoven the netherlands june 15 19 1987 |
title_sub | [proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987] |
topic | Surfaces (physique) - Technique ram Reflection electron microscopy Congresses Reflection high energy electron diffraction Congresses Surfaces (Physics) Technique Congresses RHEED (DE-588)4295703-5 gnd Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
topic_facet | Surfaces (physique) - Technique Reflection electron microscopy Congresses Reflection high energy electron diffraction Congresses Surfaces (Physics) Technique Congresses RHEED Reflexionselektronenmikroskopie Festkörperoberfläche Konferenzschrift 1987 Veldhoven |
url | https://www.gbv.de/dms/ilmenau/toc/042069262.PDF http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001200031&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
volume_link | (DE-604)BV005876464 |
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