Soft x-ray microscopy with 7 nm resolution

The availability of intense soft x-ray beams with tunable energy and polarization has pushed the development of highly sensitive, element-specific, and noninvasive microscopy techniques to investigate condensed matter with high spatial and temporal resolution. The short wavelengths of soft x-rays pr...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Optica 2020-11, Vol.7 (11), p.1602
Hauptverfasser: Rösner, Benedikt, Finizio, Simone, Koch, Frieder, Döring, Florian, Guzenko, Vitaliy A., Langer, Manuel, Kirk, Eugenie, Watts, Benjamin, Meyer, Markus, Loroña Ornelas, Joshua, Späth, Andreas, Stanescu, Stefan, Swaraj, Sufal, Belkhou, Rachid, Ishikawa, Takashi, Keller, Thomas F., Gross, Boris, Poggio, Martino, Fink, Rainer H., Raabe, Jörg, Kleibert, Armin, David, Christian
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!