High Frequency Transient Sparse Measurement-Based Fault Location for Complex DC Distribution Networks

Measurement points supporting data high-speed communication in complex dc distribution networks are insufficient, meanwhile, fault characteristics are greatly affected by control strategies of power electronic equipment. These may cause failure of traditional fault location methods when applied to c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on smart grid 2020-01, Vol.11 (1), p.312-322
Hauptverfasser: Jia, Ke, Feng, Tao, Zhao, Qijuan, Wang, Congbo, Bi, Tianshu
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 322
container_issue 1
container_start_page 312
container_title IEEE transactions on smart grid
container_volume 11
creator Jia, Ke
Feng, Tao
Zhao, Qijuan
Wang, Congbo
Bi, Tianshu
description Measurement points supporting data high-speed communication in complex dc distribution networks are insufficient, meanwhile, fault characteristics are greatly affected by control strategies of power electronic equipment. These may cause failure of traditional fault location methods when applied to complex dc distribution networks. Thus, this paper proposes a novel dc pole-to-pole short-circuit fault location algorithm for complex dc distribution networks. First, according to the high frequency transient current loops, this paper constructs the high frequency impedance equivalent models of module multilevel converter (MMC) and dc/dc converter, which are not affected by the control strategies and offer stable impedance values during fault process. Then high frequency transient voltages of sparse measurement points are extracted by wavelet transform to form the node high frequency transient voltage equation. Finally, the node high frequency transient current sparse vector is solved to locate fault position by the node high frequency transient voltage equation combined with the Bayesian compressed sensing (BCS) theory. The proposed algorithm has low requirements on the number of measurement points and does not require data to be measured strictly synchronously. It is also not affected by converter's control strategies and transition resistances. A 32-node dc distribution network is built in PSCAD/EMTDC and simulation results verify the accuracy of the proposed location algorithm.
doi_str_mv 10.1109/TSG.2019.2921301
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_2330845847</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8731742</ieee_id><sourcerecordid>2330845847</sourcerecordid><originalsourceid>FETCH-LOGICAL-c338t-500708dd7b4e2b65cfbd58e16e335431eea1efa834e249bce75a7077214176d03</originalsourceid><addsrcrecordid>eNo9kEFPwzAMhSMEEhPsjsQlEueOJE6b9ggb25AGHDbOUdq60LE1JWkF-_dkbJovtvyebfkj5IazEecsu18tZyPBeDYSmeDA-BkZ8ExmEbCEn5_qGC7J0Ps1CwEAicgGBOf1xyedOvzusSl2dOVM42tsOrpsjfNIX9D43uE2tKJH47GkU9NvOrqwhelq29DKOjq223aDv3QyppPad67O-3_tFbsf6778NbmozMbj8JivyPv0aTWeR4u32fP4YREVAGkXxYwplpalyiWKPImLKi_jFHmCALEEjmg4ViaFIMssL1DFRjGlBJdcJSWDK3J32Ns6Gx7ynV7b3jXhpBYALJVxKlVwsYOrcNZ7h5VuXb01bqc503ueOvDUe576yDOM3B5GakQ82VMFXEkBf5l7cPc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2330845847</pqid></control><display><type>article</type><title>High Frequency Transient Sparse Measurement-Based Fault Location for Complex DC Distribution Networks</title><source>IEEE Xplore</source><creator>Jia, Ke ; Feng, Tao ; Zhao, Qijuan ; Wang, Congbo ; Bi, Tianshu</creator><creatorcontrib>Jia, Ke ; Feng, Tao ; Zhao, Qijuan ; Wang, Congbo ; Bi, Tianshu</creatorcontrib><description>Measurement points supporting data high-speed communication in complex dc distribution networks are insufficient, meanwhile, fault characteristics are greatly affected by control strategies of power electronic equipment. These may cause failure of traditional fault location methods when applied to complex dc distribution networks. Thus, this paper proposes a novel dc pole-to-pole short-circuit fault location algorithm for complex dc distribution networks. First, according to the high frequency transient current loops, this paper constructs the high frequency impedance equivalent models of module multilevel converter (MMC) and dc/dc converter, which are not affected by the control strategies and offer stable impedance values during fault process. Then high frequency transient voltages of sparse measurement points are extracted by wavelet transform to form the node high frequency transient voltage equation. Finally, the node high frequency transient current sparse vector is solved to locate fault position by the node high frequency transient voltage equation combined with the Bayesian compressed sensing (BCS) theory. The proposed algorithm has low requirements on the number of measurement points and does not require data to be measured strictly synchronously. It is also not affected by converter's control strategies and transition resistances. A 32-node dc distribution network is built in PSCAD/EMTDC and simulation results verify the accuracy of the proposed location algorithm.</description><identifier>ISSN: 1949-3053</identifier><identifier>EISSN: 1949-3061</identifier><identifier>DOI: 10.1109/TSG.2019.2921301</identifier><identifier>CODEN: ITSGBQ</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Algorithms ; Circuit faults ; Complex DC distribution network ; Computer simulation ; Control equipment ; Current measurement ; Distribution management ; Electric converters ; Electric potential ; Electronic equipment ; Fault location ; High frequencies ; High frequency ; high frequency transient current ; Impedance ; Mathematical model ; Networks ; Nodes ; Repair &amp; maintenance ; Short circuits ; spare measurement ; Transient analysis ; Transient current ; Voltage ; Voltage converters (DC to DC) ; Wavelet transforms</subject><ispartof>IEEE transactions on smart grid, 2020-01, Vol.11 (1), p.312-322</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c338t-500708dd7b4e2b65cfbd58e16e335431eea1efa834e249bce75a7077214176d03</citedby><cites>FETCH-LOGICAL-c338t-500708dd7b4e2b65cfbd58e16e335431eea1efa834e249bce75a7077214176d03</cites><orcidid>0000-0002-6034-0344 ; 0000-0002-0621-9404 ; 0000-0001-9140-1050</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8731742$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8731742$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Jia, Ke</creatorcontrib><creatorcontrib>Feng, Tao</creatorcontrib><creatorcontrib>Zhao, Qijuan</creatorcontrib><creatorcontrib>Wang, Congbo</creatorcontrib><creatorcontrib>Bi, Tianshu</creatorcontrib><title>High Frequency Transient Sparse Measurement-Based Fault Location for Complex DC Distribution Networks</title><title>IEEE transactions on smart grid</title><addtitle>TSG</addtitle><description>Measurement points supporting data high-speed communication in complex dc distribution networks are insufficient, meanwhile, fault characteristics are greatly affected by control strategies of power electronic equipment. These may cause failure of traditional fault location methods when applied to complex dc distribution networks. Thus, this paper proposes a novel dc pole-to-pole short-circuit fault location algorithm for complex dc distribution networks. First, according to the high frequency transient current loops, this paper constructs the high frequency impedance equivalent models of module multilevel converter (MMC) and dc/dc converter, which are not affected by the control strategies and offer stable impedance values during fault process. Then high frequency transient voltages of sparse measurement points are extracted by wavelet transform to form the node high frequency transient voltage equation. Finally, the node high frequency transient current sparse vector is solved to locate fault position by the node high frequency transient voltage equation combined with the Bayesian compressed sensing (BCS) theory. The proposed algorithm has low requirements on the number of measurement points and does not require data to be measured strictly synchronously. It is also not affected by converter's control strategies and transition resistances. A 32-node dc distribution network is built in PSCAD/EMTDC and simulation results verify the accuracy of the proposed location algorithm.</description><subject>Algorithms</subject><subject>Circuit faults</subject><subject>Complex DC distribution network</subject><subject>Computer simulation</subject><subject>Control equipment</subject><subject>Current measurement</subject><subject>Distribution management</subject><subject>Electric converters</subject><subject>Electric potential</subject><subject>Electronic equipment</subject><subject>Fault location</subject><subject>High frequencies</subject><subject>High frequency</subject><subject>high frequency transient current</subject><subject>Impedance</subject><subject>Mathematical model</subject><subject>Networks</subject><subject>Nodes</subject><subject>Repair &amp; maintenance</subject><subject>Short circuits</subject><subject>spare measurement</subject><subject>Transient analysis</subject><subject>Transient current</subject><subject>Voltage</subject><subject>Voltage converters (DC to DC)</subject><subject>Wavelet transforms</subject><issn>1949-3053</issn><issn>1949-3061</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kEFPwzAMhSMEEhPsjsQlEueOJE6b9ggb25AGHDbOUdq60LE1JWkF-_dkbJovtvyebfkj5IazEecsu18tZyPBeDYSmeDA-BkZ8ExmEbCEn5_qGC7J0Ps1CwEAicgGBOf1xyedOvzusSl2dOVM42tsOrpsjfNIX9D43uE2tKJH47GkU9NvOrqwhelq29DKOjq223aDv3QyppPad67O-3_tFbsf6778NbmozMbj8JivyPv0aTWeR4u32fP4YREVAGkXxYwplpalyiWKPImLKi_jFHmCALEEjmg4ViaFIMssL1DFRjGlBJdcJSWDK3J32Ns6Gx7ynV7b3jXhpBYALJVxKlVwsYOrcNZ7h5VuXb01bqc503ueOvDUe576yDOM3B5GakQ82VMFXEkBf5l7cPc</recordid><startdate>202001</startdate><enddate>202001</enddate><creator>Jia, Ke</creator><creator>Feng, Tao</creator><creator>Zhao, Qijuan</creator><creator>Wang, Congbo</creator><creator>Bi, Tianshu</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>KR7</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-6034-0344</orcidid><orcidid>https://orcid.org/0000-0002-0621-9404</orcidid><orcidid>https://orcid.org/0000-0001-9140-1050</orcidid></search><sort><creationdate>202001</creationdate><title>High Frequency Transient Sparse Measurement-Based Fault Location for Complex DC Distribution Networks</title><author>Jia, Ke ; Feng, Tao ; Zhao, Qijuan ; Wang, Congbo ; Bi, Tianshu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c338t-500708dd7b4e2b65cfbd58e16e335431eea1efa834e249bce75a7077214176d03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Algorithms</topic><topic>Circuit faults</topic><topic>Complex DC distribution network</topic><topic>Computer simulation</topic><topic>Control equipment</topic><topic>Current measurement</topic><topic>Distribution management</topic><topic>Electric converters</topic><topic>Electric potential</topic><topic>Electronic equipment</topic><topic>Fault location</topic><topic>High frequencies</topic><topic>High frequency</topic><topic>high frequency transient current</topic><topic>Impedance</topic><topic>Mathematical model</topic><topic>Networks</topic><topic>Nodes</topic><topic>Repair &amp; maintenance</topic><topic>Short circuits</topic><topic>spare measurement</topic><topic>Transient analysis</topic><topic>Transient current</topic><topic>Voltage</topic><topic>Voltage converters (DC to DC)</topic><topic>Wavelet transforms</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jia, Ke</creatorcontrib><creatorcontrib>Feng, Tao</creatorcontrib><creatorcontrib>Zhao, Qijuan</creatorcontrib><creatorcontrib>Wang, Congbo</creatorcontrib><creatorcontrib>Bi, Tianshu</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on smart grid</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jia, Ke</au><au>Feng, Tao</au><au>Zhao, Qijuan</au><au>Wang, Congbo</au><au>Bi, Tianshu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High Frequency Transient Sparse Measurement-Based Fault Location for Complex DC Distribution Networks</atitle><jtitle>IEEE transactions on smart grid</jtitle><stitle>TSG</stitle><date>2020-01</date><risdate>2020</risdate><volume>11</volume><issue>1</issue><spage>312</spage><epage>322</epage><pages>312-322</pages><issn>1949-3053</issn><eissn>1949-3061</eissn><coden>ITSGBQ</coden><abstract>Measurement points supporting data high-speed communication in complex dc distribution networks are insufficient, meanwhile, fault characteristics are greatly affected by control strategies of power electronic equipment. These may cause failure of traditional fault location methods when applied to complex dc distribution networks. Thus, this paper proposes a novel dc pole-to-pole short-circuit fault location algorithm for complex dc distribution networks. First, according to the high frequency transient current loops, this paper constructs the high frequency impedance equivalent models of module multilevel converter (MMC) and dc/dc converter, which are not affected by the control strategies and offer stable impedance values during fault process. Then high frequency transient voltages of sparse measurement points are extracted by wavelet transform to form the node high frequency transient voltage equation. Finally, the node high frequency transient current sparse vector is solved to locate fault position by the node high frequency transient voltage equation combined with the Bayesian compressed sensing (BCS) theory. The proposed algorithm has low requirements on the number of measurement points and does not require data to be measured strictly synchronously. It is also not affected by converter's control strategies and transition resistances. A 32-node dc distribution network is built in PSCAD/EMTDC and simulation results verify the accuracy of the proposed location algorithm.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/TSG.2019.2921301</doi><tpages>11</tpages><orcidid>https://orcid.org/0000-0002-6034-0344</orcidid><orcidid>https://orcid.org/0000-0002-0621-9404</orcidid><orcidid>https://orcid.org/0000-0001-9140-1050</orcidid></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1949-3053
ispartof IEEE transactions on smart grid, 2020-01, Vol.11 (1), p.312-322
issn 1949-3053
1949-3061
language eng
recordid cdi_proquest_journals_2330845847
source IEEE Xplore
subjects Algorithms
Circuit faults
Complex DC distribution network
Computer simulation
Control equipment
Current measurement
Distribution management
Electric converters
Electric potential
Electronic equipment
Fault location
High frequencies
High frequency
high frequency transient current
Impedance
Mathematical model
Networks
Nodes
Repair & maintenance
Short circuits
spare measurement
Transient analysis
Transient current
Voltage
Voltage converters (DC to DC)
Wavelet transforms
title High Frequency Transient Sparse Measurement-Based Fault Location for Complex DC Distribution Networks
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T21%3A36%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High%20Frequency%20Transient%20Sparse%20Measurement-Based%20Fault%20Location%20for%20Complex%20DC%20Distribution%20Networks&rft.jtitle=IEEE%20transactions%20on%20smart%20grid&rft.au=Jia,%20Ke&rft.date=2020-01&rft.volume=11&rft.issue=1&rft.spage=312&rft.epage=322&rft.pages=312-322&rft.issn=1949-3053&rft.eissn=1949-3061&rft.coden=ITSGBQ&rft_id=info:doi/10.1109/TSG.2019.2921301&rft_dat=%3Cproquest_RIE%3E2330845847%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2330845847&rft_id=info:pmid/&rft_ieee_id=8731742&rfr_iscdi=true