COMPOSITION DEPENDENT TRANSPORT-PROPERTIES OF STRAIN RELAXED INXGA1-XAS(X-LESS-THAN-OR-EQUAL-TO-0.45) EPILAYERS
The concentration and mobility of the two-dimensional electron gas present at the interface between strain-relaxed, lattice matched, InyAl1-yAs/InxGa1-xAs(x < 0.45), modulation doped heterojunctions grown by means of compositionally step-graded buffer layers on GaAs substrates, were measured at r...
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Veröffentlicht in: | Applied physics letters 1992-08, Vol.61 (9), p.1116-1118 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng ; jpn |
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