Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate
BaSi 2 , which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi 2 (100) thin films on Si(111) substrate. A high stable interface structure wi...
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Veröffentlicht in: | Journal of materials science 2020-08, Vol.55 (22), p.9483-9492 |
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creator | Chai, Jun-Shuai Zhu, Xiao-Xian Wang, Jian-Tao |
description | BaSi
2
, which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi
2
(100) thin films on Si(111) substrate. A high stable interface structure with bond breaking of Si
4
-tetrahedra at interface is obtained by ab initio molecular-dynamics simulations. We find that the bond breaking of Si
4
-tetrahedra at interface play a key role to saturate the dangling bonds of Si(111) substrate. Electronic band structures and band-decomposed charge density distributions reveal that such BaSi
2
(100) thin film structures are semiconductor with an interface band gap of 0.71–0.75 eV and a large surface band gap of 1.17–1.27 eV, closing to the bulk BaSi
2
band gap of 1.25 eV. These results provide an excellent explanation for the recent experimental observations on the BaSi
2
-based thin films on Si(111) substrate. |
doi_str_mv | 10.1007/s10853-020-04685-5 |
format | Article |
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2
, which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi
2
(100) thin films on Si(111) substrate. A high stable interface structure with bond breaking of Si
4
-tetrahedra at interface is obtained by ab initio molecular-dynamics simulations. We find that the bond breaking of Si
4
-tetrahedra at interface play a key role to saturate the dangling bonds of Si(111) substrate. Electronic band structures and band-decomposed charge density distributions reveal that such BaSi
2
(100) thin film structures are semiconductor with an interface band gap of 0.71–0.75 eV and a large surface band gap of 1.17–1.27 eV, closing to the bulk BaSi
2
band gap of 1.25 eV. These results provide an excellent explanation for the recent experimental observations on the BaSi
2
-based thin films on Si(111) substrate.</description><identifier>ISSN: 0022-2461</identifier><identifier>EISSN: 1573-4803</identifier><identifier>DOI: 10.1007/s10853-020-04685-5</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Barium compounds ; Characterization and Evaluation of Materials ; Charge density ; Charge distribution ; Chemistry and Materials Science ; Classical Mechanics ; Crystallography and Scattering Methods ; Disilicides ; Electronic Materials ; Energy gap ; Epitaxial growth ; Materials Science ; Materials Science, Multidisciplinary ; Molecular beam epitaxy ; Molecular dynamics ; Photovoltaic cells ; Polymer Sciences ; Science & Technology ; Silicon substrates ; Solar cells ; Solid Mechanics ; Technology ; Tetrahedra ; Thin films</subject><ispartof>Journal of materials science, 2020-08, Vol.55 (22), p.9483-9492</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020</rights><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>true</woscitedreferencessubscribed><woscitedreferencescount>2</woscitedreferencescount><woscitedreferencesoriginalsourcerecordid>wos000531533500006</woscitedreferencesoriginalsourcerecordid><citedby>FETCH-LOGICAL-c319t-ccc1bbdf3353aee19b0f87b654b0dbe6b35e3a685faaa19693d5a9714bbc0e283</citedby><cites>FETCH-LOGICAL-c319t-ccc1bbdf3353aee19b0f87b654b0dbe6b35e3a685faaa19693d5a9714bbc0e283</cites><orcidid>0000-0001-5569-5071</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10853-020-04685-5$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10853-020-04685-5$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>315,782,786,27931,27932,28255,41495,42564,51326</link.rule.ids></links><search><creatorcontrib>Chai, Jun-Shuai</creatorcontrib><creatorcontrib>Zhu, Xiao-Xian</creatorcontrib><creatorcontrib>Wang, Jian-Tao</creatorcontrib><title>Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate</title><title>Journal of materials science</title><addtitle>J Mater Sci</addtitle><addtitle>J MATER SCI</addtitle><description>BaSi
2
, which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi
2
(100) thin films on Si(111) substrate. A high stable interface structure with bond breaking of Si
4
-tetrahedra at interface is obtained by ab initio molecular-dynamics simulations. We find that the bond breaking of Si
4
-tetrahedra at interface play a key role to saturate the dangling bonds of Si(111) substrate. Electronic band structures and band-decomposed charge density distributions reveal that such BaSi
2
(100) thin film structures are semiconductor with an interface band gap of 0.71–0.75 eV and a large surface band gap of 1.17–1.27 eV, closing to the bulk BaSi
2
band gap of 1.25 eV. These results provide an excellent explanation for the recent experimental observations on the BaSi
2
-based thin films on Si(111) substrate.</description><subject>Barium compounds</subject><subject>Characterization and Evaluation of Materials</subject><subject>Charge density</subject><subject>Charge distribution</subject><subject>Chemistry and Materials Science</subject><subject>Classical Mechanics</subject><subject>Crystallography and Scattering Methods</subject><subject>Disilicides</subject><subject>Electronic Materials</subject><subject>Energy gap</subject><subject>Epitaxial growth</subject><subject>Materials Science</subject><subject>Materials Science, Multidisciplinary</subject><subject>Molecular beam epitaxy</subject><subject>Molecular dynamics</subject><subject>Photovoltaic cells</subject><subject>Polymer Sciences</subject><subject>Science & Technology</subject><subject>Silicon substrates</subject><subject>Solar cells</subject><subject>Solid Mechanics</subject><subject>Technology</subject><subject>Tetrahedra</subject><subject>Thin films</subject><issn>0022-2461</issn><issn>1573-4803</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AOWDO</sourceid><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNkE1LXTEQhoNU8Nb2D3QV6EaR084kJ-dj2V6sFoRSrq5DkjtHI9fkmuQg_vvGnmJ3patk8Twz77yMfUD4hAD954wwKNmAgAbablCNOmArVL1s2gHkG7YCEKIRbYdH7G3O9wCgeoEr9nNT0uzKnMyOm7DltCNXUgze8X2Ke0rFU-Zx4l_NxouTuuyUlzsf-OR3DzwGvvEniHjK82xzSabQO3Y4mV2m93_eY3bz7fx6fdlc_bj4vv5y1TiJY2mcc2jtdpJSSUOEo4Vp6G2nWgtbS52ViqSpp0zGGBy7UW6VGXtsrXVAYpDH7OMyt-Z8nCkXfR_nFOpKLVpoRTt2KCslFsqlmHOiSe-TfzDpWSPol-r0Up2u1enf1WlVpWGRnsjGKTtPwdGr-NKdRFWD1x90a19M8TGs4xxKVc_-X620XOhciXBL6e8N_4j3CyadkJg</recordid><startdate>20200801</startdate><enddate>20200801</enddate><creator>Chai, Jun-Shuai</creator><creator>Zhu, Xiao-Xian</creator><creator>Wang, Jian-Tao</creator><general>Springer US</general><general>Springer Nature</general><general>Springer Nature B.V</general><scope>AOWDO</scope><scope>BLEPL</scope><scope>DTL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><orcidid>https://orcid.org/0000-0001-5569-5071</orcidid></search><sort><creationdate>20200801</creationdate><title>Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate</title><author>Chai, Jun-Shuai ; Zhu, Xiao-Xian ; Wang, Jian-Tao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-ccc1bbdf3353aee19b0f87b654b0dbe6b35e3a685faaa19693d5a9714bbc0e283</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Barium compounds</topic><topic>Characterization and Evaluation of Materials</topic><topic>Charge density</topic><topic>Charge distribution</topic><topic>Chemistry and Materials Science</topic><topic>Classical Mechanics</topic><topic>Crystallography and Scattering Methods</topic><topic>Disilicides</topic><topic>Electronic Materials</topic><topic>Energy gap</topic><topic>Epitaxial growth</topic><topic>Materials Science</topic><topic>Materials Science, Multidisciplinary</topic><topic>Molecular beam epitaxy</topic><topic>Molecular dynamics</topic><topic>Photovoltaic cells</topic><topic>Polymer Sciences</topic><topic>Science & Technology</topic><topic>Silicon substrates</topic><topic>Solar cells</topic><topic>Solid Mechanics</topic><topic>Technology</topic><topic>Tetrahedra</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chai, Jun-Shuai</creatorcontrib><creatorcontrib>Zhu, Xiao-Xian</creatorcontrib><creatorcontrib>Wang, Jian-Tao</creatorcontrib><collection>Web of Science - Science Citation Index Expanded - 2020</collection><collection>Web of Science Core Collection</collection><collection>Science Citation Index Expanded</collection><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><jtitle>Journal of materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chai, Jun-Shuai</au><au>Zhu, Xiao-Xian</au><au>Wang, Jian-Tao</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate</atitle><jtitle>Journal of materials science</jtitle><stitle>J Mater Sci</stitle><stitle>J MATER SCI</stitle><date>2020-08-01</date><risdate>2020</risdate><volume>55</volume><issue>22</issue><spage>9483</spage><epage>9492</epage><pages>9483-9492</pages><issn>0022-2461</issn><eissn>1573-4803</eissn><abstract>BaSi
2
, which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi
2
(100) thin films on Si(111) substrate. A high stable interface structure with bond breaking of Si
4
-tetrahedra at interface is obtained by ab initio molecular-dynamics simulations. We find that the bond breaking of Si
4
-tetrahedra at interface play a key role to saturate the dangling bonds of Si(111) substrate. Electronic band structures and band-decomposed charge density distributions reveal that such BaSi
2
(100) thin film structures are semiconductor with an interface band gap of 0.71–0.75 eV and a large surface band gap of 1.17–1.27 eV, closing to the bulk BaSi
2
band gap of 1.25 eV. These results provide an excellent explanation for the recent experimental observations on the BaSi
2
-based thin films on Si(111) substrate.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10853-020-04685-5</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0001-5569-5071</orcidid></addata></record> |
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subjects | Barium compounds Characterization and Evaluation of Materials Charge density Charge distribution Chemistry and Materials Science Classical Mechanics Crystallography and Scattering Methods Disilicides Electronic Materials Energy gap Epitaxial growth Materials Science Materials Science, Multidisciplinary Molecular beam epitaxy Molecular dynamics Photovoltaic cells Polymer Sciences Science & Technology Silicon substrates Solar cells Solid Mechanics Technology Tetrahedra Thin films |
title | Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate |
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