Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate

BaSi 2 , which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi 2 (100) thin films on Si(111) substrate. A high stable interface structure wi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of materials science 2020-08, Vol.55 (22), p.9483-9492
Hauptverfasser: Chai, Jun-Shuai, Zhu, Xiao-Xian, Wang, Jian-Tao
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 9492
container_issue 22
container_start_page 9483
container_title Journal of materials science
container_volume 55
creator Chai, Jun-Shuai
Zhu, Xiao-Xian
Wang, Jian-Tao
description BaSi 2 , which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi 2 (100) thin films on Si(111) substrate. A high stable interface structure with bond breaking of Si 4 -tetrahedra at interface is obtained by ab initio molecular-dynamics simulations. We find that the bond breaking of Si 4 -tetrahedra at interface play a key role to saturate the dangling bonds of Si(111) substrate. Electronic band structures and band-decomposed charge density distributions reveal that such BaSi 2 (100) thin film structures are semiconductor with an interface band gap of 0.71–0.75 eV and a large surface band gap of 1.17–1.27 eV, closing to the bulk BaSi 2 band gap of 1.25 eV. These results provide an excellent explanation for the recent experimental observations on the BaSi 2 -based thin films on Si(111) substrate.
doi_str_mv 10.1007/s10853-020-04685-5
format Article
fullrecord <record><control><sourceid>proquest_webof</sourceid><recordid>TN_cdi_webofscience_primary_000531533500006</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2404249613</sourcerecordid><originalsourceid>FETCH-LOGICAL-c319t-ccc1bbdf3353aee19b0f87b654b0dbe6b35e3a685faaa19693d5a9714bbc0e283</originalsourceid><addsrcrecordid>eNqNkE1LXTEQhoNU8Nb2D3QV6EaR084kJ-dj2V6sFoRSrq5DkjtHI9fkmuQg_vvGnmJ3patk8Twz77yMfUD4hAD954wwKNmAgAbablCNOmArVL1s2gHkG7YCEKIRbYdH7G3O9wCgeoEr9nNT0uzKnMyOm7DltCNXUgze8X2Ke0rFU-Zx4l_NxouTuuyUlzsf-OR3DzwGvvEniHjK82xzSabQO3Y4mV2m93_eY3bz7fx6fdlc_bj4vv5y1TiJY2mcc2jtdpJSSUOEo4Vp6G2nWgtbS52ViqSpp0zGGBy7UW6VGXtsrXVAYpDH7OMyt-Z8nCkXfR_nFOpKLVpoRTt2KCslFsqlmHOiSe-TfzDpWSPol-r0Up2u1enf1WlVpWGRnsjGKTtPwdGr-NKdRFWD1x90a19M8TGs4xxKVc_-X620XOhciXBL6e8N_4j3CyadkJg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2404249613</pqid></control><display><type>article</type><title>Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate</title><source>SpringerNature Journals</source><source>Web of Science - Science Citation Index Expanded - 2020&lt;img src="https://exlibris-pub.s3.amazonaws.com/fromwos-v2.jpg" /&gt;</source><creator>Chai, Jun-Shuai ; Zhu, Xiao-Xian ; Wang, Jian-Tao</creator><creatorcontrib>Chai, Jun-Shuai ; Zhu, Xiao-Xian ; Wang, Jian-Tao</creatorcontrib><description>BaSi 2 , which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi 2 (100) thin films on Si(111) substrate. A high stable interface structure with bond breaking of Si 4 -tetrahedra at interface is obtained by ab initio molecular-dynamics simulations. We find that the bond breaking of Si 4 -tetrahedra at interface play a key role to saturate the dangling bonds of Si(111) substrate. Electronic band structures and band-decomposed charge density distributions reveal that such BaSi 2 (100) thin film structures are semiconductor with an interface band gap of 0.71–0.75 eV and a large surface band gap of 1.17–1.27 eV, closing to the bulk BaSi 2 band gap of 1.25 eV. These results provide an excellent explanation for the recent experimental observations on the BaSi 2 -based thin films on Si(111) substrate.</description><identifier>ISSN: 0022-2461</identifier><identifier>EISSN: 1573-4803</identifier><identifier>DOI: 10.1007/s10853-020-04685-5</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Barium compounds ; Characterization and Evaluation of Materials ; Charge density ; Charge distribution ; Chemistry and Materials Science ; Classical Mechanics ; Crystallography and Scattering Methods ; Disilicides ; Electronic Materials ; Energy gap ; Epitaxial growth ; Materials Science ; Materials Science, Multidisciplinary ; Molecular beam epitaxy ; Molecular dynamics ; Photovoltaic cells ; Polymer Sciences ; Science &amp; Technology ; Silicon substrates ; Solar cells ; Solid Mechanics ; Technology ; Tetrahedra ; Thin films</subject><ispartof>Journal of materials science, 2020-08, Vol.55 (22), p.9483-9492</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020</rights><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>true</woscitedreferencessubscribed><woscitedreferencescount>2</woscitedreferencescount><woscitedreferencesoriginalsourcerecordid>wos000531533500006</woscitedreferencesoriginalsourcerecordid><citedby>FETCH-LOGICAL-c319t-ccc1bbdf3353aee19b0f87b654b0dbe6b35e3a685faaa19693d5a9714bbc0e283</citedby><cites>FETCH-LOGICAL-c319t-ccc1bbdf3353aee19b0f87b654b0dbe6b35e3a685faaa19693d5a9714bbc0e283</cites><orcidid>0000-0001-5569-5071</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10853-020-04685-5$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10853-020-04685-5$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>315,782,786,27931,27932,28255,41495,42564,51326</link.rule.ids></links><search><creatorcontrib>Chai, Jun-Shuai</creatorcontrib><creatorcontrib>Zhu, Xiao-Xian</creatorcontrib><creatorcontrib>Wang, Jian-Tao</creatorcontrib><title>Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate</title><title>Journal of materials science</title><addtitle>J Mater Sci</addtitle><addtitle>J MATER SCI</addtitle><description>BaSi 2 , which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi 2 (100) thin films on Si(111) substrate. A high stable interface structure with bond breaking of Si 4 -tetrahedra at interface is obtained by ab initio molecular-dynamics simulations. We find that the bond breaking of Si 4 -tetrahedra at interface play a key role to saturate the dangling bonds of Si(111) substrate. Electronic band structures and band-decomposed charge density distributions reveal that such BaSi 2 (100) thin film structures are semiconductor with an interface band gap of 0.71–0.75 eV and a large surface band gap of 1.17–1.27 eV, closing to the bulk BaSi 2 band gap of 1.25 eV. These results provide an excellent explanation for the recent experimental observations on the BaSi 2 -based thin films on Si(111) substrate.</description><subject>Barium compounds</subject><subject>Characterization and Evaluation of Materials</subject><subject>Charge density</subject><subject>Charge distribution</subject><subject>Chemistry and Materials Science</subject><subject>Classical Mechanics</subject><subject>Crystallography and Scattering Methods</subject><subject>Disilicides</subject><subject>Electronic Materials</subject><subject>Energy gap</subject><subject>Epitaxial growth</subject><subject>Materials Science</subject><subject>Materials Science, Multidisciplinary</subject><subject>Molecular beam epitaxy</subject><subject>Molecular dynamics</subject><subject>Photovoltaic cells</subject><subject>Polymer Sciences</subject><subject>Science &amp; Technology</subject><subject>Silicon substrates</subject><subject>Solar cells</subject><subject>Solid Mechanics</subject><subject>Technology</subject><subject>Tetrahedra</subject><subject>Thin films</subject><issn>0022-2461</issn><issn>1573-4803</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AOWDO</sourceid><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNkE1LXTEQhoNU8Nb2D3QV6EaR084kJ-dj2V6sFoRSrq5DkjtHI9fkmuQg_vvGnmJ3patk8Twz77yMfUD4hAD954wwKNmAgAbablCNOmArVL1s2gHkG7YCEKIRbYdH7G3O9wCgeoEr9nNT0uzKnMyOm7DltCNXUgze8X2Ke0rFU-Zx4l_NxouTuuyUlzsf-OR3DzwGvvEniHjK82xzSabQO3Y4mV2m93_eY3bz7fx6fdlc_bj4vv5y1TiJY2mcc2jtdpJSSUOEo4Vp6G2nWgtbS52ViqSpp0zGGBy7UW6VGXtsrXVAYpDH7OMyt-Z8nCkXfR_nFOpKLVpoRTt2KCslFsqlmHOiSe-TfzDpWSPol-r0Up2u1enf1WlVpWGRnsjGKTtPwdGr-NKdRFWD1x90a19M8TGs4xxKVc_-X620XOhciXBL6e8N_4j3CyadkJg</recordid><startdate>20200801</startdate><enddate>20200801</enddate><creator>Chai, Jun-Shuai</creator><creator>Zhu, Xiao-Xian</creator><creator>Wang, Jian-Tao</creator><general>Springer US</general><general>Springer Nature</general><general>Springer Nature B.V</general><scope>AOWDO</scope><scope>BLEPL</scope><scope>DTL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><orcidid>https://orcid.org/0000-0001-5569-5071</orcidid></search><sort><creationdate>20200801</creationdate><title>Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate</title><author>Chai, Jun-Shuai ; Zhu, Xiao-Xian ; Wang, Jian-Tao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-ccc1bbdf3353aee19b0f87b654b0dbe6b35e3a685faaa19693d5a9714bbc0e283</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Barium compounds</topic><topic>Characterization and Evaluation of Materials</topic><topic>Charge density</topic><topic>Charge distribution</topic><topic>Chemistry and Materials Science</topic><topic>Classical Mechanics</topic><topic>Crystallography and Scattering Methods</topic><topic>Disilicides</topic><topic>Electronic Materials</topic><topic>Energy gap</topic><topic>Epitaxial growth</topic><topic>Materials Science</topic><topic>Materials Science, Multidisciplinary</topic><topic>Molecular beam epitaxy</topic><topic>Molecular dynamics</topic><topic>Photovoltaic cells</topic><topic>Polymer Sciences</topic><topic>Science &amp; Technology</topic><topic>Silicon substrates</topic><topic>Solar cells</topic><topic>Solid Mechanics</topic><topic>Technology</topic><topic>Tetrahedra</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chai, Jun-Shuai</creatorcontrib><creatorcontrib>Zhu, Xiao-Xian</creatorcontrib><creatorcontrib>Wang, Jian-Tao</creatorcontrib><collection>Web of Science - Science Citation Index Expanded - 2020</collection><collection>Web of Science Core Collection</collection><collection>Science Citation Index Expanded</collection><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><jtitle>Journal of materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chai, Jun-Shuai</au><au>Zhu, Xiao-Xian</au><au>Wang, Jian-Tao</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate</atitle><jtitle>Journal of materials science</jtitle><stitle>J Mater Sci</stitle><stitle>J MATER SCI</stitle><date>2020-08-01</date><risdate>2020</risdate><volume>55</volume><issue>22</issue><spage>9483</spage><epage>9492</epage><pages>9483-9492</pages><issn>0022-2461</issn><eissn>1573-4803</eissn><abstract>BaSi 2 , which can be grown on Si(111) substrate by molecular beam epitaxy experimentally, holds great promise for solar-cells. Here, we report a detailed ab initio study on the structural and electronic properties of BaSi 2 (100) thin films on Si(111) substrate. A high stable interface structure with bond breaking of Si 4 -tetrahedra at interface is obtained by ab initio molecular-dynamics simulations. We find that the bond breaking of Si 4 -tetrahedra at interface play a key role to saturate the dangling bonds of Si(111) substrate. Electronic band structures and band-decomposed charge density distributions reveal that such BaSi 2 (100) thin film structures are semiconductor with an interface band gap of 0.71–0.75 eV and a large surface band gap of 1.17–1.27 eV, closing to the bulk BaSi 2 band gap of 1.25 eV. These results provide an excellent explanation for the recent experimental observations on the BaSi 2 -based thin films on Si(111) substrate.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10853-020-04685-5</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0001-5569-5071</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 0022-2461
ispartof Journal of materials science, 2020-08, Vol.55 (22), p.9483-9492
issn 0022-2461
1573-4803
language eng
recordid cdi_webofscience_primary_000531533500006
source SpringerNature Journals; Web of Science - Science Citation Index Expanded - 2020<img src="https://exlibris-pub.s3.amazonaws.com/fromwos-v2.jpg" />
subjects Barium compounds
Characterization and Evaluation of Materials
Charge density
Charge distribution
Chemistry and Materials Science
Classical Mechanics
Crystallography and Scattering Methods
Disilicides
Electronic Materials
Energy gap
Epitaxial growth
Materials Science
Materials Science, Multidisciplinary
Molecular beam epitaxy
Molecular dynamics
Photovoltaic cells
Polymer Sciences
Science & Technology
Silicon substrates
Solar cells
Solid Mechanics
Technology
Tetrahedra
Thin films
title Structural and electronic properties of BaSi2(100) thin film on Si(111) substrate
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T19%3A04%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_webof&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structural%20and%20electronic%20properties%20of%20BaSi2(100)%20thin%20film%20on%20Si(111)%20substrate&rft.jtitle=Journal%20of%20materials%20science&rft.au=Chai,%20Jun-Shuai&rft.date=2020-08-01&rft.volume=55&rft.issue=22&rft.spage=9483&rft.epage=9492&rft.pages=9483-9492&rft.issn=0022-2461&rft.eissn=1573-4803&rft_id=info:doi/10.1007/s10853-020-04685-5&rft_dat=%3Cproquest_webof%3E2404249613%3C/proquest_webof%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2404249613&rft_id=info:pmid/&rfr_iscdi=true