Microstructural Effect Limitations in the Analysis of SnAg, SnBi and SnIn Lead-free Solders by Wavelength Dispersion X-Ray Spectrometry
This article describes the effects of microstructures in an analysis of lead-free solders, namely SnAg, SnBi and SnIn, using X-ray fluorescence spectrometry ( XRF ). The size of the microstructures in the samples and calibration materials has a strong impact on the calibration accuracy and results....
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| Veröffentlicht in: | Journal of analytical chemistry (New York, N.Y.) N.Y.), 2020, Vol.75 (1), p.56-62 |
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| creator | Tadeusz Gorewoda Mzyk, Zofia Anyszkiewicz, Jacek Bilewska, Katarzyna Cybulski, Andrzej Gołębiewska-Kurzawska, Joanna Knapik, Magdalena Kostrzewa, Justyna Grzegorczyk, Magdalena Malara, Szymon |
| description | This article describes the effects of microstructures in an analysis of lead-free solders, namely SnAg, SnBi and SnIn, using X-ray fluorescence spectrometry (
XRF
). The size of the microstructures in the samples and calibration materials has a strong impact on the calibration accuracy and results. A comparison of the microstructure size and critical thickness values demonstrated the importance of the former parameter in terms of the analyzed volume of the specimen. The re-melting and casting in an induction furnace at developed conditions were determined to be a way to obtain samples with fine-grained microstructures. Calibration with re-melted reference materials yielded more accurate calibration curves than calibration using the materials in their original state. Re-melting of the samples resulted in improvements in the XRF results in comparison to the reference values. This improvement is especially important in case of alloying elements with concentrations that determine the recognition of a specific solder grade. |
| doi_str_mv | 10.1134/S1061934820010086 |
| format | Article |
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XRF
). The size of the microstructures in the samples and calibration materials has a strong impact on the calibration accuracy and results. A comparison of the microstructure size and critical thickness values demonstrated the importance of the former parameter in terms of the analyzed volume of the specimen. The re-melting and casting in an induction furnace at developed conditions were determined to be a way to obtain samples with fine-grained microstructures. Calibration with re-melted reference materials yielded more accurate calibration curves than calibration using the materials in their original state. Re-melting of the samples resulted in improvements in the XRF results in comparison to the reference values. This improvement is especially important in case of alloying elements with concentrations that determine the recognition of a specific solder grade.</description><identifier>ISSN: 1061-9348</identifier><identifier>EISSN: 1608-3199</identifier><identifier>DOI: 10.1134/S1061934820010086</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Alloying elements ; Analytical Chemistry ; Calibration ; Chemistry ; Chemistry and Materials Science ; Chemistry, Analytical ; Comparative analysis ; Electric induction furnaces ; Fluorescence spectroscopy ; Lead free ; Microstructure ; Physical Sciences ; Reference materials ; Science & Technology ; Scientific imaging ; Solders ; Spectrometry ; X ray fluorescence analysis ; X-ray spectroscopy</subject><ispartof>Journal of analytical chemistry (New York, N.Y.), 2020, Vol.75 (1), p.56-62</ispartof><rights>Pleiades Publishing, Ltd. 2020</rights><rights>COPYRIGHT 2020 Springer</rights><rights>2020© Pleiades Publishing, Ltd. 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>true</woscitedreferencessubscribed><woscitedreferencescount>1</woscitedreferencescount><woscitedreferencesoriginalsourcerecordid>wos000516567600006</woscitedreferencesoriginalsourcerecordid><citedby>FETCH-LOGICAL-c455t-5e60318e9e8feccc2a3c97004b073b53c7c4baaa93a0a9f712a9c7a96af16c5a3</citedby><cites>FETCH-LOGICAL-c455t-5e60318e9e8feccc2a3c97004b073b53c7c4baaa93a0a9f712a9c7a96af16c5a3</cites><orcidid>0000-0002-3918-1684 ; 0000-0001-5715-4412</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S1061934820010086$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S1061934820010086$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>315,781,785,27929,27930,28253,41493,42562,51324</link.rule.ids></links><search><creatorcontrib>Tadeusz Gorewoda</creatorcontrib><creatorcontrib>Mzyk, Zofia</creatorcontrib><creatorcontrib>Anyszkiewicz, Jacek</creatorcontrib><creatorcontrib>Bilewska, Katarzyna</creatorcontrib><creatorcontrib>Cybulski, Andrzej</creatorcontrib><creatorcontrib>Gołębiewska-Kurzawska, Joanna</creatorcontrib><creatorcontrib>Knapik, Magdalena</creatorcontrib><creatorcontrib>Kostrzewa, Justyna</creatorcontrib><creatorcontrib>Grzegorczyk, Magdalena</creatorcontrib><creatorcontrib>Malara, Szymon</creatorcontrib><title>Microstructural Effect Limitations in the Analysis of SnAg, SnBi and SnIn Lead-free Solders by Wavelength Dispersion X-Ray Spectrometry</title><title>Journal of analytical chemistry (New York, N.Y.)</title><addtitle>J Anal Chem</addtitle><addtitle>J ANAL CHEM</addtitle><description>This article describes the effects of microstructures in an analysis of lead-free solders, namely SnAg, SnBi and SnIn, using X-ray fluorescence spectrometry (
XRF
). The size of the microstructures in the samples and calibration materials has a strong impact on the calibration accuracy and results. A comparison of the microstructure size and critical thickness values demonstrated the importance of the former parameter in terms of the analyzed volume of the specimen. The re-melting and casting in an induction furnace at developed conditions were determined to be a way to obtain samples with fine-grained microstructures. Calibration with re-melted reference materials yielded more accurate calibration curves than calibration using the materials in their original state. Re-melting of the samples resulted in improvements in the XRF results in comparison to the reference values. This improvement is especially important in case of alloying elements with concentrations that determine the recognition of a specific solder grade.</description><subject>Alloying elements</subject><subject>Analytical Chemistry</subject><subject>Calibration</subject><subject>Chemistry</subject><subject>Chemistry and Materials Science</subject><subject>Chemistry, Analytical</subject><subject>Comparative analysis</subject><subject>Electric induction furnaces</subject><subject>Fluorescence spectroscopy</subject><subject>Lead free</subject><subject>Microstructure</subject><subject>Physical Sciences</subject><subject>Reference materials</subject><subject>Science & Technology</subject><subject>Scientific imaging</subject><subject>Solders</subject><subject>Spectrometry</subject><subject>X ray fluorescence analysis</subject><subject>X-ray spectroscopy</subject><issn>1061-9348</issn><issn>1608-3199</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AOWDO</sourceid><recordid>eNqNklGL1DAQx4soeK5-AN8CPon2TJo2bR_X9U4XVoSrom9lmp30crTJmqRqP8F9bbPs4bG4ggkkw-T3n0wmkyTPGT1njOdvGkYFq3leZZQySivxIDljglYpZ3X9MNrxON2fP06eeH9DKa0rJs6S249aOuuDm2SYHAzkQimUgWz0qAMEbY0n2pBwjWRpYJi99sQq0phl_zqubzUBs43G2pANwjZVDpE0dtii86SbyVf4gQOaPlyTd9rvojeGJN_SK5hJs4s3OTticPPT5JGCweOzu32RfLm8-Lz6kG4-vV-vlptU5kUR0gIF5azCGquYppQZcFmXlOYdLXlXcFnKvAOAmgOFWpUsg1qWUAtQTMgC-CJ5cYi7c_b7hD60N3Zy8WW-zbgoeJ6VXNxTPQzYaqNscCBH7WW7FKzIs6KMeSyS9ATVo8FYSGtQ6eg-4s9P8HFucdTypODlkSAyAX-FHibv23VzdcyyA7v_Tu9QtTunR3Bzy2i7b5H2rxaJmlcHzU_srPJSo5H4Rxd7pGCiEDF6HHu6-n96ddc9KzuZEKXZQeojbnp091X_d3a_AchJ3Bs</recordid><startdate>2020</startdate><enddate>2020</enddate><creator>Tadeusz Gorewoda</creator><creator>Mzyk, Zofia</creator><creator>Anyszkiewicz, Jacek</creator><creator>Bilewska, Katarzyna</creator><creator>Cybulski, Andrzej</creator><creator>Gołębiewska-Kurzawska, Joanna</creator><creator>Knapik, Magdalena</creator><creator>Kostrzewa, Justyna</creator><creator>Grzegorczyk, Magdalena</creator><creator>Malara, Szymon</creator><general>Pleiades Publishing</general><general>Pleiades Publishing Inc</general><general>Springer</general><general>Springer Nature B.V</general><scope>AOWDO</scope><scope>BLEPL</scope><scope>DTL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>ISR</scope><orcidid>https://orcid.org/0000-0002-3918-1684</orcidid><orcidid>https://orcid.org/0000-0001-5715-4412</orcidid></search><sort><creationdate>2020</creationdate><title>Microstructural Effect Limitations in the Analysis of SnAg, SnBi and SnIn Lead-free Solders by Wavelength Dispersion X-Ray Spectrometry</title><author>Tadeusz Gorewoda ; Mzyk, Zofia ; Anyszkiewicz, Jacek ; Bilewska, Katarzyna ; Cybulski, Andrzej ; Gołębiewska-Kurzawska, Joanna ; Knapik, Magdalena ; Kostrzewa, Justyna ; Grzegorczyk, Magdalena ; Malara, Szymon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c455t-5e60318e9e8feccc2a3c97004b073b53c7c4baaa93a0a9f712a9c7a96af16c5a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Alloying elements</topic><topic>Analytical Chemistry</topic><topic>Calibration</topic><topic>Chemistry</topic><topic>Chemistry and Materials Science</topic><topic>Chemistry, Analytical</topic><topic>Comparative analysis</topic><topic>Electric induction furnaces</topic><topic>Fluorescence spectroscopy</topic><topic>Lead free</topic><topic>Microstructure</topic><topic>Physical Sciences</topic><topic>Reference materials</topic><topic>Science & Technology</topic><topic>Scientific imaging</topic><topic>Solders</topic><topic>Spectrometry</topic><topic>X ray fluorescence analysis</topic><topic>X-ray spectroscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tadeusz Gorewoda</creatorcontrib><creatorcontrib>Mzyk, Zofia</creatorcontrib><creatorcontrib>Anyszkiewicz, Jacek</creatorcontrib><creatorcontrib>Bilewska, Katarzyna</creatorcontrib><creatorcontrib>Cybulski, Andrzej</creatorcontrib><creatorcontrib>Gołębiewska-Kurzawska, Joanna</creatorcontrib><creatorcontrib>Knapik, Magdalena</creatorcontrib><creatorcontrib>Kostrzewa, Justyna</creatorcontrib><creatorcontrib>Grzegorczyk, Magdalena</creatorcontrib><creatorcontrib>Malara, Szymon</creatorcontrib><collection>Web of Science - Science Citation Index Expanded - 2020</collection><collection>Web of Science Core Collection</collection><collection>Science Citation Index Expanded</collection><collection>CrossRef</collection><collection>Gale In Context: Science</collection><jtitle>Journal of analytical chemistry (New York, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tadeusz Gorewoda</au><au>Mzyk, Zofia</au><au>Anyszkiewicz, Jacek</au><au>Bilewska, Katarzyna</au><au>Cybulski, Andrzej</au><au>Gołębiewska-Kurzawska, Joanna</au><au>Knapik, Magdalena</au><au>Kostrzewa, Justyna</au><au>Grzegorczyk, Magdalena</au><au>Malara, Szymon</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microstructural Effect Limitations in the Analysis of SnAg, SnBi and SnIn Lead-free Solders by Wavelength Dispersion X-Ray Spectrometry</atitle><jtitle>Journal of analytical chemistry (New York, N.Y.)</jtitle><stitle>J Anal Chem</stitle><stitle>J ANAL CHEM</stitle><date>2020</date><risdate>2020</risdate><volume>75</volume><issue>1</issue><spage>56</spage><epage>62</epage><pages>56-62</pages><issn>1061-9348</issn><eissn>1608-3199</eissn><abstract>This article describes the effects of microstructures in an analysis of lead-free solders, namely SnAg, SnBi and SnIn, using X-ray fluorescence spectrometry (
XRF
). The size of the microstructures in the samples and calibration materials has a strong impact on the calibration accuracy and results. A comparison of the microstructure size and critical thickness values demonstrated the importance of the former parameter in terms of the analyzed volume of the specimen. The re-melting and casting in an induction furnace at developed conditions were determined to be a way to obtain samples with fine-grained microstructures. Calibration with re-melted reference materials yielded more accurate calibration curves than calibration using the materials in their original state. Re-melting of the samples resulted in improvements in the XRF results in comparison to the reference values. This improvement is especially important in case of alloying elements with concentrations that determine the recognition of a specific solder grade.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1061934820010086</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-3918-1684</orcidid><orcidid>https://orcid.org/0000-0001-5715-4412</orcidid></addata></record> |
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| source | Springer Online Journals Complete; Web of Science - Science Citation Index Expanded - 2020<img src="https://exlibris-pub.s3.amazonaws.com/fromwos-v2.jpg" /> |
| subjects | Alloying elements Analytical Chemistry Calibration Chemistry Chemistry and Materials Science Chemistry, Analytical Comparative analysis Electric induction furnaces Fluorescence spectroscopy Lead free Microstructure Physical Sciences Reference materials Science & Technology Scientific imaging Solders Spectrometry X ray fluorescence analysis X-ray spectroscopy |
| title | Microstructural Effect Limitations in the Analysis of SnAg, SnBi and SnIn Lead-free Solders by Wavelength Dispersion X-Ray Spectrometry |
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