Synergistic Performance of MoS2/In0.53Ga0.47As Staggered Heterojunction for Broadband Optoelectronics
MoS2, a 2D transition metal dichalcogenide, has received significant attention for next‐generation electrical and optical devices due to its excellent optical and electrical properties, including high electron mobility and a direct bandgap. Beyond conventional 2D‐based device architectures, the expl...
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Veröffentlicht in: | physica status solidi (b) 2024-07, Vol.261 (7), p.n/a |
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Sprache: | eng |
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Zusammenfassung: | MoS2, a 2D transition metal dichalcogenide, has received significant attention for next‐generation electrical and optical devices due to its excellent optical and electrical properties, including high electron mobility and a direct bandgap. Beyond conventional 2D‐based device architectures, the exploration of 2D and bulk (3D) heterojunctions has revealed unique electronic performance in 2D and structural stability in 3D. III–V semiconductors such as InGaxAs1−x have a direct bandgap with a broad tunability range (i.e., 0.35–1.4 eV), offering an ideal choice for optoelectronic applications. Herein, a type‐II staggered heterojunction between p‐type MoS2 and n‐type In0.53Ga0.47As is demonstrated. The p‐MoS2/n‐In0.53Ga0.47As heterostructure shows the photoresponsivity in the wavelength range from 400 to 1700 nm with typical rectifying diode characteristics. These results highligh the potential of the p‐MoS2/n‐In0.53Ga0.47As heterostructure for high‐performance devices, opening avenues for diverse applications.
MoS2, a 2D transition metal dichalcogenide, garners attention for advanced electrical and optical devices due to its exceptional properties. Combining 2D and 3D materials like III–V semiconductors (e.g., InGaxAs1−x) yields versatile optoelectronic applications. A type‐II staggered heterojunction between p‐MoS2 and n‐In0.53Ga0.47As shows photoresponsivity across a wide spectrum (400–1700 nm) with diode‐like behavior. |
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ISSN: | 0370-1972 1521-3951 |
DOI: | 10.1002/pssb.202300343 |