Flexible time reduction method for burn‐in of high‐quality products

Burn‐in is an effective method to screen out early failures of electronic devices. Typically, this is achieved by operating the devices under accelerated stress conditions. This paper focuses on a burn‐in concept where a random sample of devices is drawn out of the running production, put to burn‐in...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Quality and reliability engineering international 2021-10, Vol.37 (6), p.2900-2915
Hauptverfasser: Kurz, Daniel, Lewitschnig, Horst, Pilz, Juergen
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!