Understanding the Conversion Process of Magnetron-Deposited Thin Films of Amorphous ReOx to Crystalline ReO3 upon Thermal Annealing

Thin films of rhenium trioxide (ReO3) were produced by reactive DC magnetron sputtering from a metallic rhenium target, followed by annealing in the air in a range of temperatures from 200 to 350 degrees C. Nanocrystalline single-phase ReO3 films were obtained after being annealed at about 250 degrees C. The thin films appeared bright red in reflected light and blue-green in transmitted light, thus showing an optical transparency window in the spectral range of 475-525 nm. The film exhibited a high conductivity as evidenced by macro- and nanoscale conductivity measurements. The long-range and local atomic structures of the films were studied in detail by structural methods, such as X-ray diffraction and X-ray absorption spectroscopy. The oxidation state (6+) of rhenium was confirmed by X-ray photoemission and X-ray absorption spectroscopy. The nanocrystalline morphology of the annealed films was evidenced by scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atomic force microscopy (AFM). The obtained results allowed us to propose a mechanism of rhenium oxide conversion from the initially amorphous ReOx phase to cubic ReO3.