Low-energy intense pulsed light annealing of InZnO sol-gel films via employment of a resonant absorber
A resonant absorber enables low-temperature sintering of InZnO sol-gel films with low-energy-density intense pulse light (IPL) irradiation (1J/pulse). A back-gate structure, incorporated with a resonant absorber, exhibits effective light absorption. A device fabricated based on such a gate structure...
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Veröffentlicht in: | Applied physics letters 2021-09, Vol.119 (13), Article 132102 |
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creator | Cho, Minwoo Song, Kyeong-Youn Cho, Kwan Hyun Lee, Hoo-Jeong |
description | A resonant absorber enables low-temperature sintering of InZnO sol-gel films with low-energy-density intense pulse light (IPL) irradiation (1J/pulse). A back-gate structure, incorporated with a resonant absorber, exhibits effective light absorption. A device fabricated based on such a gate structure and sintered with irradiation of 50 pulses (similar to 50J/cm(2)) demonstrates good electrical properties with a mobility of 0.34cm(2)/Vs and an on-off ratio of 10(6) and a substrate temperature under 210 degrees C, showcasing that employing a resonant absorber could enable low-temperature sintering of sol-gel films with low-energy-density irradiation. Further x-ray photoelectron spectroscopy analysis of the oxygen and nitrogen peaks indicates that IPL irradiation facilitated sol-gel reactions in films. Published under an exclusive license by AIP Publishing. |
doi_str_mv | 10.1063/5.0060061 |
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A back-gate structure, incorporated with a resonant absorber, exhibits effective light absorption. A device fabricated based on such a gate structure and sintered with irradiation of 50 pulses (similar to 50J/cm(2)) demonstrates good electrical properties with a mobility of 0.34cm(2)/Vs and an on-off ratio of 10(6) and a substrate temperature under 210 degrees C, showcasing that employing a resonant absorber could enable low-temperature sintering of sol-gel films with low-energy-density irradiation. Further x-ray photoelectron spectroscopy analysis of the oxygen and nitrogen peaks indicates that IPL irradiation facilitated sol-gel reactions in films. Published under an exclusive license by AIP Publishing.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/5.0060061</identifier><language>eng</language><publisher>MELVILLE: AIP Publishing</publisher><subject>Physical Sciences ; Physics ; Physics, Applied ; Science & Technology</subject><ispartof>Applied physics letters, 2021-09, Vol.119 (13), Article 132102</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>true</woscitedreferencessubscribed><woscitedreferencescount>1</woscitedreferencescount><woscitedreferencesoriginalsourcerecordid>wos000753139300001</woscitedreferencesoriginalsourcerecordid><cites>FETCH-webofscience_primary_0007531393000013</cites><orcidid>0000-0002-3795-6554 ; 0000-0003-2567-3749</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,781,785,27929,27930,39263</link.rule.ids></links><search><creatorcontrib>Cho, Minwoo</creatorcontrib><creatorcontrib>Song, Kyeong-Youn</creatorcontrib><creatorcontrib>Cho, Kwan Hyun</creatorcontrib><creatorcontrib>Lee, Hoo-Jeong</creatorcontrib><title>Low-energy intense pulsed light annealing of InZnO sol-gel films via employment of a resonant absorber</title><title>Applied physics letters</title><addtitle>APPL PHYS LETT</addtitle><description>A resonant absorber enables low-temperature sintering of InZnO sol-gel films with low-energy-density intense pulse light (IPL) irradiation (1J/pulse). A back-gate structure, incorporated with a resonant absorber, exhibits effective light absorption. A device fabricated based on such a gate structure and sintered with irradiation of 50 pulses (similar to 50J/cm(2)) demonstrates good electrical properties with a mobility of 0.34cm(2)/Vs and an on-off ratio of 10(6) and a substrate temperature under 210 degrees C, showcasing that employing a resonant absorber could enable low-temperature sintering of sol-gel films with low-energy-density irradiation. Further x-ray photoelectron spectroscopy analysis of the oxygen and nitrogen peaks indicates that IPL irradiation facilitated sol-gel reactions in films. 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A back-gate structure, incorporated with a resonant absorber, exhibits effective light absorption. A device fabricated based on such a gate structure and sintered with irradiation of 50 pulses (similar to 50J/cm(2)) demonstrates good electrical properties with a mobility of 0.34cm(2)/Vs and an on-off ratio of 10(6) and a substrate temperature under 210 degrees C, showcasing that employing a resonant absorber could enable low-temperature sintering of sol-gel films with low-energy-density irradiation. Further x-ray photoelectron spectroscopy analysis of the oxygen and nitrogen peaks indicates that IPL irradiation facilitated sol-gel reactions in films. Published under an exclusive license by AIP Publishing.</abstract><cop>MELVILLE</cop><pub>AIP Publishing</pub><doi>10.1063/5.0060061</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-3795-6554</orcidid><orcidid>https://orcid.org/0000-0003-2567-3749</orcidid></addata></record> |
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subjects | Physical Sciences Physics Physics, Applied Science & Technology |
title | Low-energy intense pulsed light annealing of InZnO sol-gel films via employment of a resonant absorber |
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