Block copolymer directed self-assembly defect modes induced by localized errors in chemoepitaxial guiding underlayers: A molecular simulation study

Block copolymer (BCP) directed self-assembly (DSA) has been presented as a potential economically attractive enhancement to extend the capabilities of optical lithography for semiconductor manufacturing. One concern in DSA is the level of defectivity that can be achieved in such a process. Although entropic effects will always lead to some degree of defectivity, highly ordered structures with a low theoretical equilibrium defect density can be produced by guiding the ordering and placement of the BCP domains using a patterned underlayer. Recent experimental studies have shown that while DSA processes can significantly reduce the observed defect density, defectivity levels are generally still higher than allowable for high-volume manufacturing and higher than what would be anticipated from free energy estimates of the observed defect modes. In particular, bridge defects are one of the most commonly observed defect modes in experimental DSA studies. A number of hypotheses have been proposed to explain the origins of these defects. One hypothesis is that so-called affinity defects present in the underlayer can spawn bridge defects in the overlying BCP film. The goal of the work reported here was to investigate the extent to which bridge defects can be generated or further reinforced in lamellae-forming block copolymer films due to affinity defects in the underlayer pattern. Coarse-grained molecular dynamics simulations were used to simulate the chemoepitaxial DSA of monodisperse block copolymer films atop underlayers with varying affinity defect sizes. Affinity defects were simulated by creating circular regions of a single polymer block type (which is the opposite block type of that used to pattern the underlayer guiding stripes) in the nominally neutral background region of the underlayer. These affinity defects were positioned in regions of the underlayer where they were the incorrect type to match the overlying block copolymer pattern. It was observed that the presence of an affinity defect in the neutral region of the underlayer caused the energetically preferential polymer block to wet the affinity defect, thus creating the nucleus of what could potentially become a bridge defect—even when the affinity defects were very small. As the radius of the underlayer affinity defect (RoD) increased, the amount of block copolymer of incorrect type (with respect to a perfectly assembled copolymer pattern) that assembled above the affinity defect increased; but, in