Embedded Flash and EEPROM for Smart IoT
Embedded Flash memory and electrically erasable programmable read only memory (EEPROM) have been developed for most of the Internet of Things' (IoT's) applications. Many of these embedded nonvolatile memories are available from the various foundries for logic integrated circuits (ICs). Thi...
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description | Embedded Flash memory and electrically erasable programmable read only memory (EEPROM) have been developed for most of the Internet of Things' (IoT's) applications. Many of these embedded nonvolatile memories are available from the various foundries for logic integrated circuits (ICs). This chapter first covers single polysilicon CMOS logic process‐compatible floating gate Flash and EEPROM. Embedded Flash cells can be made using only the CMOS logic transistors that exist in the standard CMOS process without process changes. Logic eNVM is commonly substituted for embedded Flash due to a faster time to market, logic compatibility, and the cost effectiveness of power management for multiple‐time programmable (MTP) solutions. The 5 T eFlash memory cell structure was the most attractive option for logic‐compatible eNVM. Embedded charge trapping memories are in production at several manufacturers and the technology is also widely expected to be used in standalone vertical memories. The chapter discusses production examples followed by technology development. |
doi_str_mv | 10.1002/9781119298922.ch3 |
format | Book Chapter |
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Many of these embedded nonvolatile memories are available from the various foundries for logic integrated circuits (ICs). This chapter first covers single polysilicon CMOS logic process‐compatible floating gate Flash and EEPROM. Embedded Flash cells can be made using only the CMOS logic transistors that exist in the standard CMOS process without process changes. Logic eNVM is commonly substituted for embedded Flash due to a faster time to market, logic compatibility, and the cost effectiveness of power management for multiple‐time programmable (MTP) solutions. The 5 T eFlash memory cell structure was the most attractive option for logic‐compatible eNVM. Embedded charge trapping memories are in production at several manufacturers and the technology is also widely expected to be used in standalone vertical memories. The chapter discusses production examples followed by technology development.</description><identifier>ISBN: 1119296358</identifier><identifier>ISBN: 9781119296355</identifier><identifier>EISBN: 9781119296409</identifier><identifier>EISBN: 1119296404</identifier><identifier>EISBN: 9781119298922</identifier><identifier>EISBN: 111929892X</identifier><identifier>DOI: 10.1002/9781119298922.ch3</identifier><identifier>OCLC: 1028607156</identifier><identifier>LCCallNum: TK7895.M4 .P756 2018</identifier><language>eng</language><publisher>United Kingdom: John Wiley & Sons, Incorporated</publisher><subject>CMOS process ; embedded EEPROM ; embedded Flash memory ; floating gate embedded Flash ; logic integrated circuits ; logic‐compatible eNVM ; polysilicon CMOS logic transistors ; smart IoT ; split gate technology</subject><ispartof>Memories for the Intelligent Internet of Things, 2018, p.89-168</ispartof><rights>2018 John Wiley & Sons Ltd.</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://ebookcentral.proquest.com/covers/5352674-l.jpg</thumbnail><link.rule.ids>779,780,784,793,27925</link.rule.ids></links><search><contributor>Prince, David</contributor><contributor>Prince, Betty</contributor><creatorcontrib>Prince, David</creatorcontrib><creatorcontrib>Prince, Betty</creatorcontrib><title>Embedded Flash and EEPROM for Smart IoT</title><title>Memories for the Intelligent Internet of Things</title><description>Embedded Flash memory and electrically erasable programmable read only memory (EEPROM) have been developed for most of the Internet of Things' (IoT's) applications. Many of these embedded nonvolatile memories are available from the various foundries for logic integrated circuits (ICs). This chapter first covers single polysilicon CMOS logic process‐compatible floating gate Flash and EEPROM. Embedded Flash cells can be made using only the CMOS logic transistors that exist in the standard CMOS process without process changes. Logic eNVM is commonly substituted for embedded Flash due to a faster time to market, logic compatibility, and the cost effectiveness of power management for multiple‐time programmable (MTP) solutions. The 5 T eFlash memory cell structure was the most attractive option for logic‐compatible eNVM. Embedded charge trapping memories are in production at several manufacturers and the technology is also widely expected to be used in standalone vertical memories. The chapter discusses production examples followed by technology development.</description><subject>CMOS process</subject><subject>embedded EEPROM</subject><subject>embedded Flash memory</subject><subject>floating gate embedded Flash</subject><subject>logic integrated circuits</subject><subject>logic‐compatible eNVM</subject><subject>polysilicon CMOS logic transistors</subject><subject>smart IoT</subject><subject>split gate technology</subject><isbn>1119296358</isbn><isbn>9781119296355</isbn><isbn>9781119296409</isbn><isbn>1119296404</isbn><isbn>9781119298922</isbn><isbn>111929892X</isbn><fulltext>true</fulltext><rsrctype>book_chapter</rsrctype><creationdate>2018</creationdate><recordtype>book_chapter</recordtype><recordid>eNpVj09Lw0AQxVdEUWs-gLfcPLXOzP4_SklroVLReg6b3S1V06ZmI-K3N6VF8PAY3oP3hh9jNwgjBKA7qw0iWrLGEo38mp-w7C9TAuwpuzoaLs15b4CMAo1SXbAspXcAQGvBKH7JbotNFUOIIZ_ULq1ztw15UTw9Lx7zVdPmLxvXdvmsWV6zs5WrU8yOd8BeJ8Vy_DCcL6az8f18uENNfKg89-QrdP23VTTAFRdWoIsUvBJGaGGktuCkjxi0A1lpDMShIpKBCPiA4WH3-62OP2WsmuYjlQjlHr38h1726Hv1HXHo7Nrm8yum7lDzcdu1rvZrt-tim0rJJSkt-iXZi_Nfi5xYYw</recordid><startdate>2018</startdate><enddate>2018</enddate><creator>Prince, David</creator><creator>Prince, Betty</creator><general>John Wiley & Sons, Incorporated</general><general>John Wiley & Sons, Ltd</general><scope>FFUUA</scope></search><sort><creationdate>2018</creationdate><title>Embedded Flash and EEPROM for Smart IoT</title><author>Prince, David ; Prince, Betty</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p1723-6c3c2cb1a715fe803634941ae2dc64847485790a5ce1d7a05b71d230b225d2203</frbrgroupid><rsrctype>book_chapters</rsrctype><prefilter>book_chapters</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CMOS process</topic><topic>embedded EEPROM</topic><topic>embedded Flash memory</topic><topic>floating gate embedded Flash</topic><topic>logic integrated circuits</topic><topic>logic‐compatible eNVM</topic><topic>polysilicon CMOS logic transistors</topic><topic>smart IoT</topic><topic>split gate technology</topic><toplevel>online_resources</toplevel><creatorcontrib>Prince, David</creatorcontrib><creatorcontrib>Prince, Betty</creatorcontrib><collection>ProQuest Ebook Central - Book Chapters - Demo use only</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Prince, David</au><au>Prince, Betty</au><au>Prince, David</au><au>Prince, Betty</au><format>book</format><genre>bookitem</genre><ristype>CHAP</ristype><atitle>Embedded Flash and EEPROM for Smart IoT</atitle><btitle>Memories for the Intelligent Internet of Things</btitle><date>2018</date><risdate>2018</risdate><spage>89</spage><epage>168</epage><pages>89-168</pages><isbn>1119296358</isbn><isbn>9781119296355</isbn><eisbn>9781119296409</eisbn><eisbn>1119296404</eisbn><eisbn>9781119298922</eisbn><eisbn>111929892X</eisbn><abstract>Embedded Flash memory and electrically erasable programmable read only memory (EEPROM) have been developed for most of the Internet of Things' (IoT's) applications. Many of these embedded nonvolatile memories are available from the various foundries for logic integrated circuits (ICs). This chapter first covers single polysilicon CMOS logic process‐compatible floating gate Flash and EEPROM. Embedded Flash cells can be made using only the CMOS logic transistors that exist in the standard CMOS process without process changes. Logic eNVM is commonly substituted for embedded Flash due to a faster time to market, logic compatibility, and the cost effectiveness of power management for multiple‐time programmable (MTP) solutions. The 5 T eFlash memory cell structure was the most attractive option for logic‐compatible eNVM. Embedded charge trapping memories are in production at several manufacturers and the technology is also widely expected to be used in standalone vertical memories. The chapter discusses production examples followed by technology development.</abstract><cop>United Kingdom</cop><pub>John Wiley & Sons, Incorporated</pub><doi>10.1002/9781119298922.ch3</doi><oclcid>1028607156</oclcid><tpages>80</tpages></addata></record> |
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subjects | CMOS process embedded EEPROM embedded Flash memory floating gate embedded Flash logic integrated circuits logic‐compatible eNVM polysilicon CMOS logic transistors smart IoT split gate technology |
title | Embedded Flash and EEPROM for Smart IoT |
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