Estimation of the effective mass thickness and effective atomic number of the test object material by the dual energy method

One of the approaches to define the “effective atomic number” concept is applied to the main implementations of the dual energy method. The approach is based on the preliminary radiography of special test objects formed from fragments of simple chemical substances and differing in mass thickness and...

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Veröffentlicht in:Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2020-03, Vol.168, p.108543, Article 108543
Hauptverfasser: Osipov, Sergey, Chakhlov, Sergey, Udod, Victor, Usachev, Eugeny, Schetinkin, Sergey, Kamysheva, Ekaterina
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container_title Radiation physics and chemistry (Oxford, England : 1993)
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creator Osipov, Sergey
Chakhlov, Sergey
Udod, Victor
Usachev, Eugeny
Schetinkin, Sergey
Kamysheva, Ekaterina
description One of the approaches to define the “effective atomic number” concept is applied to the main implementations of the dual energy method. The approach is based on the preliminary radiography of special test objects formed from fragments of simple chemical substances and differing in mass thickness and atomic number. The algorithm is easily adapted for inspection systems and X-ray computed tomography using the dual energy method to recognize the materials of test objects or its structural fragments. An example of calculation of the effective mass thickness and the effective atomic number for two-layer objects from carbon and aluminum is given. •Dual energy method is realized on base the two-layer specially formed test objects.•Method estimate the mass thickness and effective atomic number simultaneously.•Effective atomic number and mass thickness of minerals and explosives are estimated.•Formation with two-layer equivalents of hazardous and rare materials is proposed.
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fullrecord <record><control><sourceid>proquest_webof</sourceid><recordid>TN_cdi_webofscience_primary_000519335200022CitationCount</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0969806X18307758</els_id><sourcerecordid>2379000381</sourcerecordid><originalsourceid>FETCH-LOGICAL-c349t-2ff1da8a4425ea3d5a11dbba3e3ff9eb824d0449a2860843d2f7f830f49f7d613</originalsourceid><addsrcrecordid>eNqNkE1v1DAQhi0EEkvhPwRxRFn8lcQ-oqh8SJW4FImb5cRj1qGJF9spWqk_ntmmoB578mjmfTyjh5C3jO4ZZe2HaZ-sOx5OeTzAvOeUaeyrRopnZMdUp2uqdPOc7Khuda1o--MleZXzRCntVCN25O4ylzDbEuJSRV-VA1TgPYwl3EI125yxFcZfC2BlF_doaEucw1gt6zxA-scWyKWKw4QZpAukYG-q4XQ_cyvWsED6eapmKIfoXpMX3t5kePPwXpDvny6v-y_11bfPX_uPV_UopC419545q6yUvAErXGMZc8NgBQjvNQyKS0el1JarliopHPedV4J6qX3nWiYuyLvt32OKv1c80UxxTQuuNFx0GmUIdU7pLTWmmHMCb44J1aSTYdScZZvJPJJtzrLNJhtZtbF_YIg-jwGWEf7zuKBhWoiGY8V5H8q98D6uS0H0_dNRTPdbGtDXbYBkHggXEko3LoYnnPsXxGOxPA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2379000381</pqid></control><display><type>article</type><title>Estimation of the effective mass thickness and effective atomic number of the test object material by the dual energy method</title><source>Elsevier ScienceDirect Journals Complete</source><source>Web of Science - Science Citation Index Expanded - 2020&lt;img src="https://exlibris-pub.s3.amazonaws.com/fromwos-v2.jpg" /&gt;</source><creator>Osipov, Sergey ; Chakhlov, Sergey ; Udod, Victor ; Usachev, Eugeny ; Schetinkin, Sergey ; Kamysheva, Ekaterina</creator><creatorcontrib>Osipov, Sergey ; Chakhlov, Sergey ; Udod, Victor ; Usachev, Eugeny ; Schetinkin, Sergey ; Kamysheva, Ekaterina</creatorcontrib><description>One of the approaches to define the “effective atomic number” concept is applied to the main implementations of the dual energy method. The approach is based on the preliminary radiography of special test objects formed from fragments of simple chemical substances and differing in mass thickness and atomic number. The algorithm is easily adapted for inspection systems and X-ray computed tomography using the dual energy method to recognize the materials of test objects or its structural fragments. An example of calculation of the effective mass thickness and the effective atomic number for two-layer objects from carbon and aluminum is given. •Dual energy method is realized on base the two-layer specially formed test objects.•Method estimate the mass thickness and effective atomic number simultaneously.•Effective atomic number and mass thickness of minerals and explosives are estimated.•Formation with two-layer equivalents of hazardous and rare materials is proposed.</description><identifier>ISSN: 0969-806X</identifier><identifier>EISSN: 1879-0895</identifier><identifier>DOI: 10.1016/j.radphyschem.2019.108543</identifier><language>eng</language><publisher>OXFORD: Elsevier Ltd</publisher><subject>Algorithms ; Aluminum ; Atomic properties ; Chemistry ; Chemistry, Physical ; Computed tomography ; Dual energy method ; Effective atomic number ; Effective mass thickness ; Energy methods ; Fragments ; Inspection ; Inspection control ; Nuclear Science &amp; Technology ; Object recognition ; Physical Sciences ; Physics ; Physics, Atomic, Molecular &amp; Chemical ; Radiography ; Science &amp; Technology ; Technology ; Thickness ; X-ray radiation</subject><ispartof>Radiation physics and chemistry (Oxford, England : 1993), 2020-03, Vol.168, p.108543, Article 108543</ispartof><rights>2019 Elsevier Ltd</rights><rights>Copyright Elsevier BV Mar 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>true</woscitedreferencessubscribed><woscitedreferencescount>5</woscitedreferencescount><woscitedreferencesoriginalsourcerecordid>wos000519335200022</woscitedreferencesoriginalsourcerecordid><citedby>FETCH-LOGICAL-c349t-2ff1da8a4425ea3d5a11dbba3e3ff9eb824d0449a2860843d2f7f830f49f7d613</citedby><cites>FETCH-LOGICAL-c349t-2ff1da8a4425ea3d5a11dbba3e3ff9eb824d0449a2860843d2f7f830f49f7d613</cites><orcidid>0000-0002-2297-184X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.radphyschem.2019.108543$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,781,785,3551,27929,27930,28253,46000</link.rule.ids></links><search><creatorcontrib>Osipov, Sergey</creatorcontrib><creatorcontrib>Chakhlov, Sergey</creatorcontrib><creatorcontrib>Udod, Victor</creatorcontrib><creatorcontrib>Usachev, Eugeny</creatorcontrib><creatorcontrib>Schetinkin, Sergey</creatorcontrib><creatorcontrib>Kamysheva, Ekaterina</creatorcontrib><title>Estimation of the effective mass thickness and effective atomic number of the test object material by the dual energy method</title><title>Radiation physics and chemistry (Oxford, England : 1993)</title><addtitle>RADIAT PHYS CHEM</addtitle><description>One of the approaches to define the “effective atomic number” concept is applied to the main implementations of the dual energy method. The approach is based on the preliminary radiography of special test objects formed from fragments of simple chemical substances and differing in mass thickness and atomic number. The algorithm is easily adapted for inspection systems and X-ray computed tomography using the dual energy method to recognize the materials of test objects or its structural fragments. An example of calculation of the effective mass thickness and the effective atomic number for two-layer objects from carbon and aluminum is given. •Dual energy method is realized on base the two-layer specially formed test objects.•Method estimate the mass thickness and effective atomic number simultaneously.•Effective atomic number and mass thickness of minerals and explosives are estimated.•Formation with two-layer equivalents of hazardous and rare materials is proposed.</description><subject>Algorithms</subject><subject>Aluminum</subject><subject>Atomic properties</subject><subject>Chemistry</subject><subject>Chemistry, Physical</subject><subject>Computed tomography</subject><subject>Dual energy method</subject><subject>Effective atomic number</subject><subject>Effective mass thickness</subject><subject>Energy methods</subject><subject>Fragments</subject><subject>Inspection</subject><subject>Inspection control</subject><subject>Nuclear Science &amp; Technology</subject><subject>Object recognition</subject><subject>Physical Sciences</subject><subject>Physics</subject><subject>Physics, Atomic, Molecular &amp; Chemical</subject><subject>Radiography</subject><subject>Science &amp; Technology</subject><subject>Technology</subject><subject>Thickness</subject><subject>X-ray radiation</subject><issn>0969-806X</issn><issn>1879-0895</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AOWDO</sourceid><recordid>eNqNkE1v1DAQhi0EEkvhPwRxRFn8lcQ-oqh8SJW4FImb5cRj1qGJF9spWqk_ntmmoB578mjmfTyjh5C3jO4ZZe2HaZ-sOx5OeTzAvOeUaeyrRopnZMdUp2uqdPOc7Khuda1o--MleZXzRCntVCN25O4ylzDbEuJSRV-VA1TgPYwl3EI125yxFcZfC2BlF_doaEucw1gt6zxA-scWyKWKw4QZpAukYG-q4XQ_cyvWsED6eapmKIfoXpMX3t5kePPwXpDvny6v-y_11bfPX_uPV_UopC419545q6yUvAErXGMZc8NgBQjvNQyKS0el1JarliopHPedV4J6qX3nWiYuyLvt32OKv1c80UxxTQuuNFx0GmUIdU7pLTWmmHMCb44J1aSTYdScZZvJPJJtzrLNJhtZtbF_YIg-jwGWEf7zuKBhWoiGY8V5H8q98D6uS0H0_dNRTPdbGtDXbYBkHggXEko3LoYnnPsXxGOxPA</recordid><startdate>202003</startdate><enddate>202003</enddate><creator>Osipov, Sergey</creator><creator>Chakhlov, Sergey</creator><creator>Udod, Victor</creator><creator>Usachev, Eugeny</creator><creator>Schetinkin, Sergey</creator><creator>Kamysheva, Ekaterina</creator><general>Elsevier Ltd</general><general>Elsevier</general><general>Elsevier BV</general><scope>AOWDO</scope><scope>BLEPL</scope><scope>DTL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-2297-184X</orcidid></search><sort><creationdate>202003</creationdate><title>Estimation of the effective mass thickness and effective atomic number of the test object material by the dual energy method</title><author>Osipov, Sergey ; Chakhlov, Sergey ; Udod, Victor ; Usachev, Eugeny ; Schetinkin, Sergey ; Kamysheva, Ekaterina</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-2ff1da8a4425ea3d5a11dbba3e3ff9eb824d0449a2860843d2f7f830f49f7d613</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Algorithms</topic><topic>Aluminum</topic><topic>Atomic properties</topic><topic>Chemistry</topic><topic>Chemistry, Physical</topic><topic>Computed tomography</topic><topic>Dual energy method</topic><topic>Effective atomic number</topic><topic>Effective mass thickness</topic><topic>Energy methods</topic><topic>Fragments</topic><topic>Inspection</topic><topic>Inspection control</topic><topic>Nuclear Science &amp; Technology</topic><topic>Object recognition</topic><topic>Physical Sciences</topic><topic>Physics</topic><topic>Physics, Atomic, Molecular &amp; Chemical</topic><topic>Radiography</topic><topic>Science &amp; Technology</topic><topic>Technology</topic><topic>Thickness</topic><topic>X-ray radiation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Osipov, Sergey</creatorcontrib><creatorcontrib>Chakhlov, Sergey</creatorcontrib><creatorcontrib>Udod, Victor</creatorcontrib><creatorcontrib>Usachev, Eugeny</creatorcontrib><creatorcontrib>Schetinkin, Sergey</creatorcontrib><creatorcontrib>Kamysheva, Ekaterina</creatorcontrib><collection>Web of Science - Science Citation Index Expanded - 2020</collection><collection>Web of Science Core Collection</collection><collection>Science Citation Index Expanded</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Radiation physics and chemistry (Oxford, England : 1993)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Osipov, Sergey</au><au>Chakhlov, Sergey</au><au>Udod, Victor</au><au>Usachev, Eugeny</au><au>Schetinkin, Sergey</au><au>Kamysheva, Ekaterina</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Estimation of the effective mass thickness and effective atomic number of the test object material by the dual energy method</atitle><jtitle>Radiation physics and chemistry (Oxford, England : 1993)</jtitle><stitle>RADIAT PHYS CHEM</stitle><date>2020-03</date><risdate>2020</risdate><volume>168</volume><spage>108543</spage><pages>108543-</pages><artnum>108543</artnum><issn>0969-806X</issn><eissn>1879-0895</eissn><abstract>One of the approaches to define the “effective atomic number” concept is applied to the main implementations of the dual energy method. The approach is based on the preliminary radiography of special test objects formed from fragments of simple chemical substances and differing in mass thickness and atomic number. The algorithm is easily adapted for inspection systems and X-ray computed tomography using the dual energy method to recognize the materials of test objects or its structural fragments. An example of calculation of the effective mass thickness and the effective atomic number for two-layer objects from carbon and aluminum is given. •Dual energy method is realized on base the two-layer specially formed test objects.•Method estimate the mass thickness and effective atomic number simultaneously.•Effective atomic number and mass thickness of minerals and explosives are estimated.•Formation with two-layer equivalents of hazardous and rare materials is proposed.</abstract><cop>OXFORD</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.radphyschem.2019.108543</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-2297-184X</orcidid></addata></record>
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subjects Algorithms
Aluminum
Atomic properties
Chemistry
Chemistry, Physical
Computed tomography
Dual energy method
Effective atomic number
Effective mass thickness
Energy methods
Fragments
Inspection
Inspection control
Nuclear Science & Technology
Object recognition
Physical Sciences
Physics
Physics, Atomic, Molecular & Chemical
Radiography
Science & Technology
Technology
Thickness
X-ray radiation
title Estimation of the effective mass thickness and effective atomic number of the test object material by the dual energy method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-13T09%3A34%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_webof&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Estimation%20of%20the%20effective%20mass%20thickness%20and%20effective%20atomic%20number%20of%20the%20test%20object%20material%20by%20the%20dual%20energy%20method&rft.jtitle=Radiation%20physics%20and%20chemistry%20(Oxford,%20England%20:%201993)&rft.au=Osipov,%20Sergey&rft.date=2020-03&rft.volume=168&rft.spage=108543&rft.pages=108543-&rft.artnum=108543&rft.issn=0969-806X&rft.eissn=1879-0895&rft_id=info:doi/10.1016/j.radphyschem.2019.108543&rft_dat=%3Cproquest_webof%3E2379000381%3C/proquest_webof%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2379000381&rft_id=info:pmid/&rft_els_id=S0969806X18307758&rfr_iscdi=true