Flexible time reduction method for burn‐in of high‐quality products
Burn‐in is an effective method to screen out early failures of electronic devices. Typically, this is achieved by operating the devices under accelerated stress conditions. This paper focuses on a burn‐in concept where a random sample of devices is drawn out of the running production, put to burn‐in...
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Veröffentlicht in: | Quality and reliability engineering international 2021-10, Vol.37 (6), p.2900-2915 |
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Format: | Artikel |
Sprache: | eng |
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